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X-RAY DIFFRACTION
Materials and Methods page
4J10
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 4.2
    Temperature 289.0
    Details 0.1M PHOSPHATE-CITRATE, 40% PEG300, PH 4.2, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 33.08 α = 90
    b = 38.39 β = 90
    c = 130.76 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details MIRROR
    Collection Date 2010-10-01
     
    Diffraction Radiation
    Monochromator SI 111 CRYSTAL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97923
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.44
    Resolution(Low) 28.9
    Number Reflections(All) 30476
    Number Reflections(Observed) 30476
    Percent Possible(Observed) 97.9
    R Merge I(Observed) 0.078
    Redundancy 6.8
     
    High Resolution Shell Details
    Resolution(High) 1.44
    Resolution(Low) 1.46
    Percent Possible(All) 85.2
    R Merge I(Observed) 0.44
    Mean I Over Sigma(Observed) 4.2
    Redundancy 5.0
    Number Unique Reflections(All) 1285
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.44
    Resolution(Low) 28.81
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 30371
    Number of Reflections(Observed) 30371
    Number of Reflections(R-Free) 1542
    Percent Reflections(Observed) 97.8
    R-Factor(Observed) 0.18
    R-Work 0.179
    R-Free 0.204
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4401
    Shell Resolution(Low) 1.4866
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 2306
    R-Factor(R-Work) 0.2119
    R-Factor(R-Free) 0.2525
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4866
    Shell Resolution(Low) 1.5397
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.187
    R-Factor(R-Free) 0.1998
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5397
    Shell Resolution(Low) 1.6014
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2600
    R-Factor(R-Work) 0.1629
    R-Factor(R-Free) 0.2026
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6014
    Shell Resolution(Low) 1.6742
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1638
    R-Factor(R-Free) 0.169
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6742
    Shell Resolution(Low) 1.7625
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.1692
    R-Factor(R-Free) 0.2264
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7625
    Shell Resolution(Low) 1.8729
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.164
    R-Factor(R-Free) 0.2024
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8729
    Shell Resolution(Low) 2.0175
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2657
    R-Factor(R-Work) 0.1727
    R-Factor(R-Free) 0.2149
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0175
    Shell Resolution(Low) 2.2204
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1666
    R-Factor(R-Free) 0.1988
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2204
    Shell Resolution(Low) 2.5416
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2688
    R-Factor(R-Work) 0.1699
    R-Factor(R-Free) 0.2009
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5416
    Shell Resolution(Low) 3.2014
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2715
    R-Factor(R-Work) 0.1839
    R-Factor(R-Free) 0.2147
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2014
    Shell Resolution(Low) 28.8168
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.1908
    R-Factor(R-Free) 0.198
    Percent Reflections(Observed) 93.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.063
    f_dihedral_angle_d 16.039
    f_angle_d 0.976
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1339
    Nucleic Acid Atoms 0
    Heterogen Atoms 9
    Solvent Atoms 149
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC-Collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution SHELXD/MLPHARE/DM/ARP/WARP/HKL3000
    Structure Refinement PHENIX (PHENIX.REFINE: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (PHENIX.REFINE: 1.8.1_1168)
    model building SHELXD/MLPHARE/DM/ARP/WARP/HKL3000
    data collection SBC-Collect