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X-RAY DIFFRACTION
Materials and Methods page
4IV2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 15% PEG 3350, 0.05M magnesium chloride, 0.067M sodium chloride, 0.1M Tris, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.24 α = 90
    b = 80.81 β = 109.81
    c = 57.9 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2011-12-14
     
    Diffraction Radiation
    Monochromator Side scattering bent cube I-beam single crystal, asymmetric cut 4.965 degs
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 1.0
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.9
    Resolution(Low) 50
    Number Reflections(All) 25549
    Number Reflections(Observed) 25549
    Percent Possible(Observed) 98.21
    B(Isotropic) From Wilson Plot 31.67
    Redundancy 3.4
     
    High Resolution Shell Details
    Resolution(High) 1.9
    Resolution(Low) 1.93
    Percent Possible(All) 95.12
    Mean I Over Sigma(Observed) 2.06
    R-Sym I(Observed) 0.0
    Redundancy 3.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.14
    Resolution(Low) 39.829
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 24264
    Number of Reflections(Observed) 24264
    Number of Reflections(R-Free) 1319
    Percent Reflections(Observed) 93.27
    R-Factor(All) 0.1801
    R-Factor(Observed) 0.1801
    R-Work 0.1775
    R-Free 0.2256
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -2.1215
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.0025
    Anisotropic B[2][2] 3.8134
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.6919
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.14
    Shell Resolution(Low) 2.2257
    Number of Reflections(R-Free) 117
    Number of Reflections(R-Work) 2246
    R-Factor(R-Work) 0.2312
    R-Factor(R-Free) 0.2762
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2257
    Shell Resolution(Low) 2.327
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2404
    R-Factor(R-Work) 0.1997
    R-Factor(R-Free) 0.2829
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.327
    Shell Resolution(Low) 2.4496
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2487
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2045
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4496
    Shell Resolution(Low) 2.6031
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.1915
    R-Factor(R-Free) 0.2666
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6031
    Shell Resolution(Low) 2.804
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2496
    R-Factor(R-Work) 0.2018
    R-Factor(R-Free) 0.2603
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.804
    Shell Resolution(Low) 3.0861
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.1958
    R-Factor(R-Free) 0.2464
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0861
    Shell Resolution(Low) 3.5324
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.1786
    R-Factor(R-Free) 0.2327
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5324
    Shell Resolution(Low) 4.4495
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2675
    R-Factor(R-Work) 0.1469
    R-Factor(R-Free) 0.1871
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4495
    Shell Resolution(Low) 39.829
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2750
    R-Factor(R-Work) 0.1701
    R-Factor(R-Free) 0.2078
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.051
    f_dihedral_angle_d 14.465
    f_angle_d 0.728
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3841
    Nucleic Acid Atoms 0
    Heterogen Atoms 50
    Solvent Atoms 161
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blue ice
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.automr)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.automr)
    data collection Blue version: ice