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X-RAY DIFFRACTION
Materials and Methods page
4J0C
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.5
    Temperature 281.0
    Details 0.1M tri-sodium citrate pH 5.5, 20% PEG 3000, VAPOR DIFFUSION, SITTING DROP, temperature 281K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 46.46 α = 70.39
    b = 62.79 β = 86.01
    c = 83.8 γ = 79.41
     
    Space Group
    Space Group Name:    P 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2010-11-01
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type AUSTRALIAN SYNCHROTRON BEAMLINE MX2
    Wavelength List 0.9537
    Site AUSTRALIAN SYNCHROTRON
    Beamline MX2
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.65
    Number Reflections(Observed) 100941
    R Merge I(Observed) 0.077
    B(Isotropic) From Wilson Plot 14.61
    Redundancy 3.9
     
    High Resolution Shell Details
    Resolution(High) 1.65
    Resolution(Low) 1.74
    Percent Possible(All) 88.2
    R Merge I(Observed) 0.55
    Redundancy 3.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MIR
    reflnsShellList 1.65
    Resolution(Low) 19.677
    Cut-off Sigma(F) 1.98
    Number of Reflections(Observed) 100915
    Number of Reflections(R-Free) 5038
    Percent Reflections(Observed) 95.73
    R-Factor(Observed) 0.1661
    R-Work 0.1647
    R-Free 0.1919
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 20.8516
    Anisotropic B[1][1] 9.4533
    Anisotropic B[1][2] -4.5168
    Anisotropic B[1][3] 2.8299
    Anisotropic B[2][2] -7.5568
    Anisotropic B[2][3] -1.2857
    Anisotropic B[3][3] -0.691
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.65
    Shell Resolution(Low) 1.709
    Number of Reflections(R-Free) 462
    Number of Reflections(R-Work) 8706
    R-Factor(R-Work) 0.2693
    R-Factor(R-Free) 0.2948
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.709
    Shell Resolution(Low) 1.7773
    Number of Reflections(R-Free) 486
    Number of Reflections(R-Work) 9553
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.267
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7773
    Shell Resolution(Low) 1.8582
    Number of Reflections(R-Free) 490
    Number of Reflections(R-Work) 9661
    R-Factor(R-Work) 0.1866
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8582
    Shell Resolution(Low) 1.956
    Number of Reflections(R-Free) 477
    Number of Reflections(R-Work) 9581
    R-Factor(R-Work) 0.1591
    R-Factor(R-Free) 0.2025
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.956
    Shell Resolution(Low) 2.0785
    Number of Reflections(R-Free) 520
    Number of Reflections(R-Work) 9627
    R-Factor(R-Work) 0.1453
    R-Factor(R-Free) 0.1792
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0785
    Shell Resolution(Low) 2.2387
    Number of Reflections(R-Free) 514
    Number of Reflections(R-Work) 9683
    R-Factor(R-Work) 0.1356
    R-Factor(R-Free) 0.1731
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2387
    Shell Resolution(Low) 2.4637
    Number of Reflections(R-Free) 515
    Number of Reflections(R-Work) 9740
    R-Factor(R-Work) 0.1379
    R-Factor(R-Free) 0.1727
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4637
    Shell Resolution(Low) 2.8193
    Number of Reflections(R-Free) 530
    Number of Reflections(R-Work) 9695
    R-Factor(R-Work) 0.1466
    R-Factor(R-Free) 0.1765
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8193
    Shell Resolution(Low) 3.5486
    Number of Reflections(R-Free) 555
    Number of Reflections(R-Work) 9780
    R-Factor(R-Work) 0.1544
    R-Factor(R-Free) 0.18
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5486
    Shell Resolution(Low) 19.6782
    Number of Reflections(R-Free) 489
    Number of Reflections(R-Work) 9851
    R-Factor(R-Work) 0.1788
    R-Factor(R-Free) 0.188
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.078
    f_dihedral_angle_d 13.266
    f_angle_d 1.187
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6945
    Nucleic Acid Atoms 0
    Heterogen Atoms 51
    Solvent Atoms 679
     
     
  •   Software and Computing Hide
    Computing
    Data Collection blueice
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.7_650)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7_650)
    model building PHENIX
    data collection blueice