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X-RAY DIFFRACTION
Materials and Methods page
4J0U
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.9
    Temperature 289.0
    Details 100mM HEPES, 150mM NaCl, 8% PEG3350, pH 6.9, VAPOR DIFFUSION, HANGING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 63.72 α = 90
    b = 71.53 β = 90
    c = 115.53 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
    Diffrn ID 2
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-03-09
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2011-11-15
     
    Diffraction Radiation
    Monochromator DCM
    Diffraction Protocol SINGLE WAVELENGTH
    Monochromator DCM
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type DIAMOND BEAMLINE I04
    Wavelength List 0.9798
    Site DIAMOND
    Beamline I04
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.9798
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.2
    Observed Criterion Sigma(I) 4.8
    Resolution(High) 1.97
    Resolution(Low) 50
    Number Reflections(All) 37989
    Number Reflections(Observed) 37930
    Percent Possible(Observed) 99.0
    B(Isotropic) From Wilson Plot 28.85
     
    High Resolution Shell Details
    Resolution(High) 1.97
    Resolution(Low) 2.0
    Percent Possible(All) 100.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.969
    Resolution(Low) 36.725
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 37989
    Number of Reflections(Observed) 37930
    Number of Reflections(R-Free) 1918
    Percent Reflections(Observed) 95.49
    R-Factor(All) 0.1956
    R-Factor(Observed) 0.1956
    R-Work 0.1933
    R-Free 0.2365
    R-Free Selection Details 5
     
    Temperature Factor Modeling
    Mean Isotropic B Value 39.7091
    Anisotropic B[1][1] -7.5012
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -4.422
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 11.9232
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9694
    Shell Resolution(Low) 2.0187
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2138
    R-Factor(R-Work) 0.234
    R-Factor(R-Free) 0.3037
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0187
    Shell Resolution(Low) 2.0733
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2390
    R-Factor(R-Work) 0.2256
    R-Factor(R-Free) 0.2559
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0733
    Shell Resolution(Low) 2.1343
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2429
    R-Factor(R-Work) 0.2176
    R-Factor(R-Free) 0.2541
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1343
    Shell Resolution(Low) 2.2031
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2384
    R-Factor(R-Work) 0.2158
    R-Factor(R-Free) 0.2769
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2031
    Shell Resolution(Low) 2.2819
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2138
    R-Factor(R-Work) 0.2632
    R-Factor(R-Free) 0.336
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2819
    Shell Resolution(Low) 2.3732
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2367
    R-Factor(R-Work) 0.2111
    R-Factor(R-Free) 0.2294
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3732
    Shell Resolution(Low) 2.4812
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2472
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.2379
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4812
    Shell Resolution(Low) 2.612
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2511
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2509
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.612
    Shell Resolution(Low) 2.7756
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2554
    R-Factor(R-Work) 0.2199
    R-Factor(R-Free) 0.24
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7756
    Shell Resolution(Low) 2.9898
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.2024
    R-Factor(R-Free) 0.2628
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9898
    Shell Resolution(Low) 3.2905
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2567
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.2512
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2905
    Shell Resolution(Low) 3.7662
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.171
    R-Factor(R-Free) 0.2105
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7662
    Shell Resolution(Low) 4.7435
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.1637
    R-Factor(R-Free) 0.2086
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7435
    Shell Resolution(Low) 36.7316
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2740
    R-Factor(R-Work) 0.1838
    R-Factor(R-Free) 0.2187
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_dihedral_angle_d 15.056
    f_plane_restr 0.004
    f_chiral_restr 0.072
    f_angle_d 1.038
    f_bond_d 0.021
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3840
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 380
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution SHARP
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building SHARP
    data collection HKL-2000