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X-RAY DIFFRACTION
Materials and Methods page
4J79
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.1 α = 90
    b = 51.18 β = 101.75
    c = 85.25 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 13.3
    Resolution(High) 1.56
    Resolution(Low) 83.46
    Number Reflections(Observed) 43962
    Percent Possible(Observed) 97.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.559
    Resolution(Low) 42.006
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 43962
    Number of Reflections(Observed) 43890
    Number of Reflections(R-Free) 1998
    Percent Reflections(Observed) 96.74
    R-Factor(Observed) 0.1661
    R-Work 0.1647
    R-Free 0.196
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.559
    Shell Resolution(Low) 1.5978
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2955
    R-Factor(R-Work) 0.2473
    R-Factor(R-Free) 0.2751
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5978
    Shell Resolution(Low) 1.641
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2943
    R-Factor(R-Work) 0.2396
    R-Factor(R-Free) 0.2963
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.641
    Shell Resolution(Low) 1.6893
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2947
    R-Factor(R-Work) 0.2335
    R-Factor(R-Free) 0.2794
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6893
    Shell Resolution(Low) 1.7438
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2929
    R-Factor(R-Work) 0.2222
    R-Factor(R-Free) 0.3028
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7438
    Shell Resolution(Low) 1.8061
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2929
    R-Factor(R-Work) 0.2134
    R-Factor(R-Free) 0.2885
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8061
    Shell Resolution(Low) 1.8784
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2949
    R-Factor(R-Work) 0.2048
    R-Factor(R-Free) 0.2168
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8784
    Shell Resolution(Low) 1.9639
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2957
    R-Factor(R-Work) 0.1868
    R-Factor(R-Free) 0.2401
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9639
    Shell Resolution(Low) 2.0675
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2980
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.1984
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0675
    Shell Resolution(Low) 2.197
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3019
    R-Factor(R-Work) 0.1621
    R-Factor(R-Free) 0.2133
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.197
    Shell Resolution(Low) 2.3666
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3060
    R-Factor(R-Work) 0.1638
    R-Factor(R-Free) 0.1979
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3666
    Shell Resolution(Low) 2.6047
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3002
    R-Factor(R-Work) 0.1663
    R-Factor(R-Free) 0.2227
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6047
    Shell Resolution(Low) 2.9816
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3071
    R-Factor(R-Work) 0.1588
    R-Factor(R-Free) 0.1881
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9816
    Shell Resolution(Low) 3.7561
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3053
    R-Factor(R-Work) 0.1424
    R-Factor(R-Free) 0.1629
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7561
    Shell Resolution(Low) 42.021
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3098
    R-Factor(R-Work) 0.1443
    R-Factor(R-Free) 0.1504
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.103
    f_dihedral_angle_d 13.281
    f_angle_d 1.369
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2456
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 358
     
     
  •   Software and Computing Hide
    Computing
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)