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X-RAY DIFFRACTION
Materials and Methods page
4IWC
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 15% PEG 3350, 0.05M magnesium chloride, 0.067M sodium chloride, 0.1M Tris, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 55.86 α = 90
    b = 83.5 β = 108.54
    c = 58.61 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MAR scanner 300 mm plate
    Collection Date 2010-12-18
     
    Diffraction Radiation
    Monochromator Si (111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 23-ID-B
    Wavelength List 1.0
    Site APS
    Beamline 23-ID-B
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.24
    Resolution(Low) 50
    Number Reflections(All) 23428
    Number Reflections(Observed) 23428
    Percent Possible(Observed) 95.13
    Redundancy 3.1
     
    High Resolution Shell Details
    Resolution(High) 2.24
    Resolution(Low) 2.28
    Percent Possible(All) 75.6
    Mean I Over Sigma(Observed) 4.57
    R-Sym I(Observed) 0.239
    Redundancy 2.1
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.24
    Resolution(Low) 46.411
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 22209
    Number of Reflections(Observed) 22209
    Number of Reflections(R-Free) 1907
    Percent Reflections(Observed) 90.18
    R-Factor(Observed) 0.1887
    R-Work 0.1851
    R-Free 0.2267
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.0533
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 4.371
    Anisotropic B[2][2] 8.5425
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -6.4891
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.24
    Shell Resolution(Low) 2.2962
    Number of Reflections(R-Free) 92
    Number of Reflections(R-Work) 1007
    R-Factor(R-Work) 0.2224
    R-Factor(R-Free) 0.2826
    Percent Reflections(Observed) 64.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2962
    Shell Resolution(Low) 2.3583
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 1202
    R-Factor(R-Work) 0.2216
    R-Factor(R-Free) 0.282
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3583
    Shell Resolution(Low) 2.4277
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 1355
    R-Factor(R-Work) 0.2044
    R-Factor(R-Free) 0.31
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4277
    Shell Resolution(Low) 2.506
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1347
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.208
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.506
    Shell Resolution(Low) 2.5956
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 1415
    R-Factor(R-Work) 0.2014
    R-Factor(R-Free) 0.2617
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5956
    Shell Resolution(Low) 2.6995
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1456
    R-Factor(R-Work) 0.1962
    R-Factor(R-Free) 0.2665
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6995
    Shell Resolution(Low) 2.8223
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1497
    R-Factor(R-Work) 0.2065
    R-Factor(R-Free) 0.2199
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8223
    Shell Resolution(Low) 2.9711
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1535
    R-Factor(R-Work) 0.2006
    R-Factor(R-Free) 0.2501
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9711
    Shell Resolution(Low) 3.1572
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1525
    R-Factor(R-Work) 0.1926
    R-Factor(R-Free) 0.2553
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1572
    Shell Resolution(Low) 3.4009
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1557
    R-Factor(R-Work) 0.1929
    R-Factor(R-Free) 0.2062
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4009
    Shell Resolution(Low) 3.743
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1594
    R-Factor(R-Work) 0.172
    R-Factor(R-Free) 0.2215
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.743
    Shell Resolution(Low) 4.2843
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 1580
    R-Factor(R-Work) 0.1573
    R-Factor(R-Free) 0.186
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2843
    Shell Resolution(Low) 5.3965
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1604
    R-Factor(R-Work) 0.157
    R-Factor(R-Free) 0.1911
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3965
    Shell Resolution(Low) 46.4211
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1628
    R-Factor(R-Work) 0.1994
    R-Factor(R-Free) 0.2426
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.052
    f_dihedral_angle_d 16.016
    f_angle_d 1.272
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3911
    Nucleic Acid Atoms 0
    Heterogen Atoms 42
    Solvent Atoms 178
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.automr)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.automr)
    data collection HKL-2000