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X-RAY DIFFRACTION
Materials and Methods page
4J3N
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 5.8
    Temperature 277.0
    Details 0.1M MAGNESIUM ACETATE, 50MM 2-(N-MORPHOLINO)ETHANESULFONIC ACID PH 5.8, 22% 2-METHYL-2,4-PENTANEDIOL (MPT), VAPOR DIFFUSION, HANGING DROP, TEMPERATURE 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 79.95 α = 90
    b = 176.37 β = 112.06
    c = 94.22 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX300HE
    Collection Date 2010-12-25
     
    Diffraction Radiation
    Monochromator HORIZONTALLY FOCUSING SINGLE CRYSTAL MONOCHROMATOR (CRYSTAL TYPE SI(1 1 1))
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSRRC BEAMLINE BL13C1
    Wavelength List 0.97622
    Site NSRRC
    Beamline BL13C1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.3
    Resolution(Low) 30
    Number Reflections(All) 109988
    Number Reflections(Observed) 103829
    Percent Possible(Observed) 94.4
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.34
    Percent Possible(All) 94.4
    R Merge I(Observed) 0.489
    Mean I Over Sigma(Observed) 2.6
    R-Sym I(Observed) 0.489
    Redundancy 3.0
    Number Unique Reflections(All) 5259
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 27.31
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 106932
    Number of Reflections(Observed) 99340
    Number of Reflections(R-Free) 4954
    Percent Reflections(Observed) 92.9
    R-Factor(All) 0.178
    R-Factor(Observed) 0.178
    R-Work 0.176
    R-Free 0.218
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 46.3339
    Anisotropic B[1][1] 2.3477
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 6.7788
    Anisotropic B[2][2] -5.0532
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 2.7055
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3001
    Shell Resolution(Low) 2.3823
    Number of Reflections(R-Free) 421
    Number of Reflections(R-Work) 8573
    R-Factor(R-Work) 0.2273
    R-Factor(R-Free) 0.2819
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3823
    Shell Resolution(Low) 2.4776
    Number of Reflections(R-Free) 452
    Number of Reflections(R-Work) 8983
    R-Factor(R-Work) 0.209
    R-Factor(R-Free) 0.2694
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4776
    Shell Resolution(Low) 2.5903
    Number of Reflections(R-Free) 466
    Number of Reflections(R-Work) 9251
    R-Factor(R-Work) 0.2046
    R-Factor(R-Free) 0.2541
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5903
    Shell Resolution(Low) 2.7267
    Number of Reflections(R-Free) 519
    Number of Reflections(R-Work) 9420
    R-Factor(R-Work) 0.2003
    R-Factor(R-Free) 0.2612
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7267
    Shell Resolution(Low) 2.8974
    Number of Reflections(R-Free) 542
    Number of Reflections(R-Work) 9558
    R-Factor(R-Work) 0.1958
    R-Factor(R-Free) 0.2506
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8974
    Shell Resolution(Low) 3.1208
    Number of Reflections(R-Free) 505
    Number of Reflections(R-Work) 9681
    R-Factor(R-Work) 0.1917
    R-Factor(R-Free) 0.2461
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1208
    Shell Resolution(Low) 3.4343
    Number of Reflections(R-Free) 502
    Number of Reflections(R-Work) 9773
    R-Factor(R-Work) 0.1743
    R-Factor(R-Free) 0.2271
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4343
    Shell Resolution(Low) 3.93
    Number of Reflections(R-Free) 513
    Number of Reflections(R-Work) 9803
    R-Factor(R-Work) 0.1569
    R-Factor(R-Free) 0.1946
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.93
    Shell Resolution(Low) 4.9466
    Number of Reflections(R-Free) 503
    Number of Reflections(R-Work) 9788
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.1759
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9466
    Shell Resolution(Low) 27.3123
    Number of Reflections(R-Free) 531
    Number of Reflections(R-Work) 9556
    R-Factor(R-Work) 0.1812
    R-Factor(R-Free) 0.2057
    Percent Reflections(Observed) 93.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.068
    f_dihedral_angle_d 16.086
    f_angle_d 1.082
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 10783
    Nucleic Acid Atoms 799
    Heterogen Atoms 7
    Solvent Atoms 703
     
     
  •   Software and Computing Hide
    Computing
    Data Collection bluice
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (PHENIX.AUTOMR: 1.6.4_486)
    Structure Refinement PHENIX (PHENIX.REFINE: 1.6.4_486)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.6.4_486)
    model building PHENIX version: (PHENIX.AUTOMR: 1.6.4_486)
    data collection bluice