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X-RAY DIFFRACTION
Materials and Methods page
4J77
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 75.68 α = 90
    b = 50.94 β = 90.24
    c = 82.42 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 8.4
    Resolution(High) 1.76
    Resolution(Low) 75.68
    Number Reflections(Observed) 60204
    Percent Possible(Observed) 97.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.756
    Resolution(Low) 36.129
    Cut-off Sigma(F) 1.33
    Number of Reflections(all) 61347
    Number of Reflections(Observed) 60204
    Number of Reflections(R-Free) 1632
    Percent Reflections(Observed) 95.58
    R-Factor(Observed) 0.2032
    R-Work 0.2018
    R-Free 0.2451
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.756
    Shell Resolution(Low) 1.7998
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 3933
    R-Factor(R-Work) 0.2549
    R-Factor(R-Free) 0.3622
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7998
    Shell Resolution(Low) 1.8485
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 4138
    R-Factor(R-Work) 0.2382
    R-Factor(R-Free) 0.2835
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8485
    Shell Resolution(Low) 1.9029
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 4197
    R-Factor(R-Work) 0.2197
    R-Factor(R-Free) 0.2611
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9029
    Shell Resolution(Low) 1.9643
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 4169
    R-Factor(R-Work) 0.2127
    R-Factor(R-Free) 0.253
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9643
    Shell Resolution(Low) 2.0345
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 4174
    R-Factor(R-Work) 0.2146
    R-Factor(R-Free) 0.2855
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0345
    Shell Resolution(Low) 2.116
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 4192
    R-Factor(R-Work) 0.2084
    R-Factor(R-Free) 0.2328
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.116
    Shell Resolution(Low) 2.2122
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 4148
    R-Factor(R-Work) 0.198
    R-Factor(R-Free) 0.2437
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2122
    Shell Resolution(Low) 2.3289
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4163
    R-Factor(R-Work) 0.2037
    R-Factor(R-Free) 0.2274
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3289
    Shell Resolution(Low) 2.4747
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 4143
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.2645
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4747
    Shell Resolution(Low) 2.6658
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 4153
    R-Factor(R-Work) 0.2046
    R-Factor(R-Free) 0.2489
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6658
    Shell Resolution(Low) 2.9339
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 4146
    R-Factor(R-Work) 0.2033
    R-Factor(R-Free) 0.2468
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9339
    Shell Resolution(Low) 3.3582
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 4187
    R-Factor(R-Work) 0.1928
    R-Factor(R-Free) 0.2668
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3582
    Shell Resolution(Low) 4.2299
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 4238
    R-Factor(R-Work) 0.1798
    R-Factor(R-Free) 0.1909
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2299
    Shell Resolution(Low) 36.1364
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 4211
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2444
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.008
    f_chiral_restr 0.119
    f_dihedral_angle_d 13.349
    f_angle_d 1.557
    f_bond_d 0.013
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4888
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 599
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    data collection ADSC