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X-RAY DIFFRACTION
Materials and Methods page
4J5S
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8
    Temperature 277.0
    Details 100mM Imidazole, 20% PEG3350, 200 mM NaCl , pH 8, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 73.38 α = 90
    b = 56.22 β = 94.47
    c = 73.79 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2011-04-25
     
    Diffraction Radiation
    Monochromator Si 111
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 22-ID
    Wavelength List 1.00
    Site APS
    Beamline 22-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.55
    Resolution(Low) 50
    Number Reflections(All) 86974
    Number Reflections(Observed) 85148
    Percent Possible(Observed) 97.9
    R Merge I(Observed) 0.043
    Redundancy 3.8
     
    High Resolution Shell Details
    Resolution(High) 1.55
    Resolution(Low) 1.58
    Percent Possible(All) 96.2
    R Merge I(Observed) 0.534
    Redundancy 3.8
    Number Unique Reflections(All) 4164
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.55
    Resolution(Low) 38.953
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 86974
    Number of Reflections(Observed) 85113
    Number of Reflections(R-Free) 4291
    Percent Reflections(Observed) 97.69
    R-Factor(Observed) 0.139
    R-Work 0.137
    R-Free 0.175
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 25.2064
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5499
    Shell Resolution(Low) 1.5675
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2520
    R-Factor(R-Work) 0.1747
    R-Factor(R-Free) 0.2549
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5675
    Shell Resolution(Low) 1.586
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2589
    R-Factor(R-Work) 0.1672
    R-Factor(R-Free) 0.223
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.586
    Shell Resolution(Low) 1.6053
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2630
    R-Factor(R-Work) 0.1567
    R-Factor(R-Free) 0.2259
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6053
    Shell Resolution(Low) 1.6256
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.1491
    R-Factor(R-Free) 0.202
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6256
    Shell Resolution(Low) 1.647
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.14
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.647
    Shell Resolution(Low) 1.6696
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1386
    R-Factor(R-Free) 0.1995
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6696
    Shell Resolution(Low) 1.6934
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1362
    R-Factor(R-Free) 0.1884
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6934
    Shell Resolution(Low) 1.7187
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2678
    R-Factor(R-Work) 0.134
    R-Factor(R-Free) 0.2264
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7187
    Shell Resolution(Low) 1.7456
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.1259
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7456
    Shell Resolution(Low) 1.7742
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.1207
    R-Factor(R-Free) 0.206
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7742
    Shell Resolution(Low) 1.8048
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2663
    R-Factor(R-Work) 0.1202
    R-Factor(R-Free) 0.1522
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8048
    Shell Resolution(Low) 1.8376
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2719
    R-Factor(R-Work) 0.1174
    R-Factor(R-Free) 0.1764
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8376
    Shell Resolution(Low) 1.8729
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1199
    R-Factor(R-Free) 0.1863
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8729
    Shell Resolution(Low) 1.9112
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2668
    R-Factor(R-Work) 0.1185
    R-Factor(R-Free) 0.1722
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9112
    Shell Resolution(Low) 1.9527
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2714
    R-Factor(R-Work) 0.1262
    R-Factor(R-Free) 0.1814
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9527
    Shell Resolution(Low) 1.9982
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2713
    R-Factor(R-Work) 0.1289
    R-Factor(R-Free) 0.2058
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9982
    Shell Resolution(Low) 2.0481
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.1231
    R-Factor(R-Free) 0.1846
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0481
    Shell Resolution(Low) 2.1035
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1177
    R-Factor(R-Free) 0.1591
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1035
    Shell Resolution(Low) 2.1654
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2697
    R-Factor(R-Work) 0.1236
    R-Factor(R-Free) 0.1704
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1654
    Shell Resolution(Low) 2.2353
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2685
    R-Factor(R-Work) 0.1193
    R-Factor(R-Free) 0.1475
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2353
    Shell Resolution(Low) 2.3152
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.123
    R-Factor(R-Free) 0.1736
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3152
    Shell Resolution(Low) 2.4078
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2684
    R-Factor(R-Work) 0.1312
    R-Factor(R-Free) 0.1703
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4078
    Shell Resolution(Low) 2.5174
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2774
    R-Factor(R-Work) 0.1345
    R-Factor(R-Free) 0.1905
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5174
    Shell Resolution(Low) 2.6501
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2748
    R-Factor(R-Work) 0.1354
    R-Factor(R-Free) 0.1834
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6501
    Shell Resolution(Low) 2.8161
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2731
    R-Factor(R-Work) 0.1449
    R-Factor(R-Free) 0.1576
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8161
    Shell Resolution(Low) 3.0335
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2761
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.1739
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0335
    Shell Resolution(Low) 3.3386
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.1404
    R-Factor(R-Free) 0.1876
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3386
    Shell Resolution(Low) 3.8213
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2760
    R-Factor(R-Work) 0.1384
    R-Factor(R-Free) 0.1643
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8213
    Shell Resolution(Low) 4.813
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2789
    R-Factor(R-Work) 0.1306
    R-Factor(R-Free) 0.1415
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.813
    Shell Resolution(Low) 38.9649
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2847
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.1868
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 18.311
    f_plane_restr 0.005
    f_chiral_restr 0.065
    f_angle_d 1.185
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4457
    Nucleic Acid Atoms 0
    Heterogen Atoms 226
    Solvent Atoms 654
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) DENZO
    Data Reduction (data scaling) SCALEPACK
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    data extraction pdb_extract version: 3.11
    refinement phenix
    molecular replacement Phaser
    data reduction SCALEPACK