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X-RAY DIFFRACTION
Materials and Methods page
4IVY
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 15% PEG 3350, 0.05M magnesium chloride, 0.067M sodium chloride, 0.1M Tris, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.75 α = 90
    b = 81.54 β = 109.87
    c = 58.45 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-07-27
     
    Diffraction Radiation
    Monochromator Side scattering bent cube I-beam single crystal, asymmetric cut 4.965 degs
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 1.0
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.95
    Resolution(Low) 50
    Number Reflections(All) 34396
    Number Reflections(Observed) 34396
    Percent Possible(Observed) 96.45
    B(Isotropic) From Wilson Plot 30.79
    Redundancy 6.5
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 1.98
    Percent Possible(All) 88.83
    Mean I Over Sigma(Observed) 2.17
    R-Sym I(Observed) 0.869
    Redundancy 6.6
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.95
    Resolution(Low) 46.226
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 32363
    Number of Reflections(Observed) 32363
    Number of Reflections(R-Free) 1861
    Percent Reflections(Observed) 90.75
    R-Factor(All) 0.2121
    R-Factor(Observed) 0.2121
    R-Work 0.2109
    R-Free 0.2322
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.1807
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 4.353
    Anisotropic B[2][2] 3.622
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.4413
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.95
    Shell Resolution(Low) 1.9956
    Number of Reflections(R-Free) 105
    Number of Reflections(R-Work) 1859
    R-Factor(R-Work) 0.2728
    R-Factor(R-Free) 0.3156
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9956
    Shell Resolution(Low) 2.0544
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2194
    R-Factor(R-Work) 0.2598
    R-Factor(R-Free) 0.3103
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0544
    Shell Resolution(Low) 2.1207
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2276
    R-Factor(R-Work) 0.2408
    R-Factor(R-Free) 0.2944
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1207
    Shell Resolution(Low) 2.1965
    Number of Reflections(R-Free) 124
    Number of Reflections(R-Work) 2313
    R-Factor(R-Work) 0.2282
    R-Factor(R-Free) 0.2526
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1965
    Shell Resolution(Low) 2.2844
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2124
    R-Factor(R-Work) 0.2663
    R-Factor(R-Free) 0.2939
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2844
    Shell Resolution(Low) 2.3884
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2425
    R-Factor(R-Work) 0.2195
    R-Factor(R-Free) 0.2562
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3884
    Shell Resolution(Low) 2.5143
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2482
    R-Factor(R-Work) 0.2159
    R-Factor(R-Free) 0.2551
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5143
    Shell Resolution(Low) 2.6718
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2462
    R-Factor(R-Work) 0.2158
    R-Factor(R-Free) 0.29
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6718
    Shell Resolution(Low) 2.8781
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2450
    R-Factor(R-Work) 0.2208
    R-Factor(R-Free) 0.2306
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8781
    Shell Resolution(Low) 3.1676
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2543
    R-Factor(R-Work) 0.2196
    R-Factor(R-Free) 0.2216
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1676
    Shell Resolution(Low) 3.6258
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2461
    R-Factor(R-Work) 0.2066
    R-Factor(R-Free) 0.2305
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6258
    Shell Resolution(Low) 4.5675
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2334
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2062
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5675
    Shell Resolution(Low) 46.226
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2579
    R-Factor(R-Work) 0.2009
    R-Factor(R-Free) 0.1947
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.001
    f_chiral_restr 0.037
    f_dihedral_angle_d 14.006
    f_angle_d 0.528
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3813
    Nucleic Acid Atoms 0
    Heterogen Atoms 50
    Solvent Atoms 222
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blue ice
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.automr)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.automr)
    data collection Blue version: ice