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X-RAY DIFFRACTION
Materials and Methods page
4IU2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 8.5
    Temperature 293.0
    Details 0.1 M Tris pH 8.5, ammonium sulfate 1.8 M, VAPOR DIFFUSION, HANGING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 78.71 α = 90
    b = 78.71 β = 90
    c = 203.24 γ = 90
     
    Space Group
    Space Group Name:    P 43 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2011-04-13
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE BM14
    Wavelength List 0.97841
    Site ESRF
    Beamline BM14
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2
    Resolution(Low) 20.03
    Number Reflections(Observed) 44177
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.137
    Redundancy 11.0
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.001
    Resolution(Low) 20.03
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 76982
    Number of Reflections(Observed) 44058
    Number of Reflections(R-Free) 2085
    Percent Reflections(Observed) 93.56
    R-Factor(All) 0.1552
    R-Factor(Observed) 0.1552
    R-Work 0.153
    R-Free 0.1956
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0014
    Shell Resolution(Low) 2.0258
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2434
    R-Factor(R-Work) 0.2305
    R-Factor(R-Free) 0.2615
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0258
    Shell Resolution(Low) 2.0515
    Number of Reflections(R-Free) 158
    Number of Reflections(R-Work) 2292
    R-Factor(R-Work) 0.2239
    R-Factor(R-Free) 0.2805
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0515
    Shell Resolution(Low) 2.0785
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2431
    R-Factor(R-Work) 0.2121
    R-Factor(R-Free) 0.232
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0785
    Shell Resolution(Low) 2.1069
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2414
    R-Factor(R-Work) 0.2041
    R-Factor(R-Free) 0.2464
    Percent Reflections(Observed) 88.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1069
    Shell Resolution(Low) 2.137
    Number of Reflections(R-Free) 108
    Number of Reflections(R-Work) 2552
    R-Factor(R-Work) 0.2005
    R-Factor(R-Free) 0.2217
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.137
    Shell Resolution(Low) 2.1689
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2395
    R-Factor(R-Work) 0.1905
    R-Factor(R-Free) 0.2438
    Percent Reflections(Observed) 87.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1689
    Shell Resolution(Low) 2.2028
    Number of Reflections(R-Free) 118
    Number of Reflections(R-Work) 2513
    R-Factor(R-Work) 0.1801
    R-Factor(R-Free) 0.2554
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2028
    Shell Resolution(Low) 2.2389
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2521
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2446
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2389
    Shell Resolution(Low) 2.2775
    Number of Reflections(R-Free) 153
    Number of Reflections(R-Work) 2567
    R-Factor(R-Work) 0.1722
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2775
    Shell Resolution(Low) 2.3189
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2571
    R-Factor(R-Work) 0.1675
    R-Factor(R-Free) 0.1983
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3189
    Shell Resolution(Low) 2.3635
    Number of Reflections(R-Free) 123
    Number of Reflections(R-Work) 2501
    R-Factor(R-Work) 0.1676
    R-Factor(R-Free) 0.2186
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3635
    Shell Resolution(Low) 2.4117
    Number of Reflections(R-Free) 100
    Number of Reflections(R-Work) 2598
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.2401
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4117
    Shell Resolution(Low) 2.4641
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2553
    R-Factor(R-Work) 0.1634
    R-Factor(R-Free) 0.2092
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4641
    Shell Resolution(Low) 2.5214
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2580
    R-Factor(R-Work) 0.1603
    R-Factor(R-Free) 0.1897
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5214
    Shell Resolution(Low) 2.5844
    Number of Reflections(R-Free) 162
    Number of Reflections(R-Work) 2588
    R-Factor(R-Work) 0.1656
    R-Factor(R-Free) 0.2132
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5844
    Shell Resolution(Low) 2.6542
    Number of Reflections(R-Free) 114
    Number of Reflections(R-Work) 2674
    R-Factor(R-Work) 0.1633
    R-Factor(R-Free) 0.2436
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6542
    Shell Resolution(Low) 2.7323
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2687
    R-Factor(R-Work) 0.1617
    R-Factor(R-Free) 0.21
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7323
    Shell Resolution(Low) 2.8204
    Number of Reflections(R-Free) 155
    Number of Reflections(R-Work) 2638
    R-Factor(R-Work) 0.1649
    R-Factor(R-Free) 0.2151
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8204
    Shell Resolution(Low) 2.9211
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2766
    R-Factor(R-Work) 0.1578
    R-Factor(R-Free) 0.2159
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9211
    Shell Resolution(Low) 3.0379
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.1628
    R-Factor(R-Free) 0.2153
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0379
    Shell Resolution(Low) 3.176
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2728
    R-Factor(R-Work) 0.1489
    R-Factor(R-Free) 0.1791
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.176
    Shell Resolution(Low) 3.3432
    Number of Reflections(R-Free) 150
    Number of Reflections(R-Work) 2727
    R-Factor(R-Work) 0.1488
    R-Factor(R-Free) 0.1857
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3432
    Shell Resolution(Low) 3.5524
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2743
    R-Factor(R-Work) 0.1391
    R-Factor(R-Free) 0.181
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5524
    Shell Resolution(Low) 3.8261
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2802
    R-Factor(R-Work) 0.12
    R-Factor(R-Free) 0.1595
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8261
    Shell Resolution(Low) 4.2101
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2749
    R-Factor(R-Work) 0.1144
    R-Factor(R-Free) 0.16
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2101
    Shell Resolution(Low) 4.8168
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2770
    R-Factor(R-Work) 0.1095
    R-Factor(R-Free) 0.1292
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8168
    Shell Resolution(Low) 6.0595
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2821
    R-Factor(R-Work) 0.1275
    R-Factor(R-Free) 0.1747
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.0595
    Shell Resolution(Low) 28.9388
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2793
    R-Factor(R-Work) 0.155
    R-Factor(R-Free) 0.1829
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.065
    f_dihedral_angle_d 11.896
    f_angle_d 0.945
    f_bond_d 0.009
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3409
    Nucleic Acid Atoms 0
    Heterogen Atoms 31
    Solvent Atoms 618
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-2000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALEPACK
    Structure Solution SHELXS
    Structure Refinement PHENIX (phenix.refine: dev_1269)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1269)
    model building SHELXS
    data collection HKL-2000