POP-OUT | CLOSE
 
X-RAY DIFFRACTION
Materials and Methods page
4IYH
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 4.2
    Temperature 289.0
    Details 0.1M Na2HPO4:Citric Acid, 2.0M Ammonium Sulfate, pH 4.2, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 77.34 α = 90
    b = 77.34 β = 90
    c = 71.23 γ = 120
     
    Space Group
    Space Group Name:    P 31
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details Mirror
    Collection Date 2010-10-01
     
    Diffraction Radiation
    Monochromator Si 111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97931
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.88
    Resolution(Low) 49
    Number Reflections(All) 38708
    Number Reflections(Observed) 38708
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.095
    Redundancy 4.5
     
    High Resolution Shell Details
    Resolution(High) 1.88
    Resolution(Low) 1.91
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.616
    Mean I Over Sigma(Observed) 2.2
    Redundancy 4.0
    Number Unique Reflections(All) 1928
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.881
    Resolution(Low) 48.792
    Cut-off Sigma(F) 1.96
    Number of Reflections(all) 38682
    Number of Reflections(Observed) 38682
    Number of Reflections(R-Free) 1939
    Percent Reflections(Observed) 99.97
    R-Factor(Observed) 0.145
    R-Work 0.1411
    R-Free 0.1615
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8812
    Shell Resolution(Low) 1.9283
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.2146
    R-Factor(R-Free) 0.2193
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9283
    Shell Resolution(Low) 1.9804
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2661
    R-Factor(R-Work) 0.1958
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9804
    Shell Resolution(Low) 2.0387
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2584
    R-Factor(R-Work) 0.1769
    R-Factor(R-Free) 0.1881
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0387
    Shell Resolution(Low) 2.1045
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.1625
    R-Factor(R-Free) 0.1695
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1045
    Shell Resolution(Low) 2.1797
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2593
    R-Factor(R-Work) 0.1514
    R-Factor(R-Free) 0.1585
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1797
    Shell Resolution(Low) 2.2669
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2666
    R-Factor(R-Work) 0.1436
    R-Factor(R-Free) 0.1513
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2669
    Shell Resolution(Low) 2.37
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 2634
    R-Factor(R-Work) 0.1408
    R-Factor(R-Free) 0.1776
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.37
    Shell Resolution(Low) 2.4949
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2646
    R-Factor(R-Work) 0.1388
    R-Factor(R-Free) 0.1373
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4949
    Shell Resolution(Low) 2.6512
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2621
    R-Factor(R-Work) 0.1403
    R-Factor(R-Free) 0.1597
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6512
    Shell Resolution(Low) 2.8557
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2643
    R-Factor(R-Work) 0.1403
    R-Factor(R-Free) 0.1607
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8557
    Shell Resolution(Low) 3.1428
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.1373
    R-Factor(R-Free) 0.1541
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1428
    Shell Resolution(Low) 3.597
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2636
    R-Factor(R-Work) 0.1372
    R-Factor(R-Free) 0.18
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.597
    Shell Resolution(Low) 4.5294
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2617
    R-Factor(R-Work) 0.1139
    R-Factor(R-Free) 0.1369
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5294
    Shell Resolution(Low) 30.3094
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.1493
    R-Factor(R-Free) 0.1846
    Percent Reflections(Observed) 94.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.057
    f_dihedral_angle_d 15.351
    f_angle_d 0.806
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2523
    Nucleic Acid Atoms 0
    Heterogen Atoms 60
    Solvent Atoms 161
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC-Collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution SHELXD/MLPHARE/DM/ARP/wARP/HKL3000
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building SHELXD/MLPHARE/DM/ARP/wARP/HKL3000
    data collection SBC-Collect