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X-RAY DIFFRACTION
Materials and Methods page
4IUI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 15% PEG 3350, 0.05M magnesium chloride, 0.067M sodium chloride, 0.1M Tris, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.7 α = 90
    b = 81.3 β = 110.07
    c = 58.28 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2012-07-27
     
    Diffraction Radiation
    Monochromator Side scattering bent cube I-beam single crystal, asymmetric cut 4.965 degs
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 1.0
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.3
    Resolution(Low) 50
    Number Reflections(All) 20145
    Number Reflections(Observed) 20145
    Percent Possible(Observed) 93.33
    B(Isotropic) From Wilson Plot 40.05
    Redundancy 6.6
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.34
    Percent Possible(All) 95.66
    Mean I Over Sigma(Observed) 2.13
    R-Sym I(Observed) 0.715
    Redundancy 6.8
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 46.198
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 18852
    Number of Reflections(Observed) 18852
    Number of Reflections(R-Free) 1852
    Percent Reflections(Observed) 87.34
    R-Factor(All) 0.2698
    R-Factor(Observed) 0.2698
    R-Work 0.265
    R-Free 0.3121
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.6601
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 6.0033
    Anisotropic B[2][2] 12.5216
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -11.8615
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.3559
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 1203
    R-Factor(R-Work) 0.3256
    R-Factor(R-Free) 0.4225
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3559
    Shell Resolution(Low) 2.4253
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 1313
    R-Factor(R-Work) 0.2961
    R-Factor(R-Free) 0.3896
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4253
    Shell Resolution(Low) 2.5035
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 1315
    R-Factor(R-Work) 0.2882
    R-Factor(R-Free) 0.3398
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5035
    Shell Resolution(Low) 2.593
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1345
    R-Factor(R-Work) 0.2654
    R-Factor(R-Free) 0.3306
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.593
    Shell Resolution(Low) 2.6968
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1324
    R-Factor(R-Work) 0.2761
    R-Factor(R-Free) 0.3578
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6968
    Shell Resolution(Low) 2.8195
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 1309
    R-Factor(R-Work) 0.2757
    R-Factor(R-Free) 0.3332
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8195
    Shell Resolution(Low) 2.9682
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1391
    R-Factor(R-Work) 0.2607
    R-Factor(R-Free) 0.3433
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9682
    Shell Resolution(Low) 3.1541
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1439
    R-Factor(R-Work) 0.2597
    R-Factor(R-Free) 0.3393
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1541
    Shell Resolution(Low) 3.3975
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 1399
    R-Factor(R-Work) 0.2541
    R-Factor(R-Free) 0.2852
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3975
    Shell Resolution(Low) 3.7393
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1214
    R-Factor(R-Work) 0.2547
    R-Factor(R-Free) 0.3293
    Percent Reflections(Observed) 82.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7393
    Shell Resolution(Low) 4.2801
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 1089
    R-Factor(R-Work) 0.2565
    R-Factor(R-Free) 0.3144
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2801
    Shell Resolution(Low) 5.3911
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1261
    R-Factor(R-Work) 0.2449
    R-Factor(R-Free) 0.2814
    Percent Reflections(Observed) 83.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.3911
    Shell Resolution(Low) 46.198
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 1398
    R-Factor(R-Work) 0.2735
    R-Factor(R-Free) 0.2742
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.041
    f_dihedral_angle_d 15.537
    f_angle_d 0.565
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3475
    Nucleic Acid Atoms 0
    Heterogen Atoms 50
    Solvent Atoms 74
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blue ice
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.automr)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.automr)
    data collection Blue version: ice