X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 4.2
Temperature 289.0
Details 0.1M PHOSPHATE-CITRATE, 40% PEG300, PH 4.2, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 33.08 α = 90
b = 38.39 β = 90
c = 130.76 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315 MIRROR 2010-10-01
Diffraction Radiation
Monochromator Protocol
SI 111 CRYSTAL SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97923 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.44 28.9 97.9 0.078 -- -- 6.8 30476 30476 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.44 1.46 85.2 0.44 -- 4.2 5.0 1285

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.44 28.81 -- 1.34 30371 30371 1542 97.8 -- 0.18 0.179 0.204 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.4401 1.4866 -- 111 2306 0.2119 0.2525 -- 88.0
X Ray Diffraction 1.4866 1.5397 -- 145 2580 0.187 0.1998 -- 98.0
X Ray Diffraction 1.5397 1.6014 -- 141 2600 0.1629 0.2026 -- 99.0
X Ray Diffraction 1.6014 1.6742 -- 144 2627 0.1638 0.169 -- 99.0
X Ray Diffraction 1.6742 1.7625 -- 148 2623 0.1692 0.2264 -- 100.0
X Ray Diffraction 1.7625 1.8729 -- 141 2660 0.164 0.2024 -- 100.0
X Ray Diffraction 1.8729 2.0175 -- 144 2657 0.1727 0.2149 -- 100.0
X Ray Diffraction 2.0175 2.2204 -- 118 2700 0.1666 0.1988 -- 100.0
X Ray Diffraction 2.2204 2.5416 -- 154 2688 0.1699 0.2009 -- 100.0
X Ray Diffraction 2.5416 3.2014 -- 143 2715 0.1839 0.2147 -- 100.0
X Ray Diffraction 3.2014 28.8168 -- 153 2673 0.1908 0.198 -- 93.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.063
f_dihedral_angle_d 16.039
f_angle_d 0.976
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1339
Nucleic Acid Atoms 0
Heterogen Atoms 9
Solvent Atoms 149

Software

Computing
Computing Package Purpose
SBC-Collect Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
SHELXD/MLPHARE/DM/ARP/WARP/HKL3000 Structure Solution
PHENIX (PHENIX.REFINE: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (PHENIX.REFINE: 1.8.1_1168) refinement
SHELXD/MLPHARE/DM/ARP/WARP/HKL3000 model building
SBC-Collect data collection