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X-RAY DIFFRACTION
Materials and Methods page
4IUA
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7
    Temperature 298.0
    Details 200 mM ammonium sulfate, 18% PEG 4000, 200 mM HEPES pH 7.0, 5% 2-METHYL-2,4-PENTANEDIOL, 0.5 mM beta-octyl glucoside, VAPOR DIFFUSION, HANGING DROP, temperature 298K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 92.62 α = 90
    b = 127.33 β = 90.25
    c = 129.6 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 300 mm CCD
    Collection Date 2012-03-16
     
    Diffraction Radiation
    Monochromator SI(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 21-ID-D
    Wavelength List 1.1271
    Site APS
    Beamline 21-ID-D
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 3.05
    Resolution(Low) 30
    Number Reflections(All) 57781
    Number Reflections(Observed) 57775
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.131
    Redundancy 5.8
     
    High Resolution Shell Details
    Resolution(High) 3.05
    Resolution(Low) 3.16
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.706
    Mean I Over Sigma(Observed) 2.2
    Redundancy 5.9
    Number Unique Reflections(All) 5717
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 3.05
    Resolution(Low) 29.775
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 57781
    Number of Reflections(Observed) 57732
    Number of Reflections(R-Free) 5877
    Percent Reflections(Observed) 99.5
    R-Factor(Observed) 0.1829
    R-Work 0.1758
    R-Free 0.2452
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.05
    Shell Resolution(Low) 3.0725
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 1497
    R-Factor(R-Work) 0.2846
    R-Factor(R-Free) 0.3477
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0725
    Shell Resolution(Low) 3.1086
    Number of Reflections(R-Free) 215
    Number of Reflections(R-Work) 1665
    R-Factor(R-Work) 0.2664
    R-Factor(R-Free) 0.3484
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1086
    Shell Resolution(Low) 3.1465
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 1759
    R-Factor(R-Work) 0.2671
    R-Factor(R-Free) 0.3462
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1465
    Shell Resolution(Low) 3.1863
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 1745
    R-Factor(R-Work) 0.2629
    R-Factor(R-Free) 0.3585
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1863
    Shell Resolution(Low) 3.2281
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 1684
    R-Factor(R-Work) 0.2586
    R-Factor(R-Free) 0.3222
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2281
    Shell Resolution(Low) 3.2723
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 1727
    R-Factor(R-Work) 0.2578
    R-Factor(R-Free) 0.3462
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2723
    Shell Resolution(Low) 3.319
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 1754
    R-Factor(R-Work) 0.2561
    R-Factor(R-Free) 0.3628
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.319
    Shell Resolution(Low) 3.3685
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 1729
    R-Factor(R-Work) 0.2574
    R-Factor(R-Free) 0.3346
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3685
    Shell Resolution(Low) 3.421
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 1734
    R-Factor(R-Work) 0.2242
    R-Factor(R-Free) 0.3257
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.421
    Shell Resolution(Low) 3.477
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 1715
    R-Factor(R-Work) 0.213
    R-Factor(R-Free) 0.2812
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.477
    Shell Resolution(Low) 3.5369
    Number of Reflections(R-Free) 196
    Number of Reflections(R-Work) 1737
    R-Factor(R-Work) 0.2019
    R-Factor(R-Free) 0.2656
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5369
    Shell Resolution(Low) 3.6011
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 1738
    R-Factor(R-Work) 0.1912
    R-Factor(R-Free) 0.2778
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6011
    Shell Resolution(Low) 3.6702
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 1714
    R-Factor(R-Work) 0.1831
    R-Factor(R-Free) 0.2781
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.6702
    Shell Resolution(Low) 3.745
    Number of Reflections(R-Free) 231
    Number of Reflections(R-Work) 1717
    R-Factor(R-Work) 0.1698
    R-Factor(R-Free) 0.2391
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.745
    Shell Resolution(Low) 3.8263
    Number of Reflections(R-Free) 206
    Number of Reflections(R-Work) 1731
    R-Factor(R-Work) 0.1638
    R-Factor(R-Free) 0.2304
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8263
    Shell Resolution(Low) 3.9151
    Number of Reflections(R-Free) 186
    Number of Reflections(R-Work) 1739
    R-Factor(R-Work) 0.1576
    R-Factor(R-Free) 0.24
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9151
    Shell Resolution(Low) 4.0128
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 1731
    R-Factor(R-Work) 0.153
    R-Factor(R-Free) 0.2324
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0128
    Shell Resolution(Low) 4.121
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 1727
    R-Factor(R-Work) 0.162
    R-Factor(R-Free) 0.2328
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.121
    Shell Resolution(Low) 4.242
    Number of Reflections(R-Free) 187
    Number of Reflections(R-Work) 1759
    R-Factor(R-Work) 0.1633
    R-Factor(R-Free) 0.2426
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.242
    Shell Resolution(Low) 4.3785
    Number of Reflections(R-Free) 184
    Number of Reflections(R-Work) 1728
    R-Factor(R-Work) 0.1545
    R-Factor(R-Free) 0.2406
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3785
    Shell Resolution(Low) 4.5344
    Number of Reflections(R-Free) 185
    Number of Reflections(R-Work) 1775
    R-Factor(R-Work) 0.1528
    R-Factor(R-Free) 0.2104
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.5344
    Shell Resolution(Low) 4.7153
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 1706
    R-Factor(R-Work) 0.1446
    R-Factor(R-Free) 0.1821
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7153
    Shell Resolution(Low) 4.929
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 1761
    R-Factor(R-Work) 0.143
    R-Factor(R-Free) 0.2071
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.929
    Shell Resolution(Low) 5.1876
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 1740
    R-Factor(R-Work) 0.1454
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1876
    Shell Resolution(Low) 5.5107
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 1761
    R-Factor(R-Work) 0.1425
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.5107
    Shell Resolution(Low) 5.9331
    Number of Reflections(R-Free) 197
    Number of Reflections(R-Work) 1722
    R-Factor(R-Work) 0.1399
    R-Factor(R-Free) 0.1967
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.9331
    Shell Resolution(Low) 6.5245
    Number of Reflections(R-Free) 176
    Number of Reflections(R-Work) 1776
    R-Factor(R-Work) 0.1565
    R-Factor(R-Free) 0.2224
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.5245
    Shell Resolution(Low) 7.4556
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 1729
    R-Factor(R-Work) 0.1624
    R-Factor(R-Free) 0.2648
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 7.4556
    Shell Resolution(Low) 9.3448
    Number of Reflections(R-Free) 198
    Number of Reflections(R-Work) 1783
    R-Factor(R-Work) 0.157
    R-Factor(R-Free) 0.2121
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 9.3448
    Shell Resolution(Low) 29.7763
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 1772
    R-Factor(R-Work) 0.19
    R-Factor(R-Free) 0.2246
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.086
    f_dihedral_angle_d 17.128
    f_angle_d 1.266
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 16403
    Nucleic Acid Atoms 0
    Heterogen Atoms 225
    Solvent Atoms 0
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution CNS/PHENIX
    Structure Refinement PHENIX (phenix.refine: 1.8_1069)
     
    Software
    refinement CNS version: 1.2/PHENIX (phenix.refine: 1.8_1069)
    model building CNS/PHENIX
    data collection HKL-2000