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X-RAY DIFFRACTION
Materials and Methods page
4IW6
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 15% PEG 3350, 0.05M magnesium chloride, 0.067M sodium chloride, 0.1M Tris, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.73 α = 90
    b = 81.63 β = 109.77
    c = 58.47 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-07-27
     
    Diffraction Radiation
    Monochromator Side scattering bent cube I-beam single crystal, asymmetric cut 4.965 degs
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 1.0
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.98
    Resolution(Low) 50
    Number Reflections(All) 33288
    Number Reflections(Observed) 33288
    Percent Possible(Observed) 97.76
    B(Isotropic) From Wilson Plot 32.69
    Redundancy 6.6
     
    High Resolution Shell Details
    Resolution(High) 1.98
    Resolution(Low) 2.01
    Percent Possible(All) 93.74
    Mean I Over Sigma(Observed) 2.54
    R-Sym I(Observed) 0.643
    Redundancy 6.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.98
    Resolution(Low) 46.197
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 31685
    Number of Reflections(Observed) 31685
    Number of Reflections(R-Free) 1903
    Percent Reflections(Observed) 93.05
    R-Factor(All) 0.1838
    R-Factor(Observed) 0.1838
    R-Work 0.181
    R-Free 0.2268
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.0241
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 5.1554
    Anisotropic B[2][2] 2.7606
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.7364
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.98
    Shell Resolution(Low) 2.024
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 1822
    R-Factor(R-Work) 0.2376
    R-Factor(R-Free) 0.2858
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.024
    Shell Resolution(Low) 2.0787
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2011
    R-Factor(R-Work) 0.2081
    R-Factor(R-Free) 0.3309
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0787
    Shell Resolution(Low) 2.1398
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2032
    R-Factor(R-Work) 0.2134
    R-Factor(R-Free) 0.2799
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1398
    Shell Resolution(Low) 2.2089
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1999
    R-Factor(R-Work) 0.2016
    R-Factor(R-Free) 0.2858
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2089
    Shell Resolution(Low) 2.2879
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2010
    R-Factor(R-Work) 0.2289
    R-Factor(R-Free) 0.3288
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2879
    Shell Resolution(Low) 2.3795
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2159
    R-Factor(R-Work) 0.1992
    R-Factor(R-Free) 0.2397
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3795
    Shell Resolution(Low) 2.4877
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2186
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2616
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4877
    Shell Resolution(Low) 2.6189
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2213
    R-Factor(R-Work) 0.1889
    R-Factor(R-Free) 0.2299
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6189
    Shell Resolution(Low) 2.783
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2196
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2146
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.783
    Shell Resolution(Low) 2.9978
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2191
    R-Factor(R-Work) 0.1935
    R-Factor(R-Free) 0.2589
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9978
    Shell Resolution(Low) 3.2994
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2266
    R-Factor(R-Work) 0.1904
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2994
    Shell Resolution(Low) 3.7766
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2202
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7766
    Shell Resolution(Low) 4.7574
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2204
    R-Factor(R-Work) 0.1386
    R-Factor(R-Free) 0.1814
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7574
    Shell Resolution(Low) 46.197
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2291
    R-Factor(R-Work) 0.1799
    R-Factor(R-Free) 0.2074
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.06
    f_dihedral_angle_d 13.684
    f_angle_d 0.91
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3845
    Nucleic Acid Atoms 0
    Heterogen Atoms 50
    Solvent Atoms 197
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.automr)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.automr)
    data collection HKL-2000