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X-RAY DIFFRACTION
Materials and Methods page
4J82
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 49.06 α = 88.83
    b = 48.89 β = 89.15
    c = 76.03 γ = 62.91
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 2.2
    Resolution(High) 1.46
    Resolution(Low) 76.01
    Number Reflections(All) 157300
    Number Reflections(Observed) 102387
    Percent Possible(Observed) 95.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.461
    Resolution(Low) 43.674
    Cut-off Sigma(F) 1.96
    Number of Reflections(all) 135896
    Number of Reflections(Observed) 102352
    Number of Reflections(R-Free) 2020
    Percent Reflections(Observed) 93.89
    R-Factor(Observed) 0.1695
    R-Work 0.1686
    R-Free 0.2122
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.4867
    Anisotropic B[1][2] 2.1337
    Anisotropic B[1][3] 1.4349
    Anisotropic B[2][2] -2.708
    Anisotropic B[2][3] 2.2599
    Anisotropic B[3][3] 2.2213
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.461
    Shell Resolution(Low) 1.4976
    Number of Reflections(R-Free) 92
    Number of Reflections(R-Work) 5319
    R-Factor(R-Work) 0.2853
    R-Factor(R-Free) 0.3754
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4976
    Shell Resolution(Low) 1.5381
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 7199
    R-Factor(R-Work) 0.2759
    R-Factor(R-Free) 0.3296
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5381
    Shell Resolution(Low) 1.5833
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 7277
    R-Factor(R-Work) 0.2293
    R-Factor(R-Free) 0.3023
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5833
    Shell Resolution(Low) 1.6344
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 7263
    R-Factor(R-Work) 0.2238
    R-Factor(R-Free) 0.3249
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6344
    Shell Resolution(Low) 1.6928
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 7265
    R-Factor(R-Work) 0.2273
    R-Factor(R-Free) 0.3236
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6928
    Shell Resolution(Low) 1.7606
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 7361
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.2525
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7606
    Shell Resolution(Low) 1.8407
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 7275
    R-Factor(R-Work) 0.1572
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8407
    Shell Resolution(Low) 1.9378
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 7350
    R-Factor(R-Work) 0.1549
    R-Factor(R-Free) 0.1987
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9378
    Shell Resolution(Low) 2.0592
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 7360
    R-Factor(R-Work) 0.1539
    R-Factor(R-Free) 0.2258
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0592
    Shell Resolution(Low) 2.2182
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 7362
    R-Factor(R-Work) 0.1586
    R-Factor(R-Free) 0.196
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2182
    Shell Resolution(Low) 2.4414
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 7422
    R-Factor(R-Work) 0.1581
    R-Factor(R-Free) 0.2205
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4414
    Shell Resolution(Low) 2.7946
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 7426
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.2122
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7946
    Shell Resolution(Low) 3.5207
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 7428
    R-Factor(R-Work) 0.1493
    R-Factor(R-Free) 0.1775
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5207
    Shell Resolution(Low) 43.6932
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 7025
    R-Factor(R-Work) 0.1665
    R-Factor(R-Free) 0.1801
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.083
    f_dihedral_angle_d 13.373
    f_angle_d 1.12
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4874
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 535
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)