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X-RAY DIFFRACTION
Materials and Methods page
4IWF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 15% PEG 3350, 0.05M magnesium chloride, 0.067M sodium chloride, 0.1M Tris, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 55.9 α = 90
    b = 83.04 β = 108.54
    c = 58.19 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2010-12-18
     
    Diffraction Radiation
    Monochromator Si (111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 1.0
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.93
    Resolution(Low) 50
    Number Reflections(All) 36045
    Number Reflections(Observed) 36045
    Percent Possible(Observed) 95.24
    B(Isotropic) From Wilson Plot 30.81
    Redundancy 3.6
     
    High Resolution Shell Details
    Resolution(High) 1.93
    Resolution(Low) 1.96
    Percent Possible(All) 74.65
    Mean I Over Sigma(Observed) 4.32
    R-Sym I(Observed) 0.287
    Redundancy 3.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.932
    Resolution(Low) 40.419
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 34550
    Number of Reflections(Observed) 34548
    Number of Reflections(R-Free) 1905
    Percent Reflections(Observed) 91.36
    R-Factor(Observed) 0.1747
    R-Work 0.1727
    R-Free 0.2086
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -8.0369
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 6.9423
    Anisotropic B[2][2] 16.4824
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -8.4455
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.932
    Shell Resolution(Low) 1.9803
    Number of Reflections(R-Free) 82
    Number of Reflections(R-Work) 1581
    R-Factor(R-Work) 0.2174
    R-Factor(R-Free) 0.2953
    Percent Reflections(Observed) 63.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9803
    Shell Resolution(Low) 2.0338
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 1918
    R-Factor(R-Work) 0.2185
    R-Factor(R-Free) 0.2626
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0338
    Shell Resolution(Low) 2.0937
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2046
    R-Factor(R-Work) 0.2006
    R-Factor(R-Free) 0.237
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0937
    Shell Resolution(Low) 2.1612
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2248
    R-Factor(R-Work) 0.195
    R-Factor(R-Free) 0.248
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1612
    Shell Resolution(Low) 2.2385
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2329
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.2287
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2385
    Shell Resolution(Low) 2.3281
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2414
    R-Factor(R-Work) 0.1796
    R-Factor(R-Free) 0.2505
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3281
    Shell Resolution(Low) 2.434
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2479
    R-Factor(R-Work) 0.1786
    R-Factor(R-Free) 0.2314
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.434
    Shell Resolution(Low) 2.5624
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2477
    R-Factor(R-Work) 0.1791
    R-Factor(R-Free) 0.2575
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5624
    Shell Resolution(Low) 2.7229
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2499
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.222
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7229
    Shell Resolution(Low) 2.933
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2522
    R-Factor(R-Work) 0.1841
    R-Factor(R-Free) 0.2561
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.933
    Shell Resolution(Low) 3.2281
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2524
    R-Factor(R-Work) 0.183
    R-Factor(R-Free) 0.2157
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2281
    Shell Resolution(Low) 3.6949
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2521
    R-Factor(R-Work) 0.1676
    R-Factor(R-Free) 0.2134
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6949
    Shell Resolution(Low) 4.6541
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2542
    R-Factor(R-Work) 0.141
    R-Factor(R-Free) 0.1714
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.6541
    Shell Resolution(Low) 40.419
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2543
    R-Factor(R-Work) 0.1727
    R-Factor(R-Free) 0.172
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.062
    f_dihedral_angle_d 14.609
    f_angle_d 1.063
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3831
    Nucleic Acid Atoms 0
    Heterogen Atoms 38
    Solvent Atoms 243
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.automr)
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.automr)
    data collection HKL-2000