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X-RAY DIFFRACTION
Materials and Methods page
4J01
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 289.0
    Details 25 % PEG 2000MME, 100 mM Hepes pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.16 α = 90
    b = 182.18 β = 91.38
    c = 78.37 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2011-02-06
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.91948
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.25
    Resolution(Low) 50
    Number Reflections(All) 33964
    Number Reflections(Observed) 33964
    Percent Possible(Observed) 98.7
    B(Isotropic) From Wilson Plot 79.4
    Redundancy 4.4
     
    High Resolution Shell Details
    Resolution(High) 3.246
    Resolution(Low) 3.31
    Percent Possible(All) 91.7
    Mean I Over Sigma(Observed) 1.7
    R-Sym I(Observed) 0.779
    Redundancy 3.9
    Number Unique Reflections(All) 1542
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.246
    Resolution(Low) 35.904
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 33750
    Number of Reflections(Observed) 33750
    Number of Reflections(R-Free) 1739
    Percent Reflections(Observed) 97.59
    R-Factor(All) 0.235
    R-Factor(Observed) 0.235
    R-Work 0.241
    R-Free 0.276
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
    Mean Isotropic B Value 138.3
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2461
    Shell Resolution(Low) 3.3416
    Number of Reflections(Observed) 2511
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2381
    R-Factor(R-Work) 0.324
    R-Factor(R-Free) 0.3658
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3416
    Shell Resolution(Low) 3.4493
    Number of Reflections(Observed) 2741
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2602
    R-Factor(R-Work) 0.3171
    R-Factor(R-Free) 0.3382
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4493
    Shell Resolution(Low) 3.5725
    Number of Reflections(Observed) 2807
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.3173
    R-Factor(R-Free) 0.3527
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5725
    Shell Resolution(Low) 3.7154
    Number of Reflections(Observed) 2873
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.3122
    R-Factor(R-Free) 0.3236
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7154
    Shell Resolution(Low) 3.8843
    Number of Reflections(Observed) 2855
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.3031
    R-Factor(R-Free) 0.3023
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8843
    Shell Resolution(Low) 4.0888
    Number of Reflections(Observed) 2864
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.2901
    R-Factor(R-Free) 0.3397
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0888
    Shell Resolution(Low) 4.3446
    Number of Reflections(Observed) 2887
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2752
    R-Factor(R-Work) 0.2661
    R-Factor(R-Free) 0.292
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3446
    Shell Resolution(Low) 4.6794
    Number of Reflections(Observed) 2822
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2682
    R-Factor(R-Work) 0.2488
    R-Factor(R-Free) 0.2716
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6794
    Shell Resolution(Low) 5.1491
    Number of Reflections(Observed) 2852
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.2388
    R-Factor(R-Free) 0.2828
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1491
    Shell Resolution(Low) 5.8913
    Number of Reflections(Observed) 2870
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2730
    R-Factor(R-Work) 0.2252
    R-Factor(R-Free) 0.2609
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.8913
    Shell Resolution(Low) 7.4117
    Number of Reflections(Observed) 2839
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2690
    R-Factor(R-Work) 0.2299
    R-Factor(R-Free) 0.2743
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.4117
    Shell Resolution(Low) 35.9066
    Number of Reflections(Observed) 2828
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2672
    R-Factor(R-Work) 0.14
    R-Factor(R-Free) 0.2081
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.05
    f_dihedral_angle_d 20.555
    f_angle_d 0.833
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9656
    Nucleic Acid Atoms 2364
    Heterogen Atoms 5
    Solvent Atoms 8
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution HKL3000, Molrep
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1161), refmac5.5
     
    Software
    refinement refmac5.5
    refinement PHENIX version: (phenix.refine: 1.8.1_1161)
    model building Molrep
    model building HKL3000
    data collection HKL3000
    data collection SBCCOLLECT