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X-RAY DIFFRACTION
Materials and Methods page
4J81
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 48.66 α = 89.75
    b = 48.76 β = 89.63
    c = 75.21 γ = 63.95
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 3.4
    Resolution(High) 1.74
    Resolution(Low) 50
    Number Reflections(All) 60481
    Number Reflections(Observed) 60453
    Percent Possible(Observed) 95.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.745
    Resolution(Low) 37.713
    Cut-off Sigma(F) 1.98
    Number of Reflections(all) 60481
    Number of Reflections(Observed) 60453
    Number of Reflections(R-Free) 1984
    Percent Reflections(Observed) 95.64
    R-Factor(Observed) 0.1597
    R-Work 0.1584
    R-Free 0.1983
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.6606
    Anisotropic B[1][2] 2.1321
    Anisotropic B[1][3] 5.0794
    Anisotropic B[2][2] -1.4218
    Anisotropic B[2][3] 3.34
    Anisotropic B[3][3] 0.7612
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.745
    Shell Resolution(Low) 1.7886
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 3987
    R-Factor(R-Work) 0.2221
    R-Factor(R-Free) 0.2412
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7886
    Shell Resolution(Low) 1.8369
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 4173
    R-Factor(R-Work) 0.1956
    R-Factor(R-Free) 0.24
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8369
    Shell Resolution(Low) 1.891
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 4197
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.2241
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.891
    Shell Resolution(Low) 1.952
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 4239
    R-Factor(R-Work) 0.1595
    R-Factor(R-Free) 0.1908
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.952
    Shell Resolution(Low) 2.0218
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 4184
    R-Factor(R-Work) 0.1486
    R-Factor(R-Free) 0.2204
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0218
    Shell Resolution(Low) 2.1027
    Number of Reflections(R-Free) 168
    Number of Reflections(R-Work) 4184
    R-Factor(R-Work) 0.1488
    R-Factor(R-Free) 0.1674
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1027
    Shell Resolution(Low) 2.1984
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 4245
    R-Factor(R-Work) 0.1484
    R-Factor(R-Free) 0.2025
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1984
    Shell Resolution(Low) 2.3143
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 4276
    R-Factor(R-Work) 0.1563
    R-Factor(R-Free) 0.1787
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3143
    Shell Resolution(Low) 2.4593
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 4244
    R-Factor(R-Work) 0.1536
    R-Factor(R-Free) 0.2196
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4593
    Shell Resolution(Low) 2.6491
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 4232
    R-Factor(R-Work) 0.16
    R-Factor(R-Free) 0.2261
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6491
    Shell Resolution(Low) 2.9156
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 4270
    R-Factor(R-Work) 0.1508
    R-Factor(R-Free) 0.1896
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9156
    Shell Resolution(Low) 3.3373
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 4236
    R-Factor(R-Work) 0.1502
    R-Factor(R-Free) 0.1673
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3373
    Shell Resolution(Low) 4.2038
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 4040
    R-Factor(R-Work) 0.1458
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2038
    Shell Resolution(Low) 37.7215
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 3962
    R-Factor(R-Work) 0.1725
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 90.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.092
    f_dihedral_angle_d 12.477
    f_angle_d 1.178
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4873
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 588
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    data collection ADSC