X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 4.2
Temperature 289.0
Details 0.1M Na2HPO4:Citric Acid, 2.0M Ammonium Sulfate, pH 4.2, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 77.34 α = 90
b = 77.34 β = 90
c = 71.23 γ = 120
Symmetry
Space Group P 31

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r Mirror 2010-10-01
Diffraction Radiation
Monochromator Protocol
Si 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97931 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.88 49 100.0 0.095 -- -- 4.5 38708 38708 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.88 1.91 99.9 0.616 -- 2.2 4.0 1928

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.881 48.792 -- 1.96 38682 38682 1939 99.97 -- 0.145 0.1411 0.1615 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.8812 1.9283 -- 150 2593 0.2146 0.2193 -- 94.0
X Ray Diffraction 1.9283 1.9804 -- 130 2661 0.1958 0.2 -- 95.0
X Ray Diffraction 1.9804 2.0387 -- 147 2584 0.1769 0.1881 -- 95.0
X Ray Diffraction 2.0387 2.1045 -- 150 2627 0.1625 0.1695 -- 95.0
X Ray Diffraction 2.1045 2.1797 -- 138 2593 0.1514 0.1585 -- 95.0
X Ray Diffraction 2.1797 2.2669 -- 121 2666 0.1436 0.1513 -- 96.0
X Ray Diffraction 2.2669 2.37 -- 119 2634 0.1408 0.1776 -- 96.0
X Ray Diffraction 2.37 2.4949 -- 138 2646 0.1388 0.1373 -- 95.0
X Ray Diffraction 2.4949 2.6512 -- 116 2621 0.1403 0.1597 -- 96.0
X Ray Diffraction 2.6512 2.8557 -- 134 2643 0.1403 0.1607 -- 95.0
X Ray Diffraction 2.8557 3.1428 -- 154 2590 0.1373 0.1541 -- 94.0
X Ray Diffraction 3.1428 3.597 -- 132 2636 0.1372 0.18 -- 95.0
X Ray Diffraction 3.597 4.5294 -- 144 2617 0.1139 0.1369 -- 95.0
X Ray Diffraction 4.5294 30.3094 -- 165 2598 0.1493 0.1846 -- 94.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.003
f_chiral_restr 0.057
f_dihedral_angle_d 15.351
f_angle_d 0.806
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 2523
Nucleic Acid Atoms 0
Heterogen Atoms 60
Solvent Atoms 161

Software

Computing
Computing Package Purpose
SBC-Collect Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
SHELXD/MLPHARE/DM/ARP/wARP/HKL3000 Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
SHELXD/MLPHARE/DM/ARP/wARP/HKL3000 model building
SBC-Collect data collection