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X-RAY DIFFRACTION
Materials and Methods page
4IW8
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 15% PEG 3350, 0.05M magnesium chloride, 0.067M sodium chloride, 0.1M Tris, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.17 α = 90
    b = 81.09 β = 109.49
    c = 58.12 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-07-27
     
    Diffraction Radiation
    Monochromator Side scattering bent cube I-beam single crystal, asymmetric cut 4.965 degs
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 1.0
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.04
    Resolution(Low) 50
    Number Reflections(All) 29476
    Number Reflections(Observed) 29476
    Percent Possible(Observed) 97.12
    B(Isotropic) From Wilson Plot 33.72
    Redundancy 6.3
     
    High Resolution Shell Details
    Resolution(High) 2.0375
    Resolution(Low) 2.09
    Percent Possible(All) 89.33
    Mean I Over Sigma(Observed) 2.3
    R-Sym I(Observed) 0.812
    Redundancy 6.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.0375
    Resolution(Low) 45.735
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 27626
    Number of Reflections(Observed) 27626
    Number of Reflections(R-Free) 1874
    Percent Reflections(Observed) 91.02
    R-Factor(All) 0.2108
    R-Factor(Observed) 0.2108
    R-Work 0.2081
    R-Free 0.2468
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.79
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.5104
    Anisotropic B[2][2] 4.064
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.274
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0375
    Shell Resolution(Low) 2.0926
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 1587
    R-Factor(R-Work) 0.2948
    R-Factor(R-Free) 0.369
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0926
    Shell Resolution(Low) 2.1542
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1799
    R-Factor(R-Work) 0.2664
    R-Factor(R-Free) 0.2972
    Percent Reflections(Observed) 84.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1542
    Shell Resolution(Low) 2.2237
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1752
    R-Factor(R-Work) 0.2519
    R-Factor(R-Free) 0.2726
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2237
    Shell Resolution(Low) 2.3032
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1875
    R-Factor(R-Work) 0.2771
    R-Factor(R-Free) 0.3563
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3032
    Shell Resolution(Low) 2.3954
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2029
    R-Factor(R-Work) 0.2306
    R-Factor(R-Free) 0.2829
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3954
    Shell Resolution(Low) 2.5044
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2045
    R-Factor(R-Work) 0.219
    R-Factor(R-Free) 0.2796
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5044
    Shell Resolution(Low) 2.6364
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2088
    R-Factor(R-Work) 0.231
    R-Factor(R-Free) 0.2706
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6364
    Shell Resolution(Low) 2.8016
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1996
    R-Factor(R-Work) 0.2209
    R-Factor(R-Free) 0.2936
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8016
    Shell Resolution(Low) 3.0178
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2110
    R-Factor(R-Work) 0.2108
    R-Factor(R-Free) 0.2743
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0178
    Shell Resolution(Low) 3.3215
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2120
    R-Factor(R-Work) 0.2135
    R-Factor(R-Free) 0.2497
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3215
    Shell Resolution(Low) 3.8019
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2085
    R-Factor(R-Work) 0.1843
    R-Factor(R-Free) 0.2112
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8019
    Shell Resolution(Low) 4.7891
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2095
    R-Factor(R-Work) 0.1628
    R-Factor(R-Free) 0.169
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7891
    Shell Resolution(Low) 45.7462
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2171
    R-Factor(R-Work) 0.2115
    R-Factor(R-Free) 0.2513
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.039
    f_dihedral_angle_d 14.365
    f_angle_d 0.553
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3917
    Nucleic Acid Atoms 0
    Heterogen Atoms 52
    Solvent Atoms 165
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.automr)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.automr)
    data collection HKL-2000