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X-RAY DIFFRACTION
Materials and Methods page
4IVQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.5
    Temperature 296.0
    Details 0.9-1.2 M lithium sulfate, 1 mM DTT, 0.1 M HEPES, pH 7.5-8.0, VAPOR DIFFUSION, HANGING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 113.43 α = 90
    b = 117.07 β = 90
    c = 107.78 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 2M-F
    Collection Date 2012-02-11
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.0
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 1.9
    Resolution(Low) 27.16
    Number Reflections(All) 56669
    Number Reflections(Observed) 55929
    Percent Possible(Observed) 98.8
    R Merge I(Observed) 0.057
    B(Isotropic) From Wilson Plot 28.6
    Redundancy 10.9
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 2.0
    Percent Possible(All) 97.5
    R Merge I(Observed) 0.329
    Mean I Over Sigma(Observed) 6.3
    R-Sym I(Observed) 0.312
    Redundancy 9.9
    Number Unique Reflections(All) 7928
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.9
    Resolution(Low) 27.155
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 55831
    Number of Reflections(Observed) 55816
    Number of Reflections(R-Free) 1999
    Percent Reflections(Observed) 98.5
    R-Factor(All) 0.213
    R-Factor(Observed) 0.1934
    R-Work 0.1923
    R-Free 0.2218
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 32.82
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9
    Shell Resolution(Low) 1.9475
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 3652
    R-Factor(R-Work) 0.2321
    R-Factor(R-Free) 0.3005
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9475
    Shell Resolution(Low) 2.0002
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3819
    R-Factor(R-Work) 0.2189
    R-Factor(R-Free) 0.2833
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0002
    Shell Resolution(Low) 2.059
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3816
    R-Factor(R-Work) 0.2059
    R-Factor(R-Free) 0.2611
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.059
    Shell Resolution(Low) 2.1254
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3821
    R-Factor(R-Work) 0.2089
    R-Factor(R-Free) 0.2533
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1254
    Shell Resolution(Low) 2.2014
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3848
    R-Factor(R-Work) 0.1985
    R-Factor(R-Free) 0.2411
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2014
    Shell Resolution(Low) 2.2895
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3805
    R-Factor(R-Work) 0.1972
    R-Factor(R-Free) 0.2349
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2895
    Shell Resolution(Low) 2.3936
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3854
    R-Factor(R-Work) 0.2024
    R-Factor(R-Free) 0.2561
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3936
    Shell Resolution(Low) 2.5197
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3839
    R-Factor(R-Work) 0.2003
    R-Factor(R-Free) 0.2438
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5197
    Shell Resolution(Low) 2.6774
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3880
    R-Factor(R-Work) 0.2027
    R-Factor(R-Free) 0.2228
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6774
    Shell Resolution(Low) 2.884
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3737
    R-Factor(R-Work) 0.1988
    R-Factor(R-Free) 0.2156
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.884
    Shell Resolution(Low) 3.1738
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 3881
    R-Factor(R-Work) 0.1997
    R-Factor(R-Free) 0.2619
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1738
    Shell Resolution(Low) 3.6321
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3926
    R-Factor(R-Work) 0.1858
    R-Factor(R-Free) 0.2029
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6321
    Shell Resolution(Low) 4.5725
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3953
    R-Factor(R-Work) 0.1652
    R-Factor(R-Free) 0.1922
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5725
    Shell Resolution(Low) 27.1577
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 3986
    R-Factor(R-Work) 0.1947
    R-Factor(R-Free) 0.1993
    Percent Reflections(Observed) 97.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.073
    f_dihedral_angle_d 12.561
    f_angle_d 1.097
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4695
    Nucleic Acid Atoms 0
    Heterogen Atoms 49
    Solvent Atoms 203
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER
    data collection None