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X-RAY DIFFRACTION
Materials and Methods page
4IV4
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 15% PEG 3350, 0.05M magnesium chloride, 0.067M sodium chloride, 0.1M Tris, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.36 α = 90
    b = 80.51 β = 109.84
    c = 58.19 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2011-12-14
     
    Diffraction Radiation
    Monochromator Side scattering bent cube I-beam single crystal, asymmetric cut 4.965 degs
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 1.0
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 21076
    Number Reflections(Observed) 21076
    Percent Possible(Observed) 99.06
    B(Isotropic) From Wilson Plot 31.42
    Redundancy 9.9
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.34
    Percent Possible(All) 95.2
    Mean I Over Sigma(Observed) 2.83
    R-Sym I(Observed) 0.751
    Redundancy 10.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 39.904
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 19766
    Number of Reflections(Observed) 19766
    Number of Reflections(R-Free) 1872
    Percent Reflections(Observed) 92.9
    R-Factor(All) 0.1967
    R-Factor(Observed) 0.1967
    R-Work 0.1925
    R-Free 0.2369
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.3571
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 5.1784
    Anisotropic B[2][2] 6.5742
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -3.2171
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.354
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 1213
    R-Factor(R-Work) 0.225
    R-Factor(R-Free) 0.265
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.354
    Shell Resolution(Low) 2.4233
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1323
    R-Factor(R-Work) 0.228
    R-Factor(R-Free) 0.308
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4233
    Shell Resolution(Low) 2.5015
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 1306
    R-Factor(R-Work) 0.2336
    R-Factor(R-Free) 0.3239
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5015
    Shell Resolution(Low) 2.5909
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1309
    R-Factor(R-Work) 0.2239
    R-Factor(R-Free) 0.3048
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5909
    Shell Resolution(Low) 2.6946
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1342
    R-Factor(R-Work) 0.2144
    R-Factor(R-Free) 0.2831
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6946
    Shell Resolution(Low) 2.8172
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 1302
    R-Factor(R-Work) 0.2185
    R-Factor(R-Free) 0.3047
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8172
    Shell Resolution(Low) 2.9657
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 1377
    R-Factor(R-Work) 0.2049
    R-Factor(R-Free) 0.2437
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9657
    Shell Resolution(Low) 3.1514
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1432
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2485
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1514
    Shell Resolution(Low) 3.3946
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1443
    R-Factor(R-Work) 0.1908
    R-Factor(R-Free) 0.2333
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3946
    Shell Resolution(Low) 3.736
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 1408
    R-Factor(R-Work) 0.1792
    R-Factor(R-Free) 0.2139
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.736
    Shell Resolution(Low) 4.2761
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 1450
    R-Factor(R-Work) 0.157
    R-Factor(R-Free) 0.1942
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2761
    Shell Resolution(Low) 5.3853
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 1478
    R-Factor(R-Work) 0.1592
    R-Factor(R-Free) 0.1832
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3853
    Shell Resolution(Low) 39.904
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 1511
    R-Factor(R-Work) 0.2094
    R-Factor(R-Free) 0.2483
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.036
    f_dihedral_angle_d 13.896
    f_angle_d 0.506
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3762
    Nucleic Acid Atoms 0
    Heterogen Atoms 50
    Solvent Atoms 112
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blue ice
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.automr)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.automr)
    data collection Blue version: ice