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X-RAY DIFFRACTION
Materials and Methods page
4IVR
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 296.0
    Details 0.9-1.2 M lithium sulfate, 1 mM DTT, 0.1 M HEPES, pH 7.5-8.0, VAPOR DIFFUSION, HANGING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 113.04 α = 90
    b = 115.13 β = 90
    c = 108.07 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 2M-F
    Collection Date 2012-02-11
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.0
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.4
    Resolution(Low) 40.33
    Number Reflections(Observed) 27904
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.13
    B(Isotropic) From Wilson Plot 46.8
    Redundancy 10.5
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.53
    Percent Possible(All) 99.9
    R Merge I(Observed) 0.346
    Mean I Over Sigma(Observed) 5.6
    R-Sym I(Observed) 0.33
    Redundancy 11.7
    Number Unique Reflections(All) 4019
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.4
    Resolution(Low) 40.33
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 27336
    Number of Reflections(Observed) 27327
    Number of Reflections(R-Free) 1367
    Percent Reflections(Observed) 97.95
    R-Factor(All) 0.249
    R-Factor(Observed) 0.1992
    R-Work 0.1961
    R-Free 0.2566
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 41.09
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4
    Shell Resolution(Low) 2.4858
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.2192
    R-Factor(R-Free) 0.3443
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4858
    Shell Resolution(Low) 2.5853
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2538
    R-Factor(R-Work) 0.2263
    R-Factor(R-Free) 0.3625
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5853
    Shell Resolution(Low) 2.7029
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2534
    R-Factor(R-Work) 0.2426
    R-Factor(R-Free) 0.3688
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7029
    Shell Resolution(Low) 2.8454
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2564
    R-Factor(R-Work) 0.2372
    R-Factor(R-Free) 0.3151
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8454
    Shell Resolution(Low) 3.0236
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2565
    R-Factor(R-Work) 0.239
    R-Factor(R-Free) 0.2979
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0236
    Shell Resolution(Low) 3.257
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2587
    R-Factor(R-Work) 0.2289
    R-Factor(R-Free) 0.2936
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.257
    Shell Resolution(Low) 3.5846
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2581
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.2627
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5846
    Shell Resolution(Low) 4.1028
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2608
    R-Factor(R-Work) 0.1733
    R-Factor(R-Free) 0.2183
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1028
    Shell Resolution(Low) 5.1674
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2660
    R-Factor(R-Work) 0.1577
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1674
    Shell Resolution(Low) 40.3356
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2783
    R-Factor(R-Work) 0.1915
    R-Factor(R-Free) 0.2267
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.072
    f_dihedral_angle_d 13.704
    f_angle_d 1.108
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4673
    Nucleic Acid Atoms 0
    Heterogen Atoms 44
    Solvent Atoms 113
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection None