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X-RAY DIFFRACTION
Materials and Methods page
4IVP
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 296.0
    Details 0.9-1.2 M lithium sulfate, 1 mM DTT, 0.1 M HEPES, pH 7.5-8.0, VAPOR DIFFUSION, SITTING DROP, temperature 296K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 114 α = 90
    b = 117.83 β = 90
    c = 108.3 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 2M-F
    Collection Date 2012-02-11
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SLS BEAMLINE X06DA
    Wavelength List 1.0
    Site SLS
    Beamline X06DA
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 2.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.1
    Resolution(Low) 39.87
    Number Reflections(All) 42829
    Number Reflections(Observed) 42825
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.082
    B(Isotropic) From Wilson Plot 30.1
    Redundancy 11.0
     
    High Resolution Shell Details
    Resolution(High) 2.1
    Resolution(Low) 2.21
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.319
    Mean I Over Sigma(Observed) 0.075
    R-Sym I(Observed) 0.305
    Redundancy 0.117
    Number Unique Reflections(All) 6186
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.1
    Resolution(Low) 39.868
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 42778
    Number of Reflections(Observed) 42769
    Number of Reflections(R-Free) 2000
    Percent Reflections(Observed) 99.86
    R-Factor(All) 0.207
    R-Factor(Observed) 0.1796
    R-Work 0.1779
    R-Free 0.2138
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 33.04
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1
    Shell Resolution(Low) 2.1525
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2881
    R-Factor(R-Work) 0.1865
    R-Factor(R-Free) 0.2534
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1525
    Shell Resolution(Low) 2.2107
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2868
    R-Factor(R-Work) 0.1801
    R-Factor(R-Free) 0.2164
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2107
    Shell Resolution(Low) 2.2758
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2881
    R-Factor(R-Work) 0.1784
    R-Factor(R-Free) 0.2507
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2758
    Shell Resolution(Low) 2.3492
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2880
    R-Factor(R-Work) 0.1767
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3492
    Shell Resolution(Low) 2.4332
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2867
    R-Factor(R-Work) 0.1762
    R-Factor(R-Free) 0.2582
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4332
    Shell Resolution(Low) 2.5306
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2898
    R-Factor(R-Work) 0.1846
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5306
    Shell Resolution(Low) 2.6457
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2896
    R-Factor(R-Work) 0.1918
    R-Factor(R-Free) 0.234
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6457
    Shell Resolution(Low) 2.7852
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2888
    R-Factor(R-Work) 0.1894
    R-Factor(R-Free) 0.2388
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7852
    Shell Resolution(Low) 2.9596
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2911
    R-Factor(R-Work) 0.1982
    R-Factor(R-Free) 0.2404
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9596
    Shell Resolution(Low) 3.188
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2902
    R-Factor(R-Work) 0.1959
    R-Factor(R-Free) 0.2452
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.188
    Shell Resolution(Low) 3.5087
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2926
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2076
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5087
    Shell Resolution(Low) 4.016
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2941
    R-Factor(R-Work) 0.1598
    R-Factor(R-Free) 0.2123
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.016
    Shell Resolution(Low) 5.0581
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2959
    R-Factor(R-Work) 0.1479
    R-Factor(R-Free) 0.1605
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0581
    Shell Resolution(Low) 39.8748
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 3071
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.1999
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.075
    f_dihedral_angle_d 13.376
    f_angle_d 1.091
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4726
    Nucleic Acid Atoms 0
    Heterogen Atoms 50
    Solvent Atoms 218
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building PHASER