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X-RAY DIFFRACTION
Materials and Methods page
4IU7
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.3
    Temperature 294.0
    Details 15% PEG 3350, 0.05M magnesium chloride, 0.067M sodium chloride, 0.1M Tris, pH 8.3, VAPOR DIFFUSION, HANGING DROP, temperature 294K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 54.61 α = 90
    b = 81.4 β = 109.94
    c = 58.41 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector PIXEL
    Type DECTRIS PILATUS 6M
    Collection Date 2011-12-14
     
    Diffraction Radiation
    Monochromator Side scattering bent cube I-beam single crystal, asymmetric cut 4.965 degs
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL11-1
    Wavelength List 0.9
    Site SSRL
    Beamline BL11-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 1.98
    Resolution(Low) 50
    Number Reflections(All) 21406
    Number Reflections(Observed) 21406
    Percent Possible(Observed) 98.55
    B(Isotropic) From Wilson Plot 28.4
    Redundancy 3.3
     
    High Resolution Shell Details
    Resolution(High) 1.98
    Resolution(Low) 2.01
    Percent Possible(All) 98.85
    R-Sym I(Observed) 0.0
    Redundancy 3.0
    Number Unique Reflections(All) 21406
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.29
    Resolution(Low) 40.159
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 20231
    Number of Reflections(Observed) 20231
    Number of Reflections(R-Free) 1199
    Percent Reflections(Observed) 93.14
    R-Factor(All) 0.1964
    R-Factor(Observed) 0.1964
    R-Work 0.1939
    R-Free 0.2367
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -1.352
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 3.0447
    Anisotropic B[2][2] 3.0794
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -1.7274
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.29
    Shell Resolution(Low) 2.3818
    Number of Reflections(R-Free) 119
    Number of Reflections(R-Work) 1965
    R-Factor(R-Work) 0.2365
    R-Factor(R-Free) 0.3152
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3818
    Shell Resolution(Low) 2.4902
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 1993
    R-Factor(R-Work) 0.2324
    R-Factor(R-Free) 0.2729
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4902
    Shell Resolution(Low) 2.6215
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2049
    R-Factor(R-Work) 0.2289
    R-Factor(R-Free) 0.315
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6215
    Shell Resolution(Low) 2.7857
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2060
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2758
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7857
    Shell Resolution(Low) 3.0007
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2103
    R-Factor(R-Work) 0.211
    R-Factor(R-Free) 0.2542
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0007
    Shell Resolution(Low) 3.3025
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2174
    R-Factor(R-Work) 0.2006
    R-Factor(R-Free) 0.2441
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3025
    Shell Resolution(Low) 3.7801
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2194
    R-Factor(R-Work) 0.1824
    R-Factor(R-Free) 0.2158
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7801
    Shell Resolution(Low) 4.7613
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2216
    R-Factor(R-Work) 0.1509
    R-Factor(R-Free) 0.1876
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.7613
    Shell Resolution(Low) 40.159
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2278
    R-Factor(R-Work) 0.1953
    R-Factor(R-Free) 0.2222
    Percent Reflections(Observed) 98.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.001
    f_chiral_restr 0.033
    f_dihedral_angle_d 12.762
    f_angle_d 0.452
    f_bond_d 0.002
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3908
    Nucleic Acid Atoms 0
    Heterogen Atoms 46
    Solvent Atoms 184
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blu Ice
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution PHENIX (phenix.automr)
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building PHENIX version: (phenix.automr)
    data collection Blu version: Ice