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X-RAY DIFFRACTION
Materials and Methods page
4IU3
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 0.1 M Tris pH 8.5, ammonium sulfate 1.8 M, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.53 α = 90
    b = 78.53 β = 90
    c = 202.82 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2011-04-13
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM14
    Wavelength List 0.97833
    Site ESRF
    Beamline BM14
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.97
    Resolution(Low) 20
    Number Reflections(Observed) 46047
    Percent Possible(Observed) 98.5
    R Merge I(Observed) 0.107
    Redundancy 6.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method FOURIER SYNTHESIS
    reflnsShellList 1.97
    Resolution(Low) 19.637
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 45948
    Number of Reflections(Observed) 45243
    Number of Reflections(R-Free) 2103
    Percent Reflections(Observed) 98.8
    R-Factor(All) 0.172
    R-Factor(Observed) 0.172
    R-Work 0.1701
    R-Free 0.2063
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.97
    Shell Resolution(Low) 1.991
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2653
    R-Factor(R-Work) 0.2835
    R-Factor(R-Free) 0.3193
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.991
    Shell Resolution(Low) 2.0144
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2628
    R-Factor(R-Free) 0.2693
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0144
    Shell Resolution(Low) 2.0389
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2595
    R-Factor(R-Work) 0.2609
    R-Factor(R-Free) 0.3412
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0389
    Shell Resolution(Low) 2.0647
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.2667
    R-Factor(R-Free) 0.3244
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0647
    Shell Resolution(Low) 2.0918
    Number of Reflections(R-Free) 112
    Number of Reflections(R-Work) 2623
    R-Factor(R-Work) 0.2478
    R-Factor(R-Free) 0.2634
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0918
    Shell Resolution(Low) 2.1205
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2720
    R-Factor(R-Work) 0.2277
    R-Factor(R-Free) 0.26
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1205
    Shell Resolution(Low) 2.1507
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2659
    R-Factor(R-Work) 0.2216
    R-Factor(R-Free) 0.2694
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1507
    Shell Resolution(Low) 2.1828
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.2114
    R-Factor(R-Free) 0.2263
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1828
    Shell Resolution(Low) 2.2168
    Number of Reflections(R-Free) 171
    Number of Reflections(R-Work) 2628
    R-Factor(R-Work) 0.207
    R-Factor(R-Free) 0.2593
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2168
    Shell Resolution(Low) 2.2531
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2047
    R-Factor(R-Free) 0.2816
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2531
    Shell Resolution(Low) 2.2919
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2664
    R-Factor(R-Work) 0.1954
    R-Factor(R-Free) 0.2091
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2919
    Shell Resolution(Low) 2.3335
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.196
    R-Factor(R-Free) 0.2503
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3335
    Shell Resolution(Low) 2.3783
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2689
    R-Factor(R-Work) 0.1873
    R-Factor(R-Free) 0.2629
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3783
    Shell Resolution(Low) 2.4268
    Number of Reflections(R-Free) 125
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.1882
    R-Factor(R-Free) 0.258
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4268
    Shell Resolution(Low) 2.4795
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1782
    R-Factor(R-Free) 0.2248
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4795
    Shell Resolution(Low) 2.537
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2739
    R-Factor(R-Work) 0.1826
    R-Factor(R-Free) 0.2386
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.537
    Shell Resolution(Low) 2.6003
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.188
    R-Factor(R-Free) 0.2223
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6003
    Shell Resolution(Low) 2.6705
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2683
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2544
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6705
    Shell Resolution(Low) 2.7489
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2674
    R-Factor(R-Work) 0.1722
    R-Factor(R-Free) 0.2011
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7489
    Shell Resolution(Low) 2.8373
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.1715
    R-Factor(R-Free) 0.2293
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8373
    Shell Resolution(Low) 2.9384
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2701
    R-Factor(R-Work) 0.1627
    R-Factor(R-Free) 0.1886
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9384
    Shell Resolution(Low) 3.0557
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.1728
    R-Factor(R-Free) 0.2181
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0557
    Shell Resolution(Low) 3.1942
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.1597
    R-Factor(R-Free) 0.1952
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1942
    Shell Resolution(Low) 3.3618
    Number of Reflections(R-Free) 122
    Number of Reflections(R-Work) 2694
    R-Factor(R-Work) 0.1601
    R-Factor(R-Free) 0.1882
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3618
    Shell Resolution(Low) 3.5712
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 2728
    R-Factor(R-Work) 0.1455
    R-Factor(R-Free) 0.1827
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5712
    Shell Resolution(Low) 3.8451
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 2670
    R-Factor(R-Work) 0.1327
    R-Factor(R-Free) 0.1892
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8451
    Shell Resolution(Low) 4.2285
    Number of Reflections(R-Free) 134
    Number of Reflections(R-Work) 2700
    R-Factor(R-Work) 0.1244
    R-Factor(R-Free) 0.1511
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2285
    Shell Resolution(Low) 4.8324
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.12
    R-Factor(R-Free) 0.1443
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8324
    Shell Resolution(Low) 6.0585
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2718
    R-Factor(R-Work) 0.1463
    R-Factor(R-Free) 0.1568
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0585
    Shell Resolution(Low) 19.6384
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1677
    R-Factor(R-Free) 0.1702
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.071
    f_dihedral_angle_d 12.853
    f_angle_d 1.023
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3374
    Nucleic Acid Atoms 0
    Heterogen Atoms 28
    Solvent Atoms 568
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution SHELXS
    Structure Refinement PHENIX (phenix.refine: dev_1269)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1269)
    model building SHELXS
    data collection HKL-2000