X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 4.5
Temperature 293.0
Details 24% PEG 3350, 100 mM sodium acetate, 100 mM potassium sulfate, pH 4.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 111.43 α = 90
b = 116.49 β = 90
c = 75.67 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 110
Diffraction Detector
Detector Diffraction Type Details Collection Date
PIXEL DECTRIS PILATUS 2M -- --
Diffraction Radiation
Monochromator Protocol
-- SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X10SA 1.000 SLS X10SA

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.9 46.15 95.0 -- -- -- -- -- 11682 2.0 1.0 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 2.9 46.155 -- 2.01 -- 11682 556 95.15 -- 0.1741 0.1718 0.2213 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 2.9 3.0528 -- 129 2686 0.3182 0.3733 -- 94.0
X Ray Diffraction 3.0528 3.244 -- 140 2758 0.2651 0.3304 -- 96.0
X Ray Diffraction 3.244 3.4944 -- 149 2739 0.1897 0.2407 -- 96.0
X Ray Diffraction 3.4944 3.8459 -- 141 2759 0.1716 0.22 -- 96.0
X Ray Diffraction 3.8459 4.402 -- 144 2712 0.1536 0.2318 -- 95.0
X Ray Diffraction 4.402 5.5446 -- 151 2706 0.1584 0.1582 -- 94.0
X Ray Diffraction 5.5446 46.155 -- 142 2718 0.1534 0.2255 -- 95.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.043
f_dihedral_angle_d 24.244
f_angle_d 0.989
f_bond_d 0.005
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1230
Nucleic Acid Atoms 769
Heterogen Atoms 1
Solvent Atoms 66

Software

Computing
Computing Package Purpose
other Data Collection
XDS Data Reduction (intensity integration)
XDS Data Reduction (data scaling)
PHENIX Structure Solution
PHENIX (phenix.refine: dev_1218) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: dev_1218) refinement
PHENIX model building
other data collection