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X-RAY DIFFRACTION
Materials and Methods page
4J73
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 36.29 α = 90
    b = 56.7 β = 90
    c = 132.35 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
     
    Diffraction Radiation
    Monochromator Cryogenically-cooled single crystal Si(220) side bounce
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 24-ID-E
    Site APS
    Beamline 24-ID-E
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) 15.6
    Resolution(High) 1.44
    Resolution(Low) 66.18
    Number Reflections(All) 48875
    Number Reflections(Observed) 48785
    Percent Possible(Observed) 96.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.439
    Resolution(Low) 31.823
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 48875
    Number of Reflections(Observed) 48785
    Number of Reflections(R-Free) 1997
    Percent Reflections(Observed) 96.47
    R-Factor(Observed) 0.1783
    R-Work 0.1774
    R-Free 0.2007
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.439
    Shell Resolution(Low) 1.4746
    Number of Reflections(R-Free) 106
    Number of Reflections(R-Work) 2479
    R-Factor(R-Work) 0.2889
    R-Factor(R-Free) 0.2666
    Percent Reflections(Observed) 74.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4746
    Shell Resolution(Low) 1.5144
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 3130
    R-Factor(R-Work) 0.2661
    R-Factor(R-Free) 0.2747
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5144
    Shell Resolution(Low) 1.559
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3345
    R-Factor(R-Work) 0.2478
    R-Factor(R-Free) 0.2764
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.559
    Shell Resolution(Low) 1.6093
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3377
    R-Factor(R-Work) 0.2247
    R-Factor(R-Free) 0.2361
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6093
    Shell Resolution(Low) 1.6668
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3389
    R-Factor(R-Work) 0.1996
    R-Factor(R-Free) 0.2291
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6668
    Shell Resolution(Low) 1.7335
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3403
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.2525
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7335
    Shell Resolution(Low) 1.8124
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3414
    R-Factor(R-Work) 0.182
    R-Factor(R-Free) 0.2066
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8124
    Shell Resolution(Low) 1.908
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3401
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.1989
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.908
    Shell Resolution(Low) 2.0275
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3423
    R-Factor(R-Work) 0.1578
    R-Factor(R-Free) 0.201
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0275
    Shell Resolution(Low) 2.184
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3419
    R-Factor(R-Work) 0.1575
    R-Factor(R-Free) 0.1942
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.184
    Shell Resolution(Low) 2.4037
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3455
    R-Factor(R-Work) 0.1673
    R-Factor(R-Free) 0.2047
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4037
    Shell Resolution(Low) 2.7514
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3460
    R-Factor(R-Work) 0.1793
    R-Factor(R-Free) 0.1816
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7514
    Shell Resolution(Low) 3.4658
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3520
    R-Factor(R-Work) 0.166
    R-Factor(R-Free) 0.1946
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4658
    Shell Resolution(Low) 31.8307
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 3573
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.182
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.1
    f_dihedral_angle_d 13.334
    f_angle_d 1.471
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2387
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 301
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8_1069)
    data collection ADSC