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X-RAY DIFFRACTION
Materials and Methods page
4J78
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.19 α = 90
    b = 51.22 β = 101.6
    c = 85.14 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 16.5
    Resolution(High) 1.48
    Resolution(Low) 83.4
    Number Reflections(All) 51805
    Number Reflections(Observed) 51789
    Percent Possible(Observed) 97.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.478
    Resolution(Low) 36.825
    Cut-off Sigma(F) 1.35
    Number of Reflections(Observed) 51789
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 97.36
    R-Factor(Observed) 0.1426
    R-Work 0.1418
    R-Free 0.1628
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.478
    Shell Resolution(Low) 1.5152
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3459
    R-Factor(R-Work) 0.2378
    R-Factor(R-Free) 0.2572
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5152
    Shell Resolution(Low) 1.5561
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 3486
    R-Factor(R-Work) 0.2051
    R-Factor(R-Free) 0.233
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5561
    Shell Resolution(Low) 1.6019
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3534
    R-Factor(R-Work) 0.1852
    R-Factor(R-Free) 0.2314
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6019
    Shell Resolution(Low) 1.6536
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3525
    R-Factor(R-Work) 0.1692
    R-Factor(R-Free) 0.1852
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6536
    Shell Resolution(Low) 1.7127
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3550
    R-Factor(R-Work) 0.1585
    R-Factor(R-Free) 0.1868
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7127
    Shell Resolution(Low) 1.7813
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3552
    R-Factor(R-Work) 0.1506
    R-Factor(R-Free) 0.1903
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7813
    Shell Resolution(Low) 1.8624
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3562
    R-Factor(R-Work) 0.1396
    R-Factor(R-Free) 0.1759
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8624
    Shell Resolution(Low) 1.9605
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3581
    R-Factor(R-Work) 0.1338
    R-Factor(R-Free) 0.1526
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9605
    Shell Resolution(Low) 2.0834
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3599
    R-Factor(R-Work) 0.1236
    R-Factor(R-Free) 0.1509
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0834
    Shell Resolution(Low) 2.2442
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3578
    R-Factor(R-Work) 0.1281
    R-Factor(R-Free) 0.1455
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2442
    Shell Resolution(Low) 2.47
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3595
    R-Factor(R-Work) 0.1339
    R-Factor(R-Free) 0.1553
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.47
    Shell Resolution(Low) 2.8273
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3619
    R-Factor(R-Work) 0.1369
    R-Factor(R-Free) 0.1401
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8273
    Shell Resolution(Low) 3.5616
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3563
    R-Factor(R-Work) 0.137
    R-Factor(R-Free) 0.1572
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5616
    Shell Resolution(Low) 36.8365
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3586
    R-Factor(R-Work) 0.1364
    R-Factor(R-Free) 0.1562
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.092
    f_dihedral_angle_d 12.428
    f_angle_d 1.251
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2443
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 339
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    data collection ADSC