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X-RAY DIFFRACTION
Materials and Methods page
4J00
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 289.0
    Details 25 % PEG 4000, 50 mM Tris pH 7.5, 160 mM sodium formate, 10 mM magnesium chloride, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.93 α = 90
    b = 92.93 β = 90
    c = 97.65 γ = 120
     
    Space Group
    Space Group Name:    P 31
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2010-12-10
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97910
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3
    Resolution(Low) 50
    Number Reflections(All) 18807
    Number Reflections(Observed) 18807
    Percent Possible(Observed) 100.0
    B(Isotropic) From Wilson Plot 55.5
    Redundancy 6.8
     
    High Resolution Shell Details
    Resolution(High) 3.0
    Resolution(Low) 3.05
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 2.0
    R-Sym I(Observed) 0.709
    Redundancy 5.4
    Number Unique Reflections(All) 905
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.004
    Resolution(Low) 46.465
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 18786
    Number of Reflections(Observed) 18786
    Number of Reflections(R-Free) 965
    Percent Reflections(Observed) 100.0
    R-Factor(All) 0.177
    R-Factor(Observed) 0.177
    R-Work 0.168
    R-Free 0.205
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
    Mean Isotropic B Value 57.9
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0039
    Shell Resolution(Low) 3.1622
    Number of Reflections(Observed) 2654
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2511
    R-Factor(R-Work) 0.2032
    R-Factor(R-Free) 0.2183
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1622
    Shell Resolution(Low) 3.3602
    Number of Reflections(Observed) 2696
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2545
    R-Factor(R-Work) 0.1842
    R-Factor(R-Free) 0.229
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3602
    Shell Resolution(Low) 3.6195
    Number of Reflections(Observed) 2697
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2551
    R-Factor(R-Work) 0.1737
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6195
    Shell Resolution(Low) 3.9833
    Number of Reflections(Observed) 2665
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2525
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.1994
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9833
    Shell Resolution(Low) 4.5588
    Number of Reflections(Observed) 2687
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.1577
    R-Factor(R-Free) 0.192
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5588
    Shell Resolution(Low) 5.7403
    Number of Reflections(Observed) 2689
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2556
    R-Factor(R-Work) 0.1643
    R-Factor(R-Free) 0.1848
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.7403
    Shell Resolution(Low) 37.2077
    Number of Reflections(Observed) 2692
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.1872
    R-Factor(R-Free) 0.2344
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.049
    f_dihedral_angle_d 19.606
    f_angle_d 0.761
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4872
    Nucleic Acid Atoms 978
    Heterogen Atoms 1
    Solvent Atoms 26
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution HKL3000, Molrep
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1161), refmac5.5
     
    Software
    refinement refmac5.5
    refinement PHENIX version: (phenix.refine: 1.8.1_1161)
    model building Molrep
    model building HKL3000
    data collection HKL3000
    data collection SBCCOLLECT