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X-RAY DIFFRACTION
Materials and Methods page
4IVW
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 15% PEG 3350, 0.05M magnesium chloride, 0.067M sodium chloride, 0.1M Tris, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.48 α = 90
    b = 81.4 β = 109.82
    c = 58.6 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-07-27
     
    Diffraction Radiation
    Monochromator Side scattering bent cube I-beam single crystal, asymmetric cut 4.965 degs
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 1.0
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.06
    Resolution(Low) 50
    Number Reflections(All) 29295
    Number Reflections(Observed) 29295
    Percent Possible(Observed) 97.16
    B(Isotropic) From Wilson Plot 37.59
    Redundancy 6.5
     
    High Resolution Shell Details
    Resolution(High) 2.06
    Resolution(Low) 2.1
    Percent Possible(All) 90.58
    Mean I Over Sigma(Observed) 2.36
    R-Sym I(Observed) 0.0
    Redundancy 6.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.06
    Resolution(Low) 46.141
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 27983
    Number of Reflections(Observed) 27983
    Number of Reflections(R-Free) 1906
    Percent Reflections(Observed) 92.81
    R-Factor(All) 0.1876
    R-Factor(Observed) 0.1876
    R-Work 0.1846
    R-Free 0.2295
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.2459
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.0084
    Anisotropic B[2][2] 3.6704
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.4245
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.06
    Shell Resolution(Low) 2.1042
    Number of Reflections(R-Free) 109
    Number of Reflections(R-Work) 1528
    R-Factor(R-Work) 0.2571
    R-Factor(R-Free) 0.3626
    Percent Reflections(Observed) 76.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1042
    Shell Resolution(Low) 2.1611
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 1698
    R-Factor(R-Work) 0.2189
    R-Factor(R-Free) 0.2617
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1611
    Shell Resolution(Low) 2.2247
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1720
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2589
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2247
    Shell Resolution(Low) 2.2965
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 1843
    R-Factor(R-Work) 0.1987
    R-Factor(R-Free) 0.2379
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2965
    Shell Resolution(Low) 2.3786
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1885
    R-Factor(R-Work) 0.2061
    R-Factor(R-Free) 0.2587
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3786
    Shell Resolution(Low) 2.4738
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1875
    R-Factor(R-Work) 0.2031
    R-Factor(R-Free) 0.2453
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4738
    Shell Resolution(Low) 2.5864
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1902
    R-Factor(R-Work) 0.2055
    R-Factor(R-Free) 0.2898
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5864
    Shell Resolution(Low) 2.7227
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1919
    R-Factor(R-Work) 0.2113
    R-Factor(R-Free) 0.2658
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7227
    Shell Resolution(Low) 2.8933
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1879
    R-Factor(R-Work) 0.213
    R-Factor(R-Free) 0.2488
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8933
    Shell Resolution(Low) 3.1166
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1964
    R-Factor(R-Work) 0.1997
    R-Factor(R-Free) 0.2379
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1166
    Shell Resolution(Low) 3.4302
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1972
    R-Factor(R-Work) 0.194
    R-Factor(R-Free) 0.2749
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4302
    Shell Resolution(Low) 3.9263
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 1943
    R-Factor(R-Work) 0.1658
    R-Factor(R-Free) 0.2182
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9263
    Shell Resolution(Low) 4.9458
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1941
    R-Factor(R-Work) 0.1443
    R-Factor(R-Free) 0.1741
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9458
    Shell Resolution(Low) 46.141
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2008
    R-Factor(R-Work) 0.1829
    R-Factor(R-Free) 0.2052
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.053
    f_dihedral_angle_d 14.505
    f_angle_d 0.787
    f_bond_d 0.005
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3843
    Nucleic Acid Atoms 0
    Heterogen Atoms 56
    Solvent Atoms 138
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blue ice
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.automr)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.automr)
    data collection Blue version: ice