X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 277.0
Details 0.35 M Ammonium Acetate, 27 % PEG 3350, 0.1 M Bis-Tris, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 116.05 α = 90
b = 128.39 β = 90
c = 58.39 γ = 90
Symmetry
Space Group P 21 21 2

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 80
Diffraction Detector
Detector Diffraction Type Details Collection Date
AREA DETECTOR RIGAKU RAXIS IV++ mirrors 2013-01-08
Diffraction Radiation
Monochromator Protocol
Ni Filter SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 HF 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.6 35 93.7 0.057 -- -- 10.9 108385 108385 0.0 0.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.6 1.66 63.9 0.374 -- 3.3 7.9 7306

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.6 34.649 -- 1.34 -- 108385 4998 90.6 -- 0.1655 0.164 0.1942 random
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.6 1.618 -- 87 1658 0.2555 0.2857 -- 23.0
X Ray Diffraction 1.618 1.637 -- 103 1932 0.241 0.2704 -- 28.0
X Ray Diffraction 1.637 1.657 -- 142 2239 0.2188 0.2496 -- 32.0
X Ray Diffraction 1.657 1.6779 -- 126 2592 0.204 0.2582 -- 37.0
X Ray Diffraction 1.6779 1.7 -- 160 3031 0.1965 0.2542 -- 43.0
X Ray Diffraction 1.7 1.7233 -- 161 3396 0.1802 0.2358 -- 48.0
X Ray Diffraction 1.7233 1.7479 -- 189 3437 0.1819 0.218 -- 49.0
X Ray Diffraction 1.7479 1.774 -- 192 3495 0.1771 0.2189 -- 49.0
X Ray Diffraction 1.774 1.8017 -- 193 3489 0.1775 0.2096 -- 50.0
X Ray Diffraction 1.8017 1.8313 -- 166 3537 0.1706 0.199 -- 50.0
X Ray Diffraction 1.8313 1.8628 -- 179 3507 0.169 0.2174 -- 50.0
X Ray Diffraction 1.8628 1.8967 -- 167 3540 0.1771 0.2256 -- 50.0
X Ray Diffraction 1.8967 1.9332 -- 169 3522 0.2248 0.2963 -- 50.0
X Ray Diffraction 1.9332 1.9726 -- 178 3555 0.1762 0.2004 -- 50.0
X Ray Diffraction 1.9726 2.0155 -- 188 3516 0.1726 0.2022 -- 50.0
X Ray Diffraction 2.0155 2.0624 -- 199 3773 0.1739 0.2014 -- 54.0
X Ray Diffraction 2.0624 2.114 -- 223 3900 0.1794 0.1889 -- 56.0
X Ray Diffraction 2.114 2.1711 -- 254 4551 0.1569 0.1717 -- 64.0
X Ray Diffraction 2.1711 2.235 -- 255 5045 0.1435 0.1744 -- 72.0
X Ray Diffraction 2.235 2.3071 -- 274 5253 0.1729 0.192 -- 75.0
X Ray Diffraction 2.3071 2.3896 -- 314 6053 0.139 0.1713 -- 86.0
X Ray Diffraction 2.3896 2.4852 -- 327 6350 0.1473 0.2104 -- 90.0
X Ray Diffraction 2.4852 2.5983 -- 331 6555 0.15 0.1995 -- 93.0
X Ray Diffraction 2.5983 2.7352 -- 374 6661 0.1553 0.1855 -- 95.0
X Ray Diffraction 2.7352 2.9065 -- 375 6847 0.1572 0.1987 -- 97.0
X Ray Diffraction 2.9065 3.1308 -- 362 6934 0.1557 0.1851 -- 98.0
X Ray Diffraction 3.1308 3.4456 -- 385 7005 0.1465 0.1668 -- 100.0
X Ray Diffraction 3.4456 3.9436 -- 392 6921 0.1561 0.1824 -- 99.0
X Ray Diffraction 3.9436 4.9662 -- 356 7021 0.1468 0.1848 -- 99.0
X Ray Diffraction 4.9662 34.649 -- 340 7029 0.2206 0.2208 -- 99.0
Temperature Factor Modeling
Temperature Factor Value
Anisotropic B[1][1] 0.2318
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.4345
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -0.6663
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.068
f_dihedral_angle_d 12.506
f_angle_d 1.111
f_bond_d 0.007
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 6977
Nucleic Acid Atoms 0
Heterogen Atoms 220
Solvent Atoms 895

Software

Computing
Computing Package Purpose
HKL-3000 Data Collection
HKL-2000 Data Reduction (intensity integration)
HKL-2000 Data Reduction (data scaling)
Phaser Structure Solution
PHENIX (phenix.refine: 1.7.3_928) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.7.3_928) refinement
Phaser model building
HKL-3000 data collection