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X-RAY DIFFRACTION
Materials and Methods page
4IUM
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 6.2
    Temperature 293.0
    Details 100 mM MES, pH 6.2, 18% PEG20000, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 38.32 α = 90
    b = 62.04 β = 90
    c = 84.22 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type RAYONIX MX-300
    Details Vertical Focusing Mirror: ultra-low expansion (ULE) titanium silicate flat mirror with Pt, uncoated, and Pd strips
    Collection Date 2011-06-29
     
    Diffraction Radiation
    Monochromator double crystal Si(111)
    Diffraction Protocol MAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type CLSI BEAMLINE 08ID-1
    Wavelength List 1.28243, 1.28289, 1.27347
    Site CLSI
    Beamline 08ID-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 2.5
    Resolution(High) 1.45
    Resolution(Low) 31.11
    Number Reflections(All) 36356
    Number Reflections(Observed) 36344
    Percent Possible(Observed) 99.4
    R Merge I(Observed) 0.049
    Redundancy 8.7
     
    High Resolution Shell Details
    Resolution(High) 1.45
    Resolution(Low) 1.53
    Percent Possible(All) 96.2
    R Merge I(Observed) 0.205
    Mean I Over Sigma(Observed) 7.1
    Redundancy 6.9
    Number Unique Reflections(All) 5029
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MAD
    reflnsShellList 1.45
    Resolution(Low) 31.02
    Cut-off Sigma(F) 1.05
    Number of Reflections(all) 36344
    Number of Reflections(Observed) 36216
    Number of Reflections(R-Free) 1994
    Percent Reflections(Observed) 99.55
    R-Factor(Observed) 0.1612
    R-Work 0.1602
    R-Free 0.1781
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -3.6234
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 5.8156
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.1922
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.45
    Shell Resolution(Low) 1.4863
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2289
    R-Factor(R-Work) 0.2763
    R-Factor(R-Free) 0.3167
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4863
    Shell Resolution(Low) 1.5264
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2391
    R-Factor(R-Work) 0.2196
    R-Factor(R-Free) 0.247
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5264
    Shell Resolution(Low) 1.5714
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2400
    R-Factor(R-Work) 0.1867
    R-Factor(R-Free) 0.2044
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5714
    Shell Resolution(Low) 1.6221
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2438
    R-Factor(R-Work) 0.1664
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6221
    Shell Resolution(Low) 1.68
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2422
    R-Factor(R-Work) 0.1613
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.68
    Shell Resolution(Low) 1.7473
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2451
    R-Factor(R-Work) 0.1555
    R-Factor(R-Free) 0.1833
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7473
    Shell Resolution(Low) 1.8268
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2431
    R-Factor(R-Work) 0.1534
    R-Factor(R-Free) 0.1892
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8268
    Shell Resolution(Low) 1.9231
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2426
    R-Factor(R-Work) 0.1522
    R-Factor(R-Free) 0.1676
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9231
    Shell Resolution(Low) 2.0436
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2427
    R-Factor(R-Work) 0.1516
    R-Factor(R-Free) 0.1612
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0436
    Shell Resolution(Low) 2.2013
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2451
    R-Factor(R-Work) 0.1443
    R-Factor(R-Free) 0.1878
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2013
    Shell Resolution(Low) 2.4228
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2480
    R-Factor(R-Work) 0.1485
    R-Factor(R-Free) 0.1477
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4228
    Shell Resolution(Low) 2.7732
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2471
    R-Factor(R-Work) 0.1476
    R-Factor(R-Free) 0.1604
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7732
    Shell Resolution(Low) 3.4932
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 2520
    R-Factor(R-Work) 0.1552
    R-Factor(R-Free) 0.1635
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4932
    Shell Resolution(Low) 31.0271
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2625
    R-Factor(R-Work) 0.1667
    R-Factor(R-Free) 0.1825
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.009
    f_chiral_restr 0.077
    f_dihedral_angle_d 11.682
    f_angle_d 1.413
    f_bond_d 0.012
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1531
    Nucleic Acid Atoms 0
    Heterogen Atoms 13
    Solvent Atoms 260
     
     
  •   Software and Computing Hide
    Computing
    Data Collection MxDC
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHENIX (phenix.autosol: 1.7.1_743))
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.autosol: 1.7.1_743))
    data collection MxDC