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X-RAY DIFFRACTION
Materials and Methods page
4ITU
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 277.0
    Details 0.35 M Ammonium Acetate, 27 % PEG 3350, 0.1 M Bis-Tris, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 116.05 α = 90
    b = 128.39 β = 90
    c = 58.39 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 80
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type RIGAKU RAXIS IV++
    Details mirrors
    Collection Date 2013-01-08
     
    Diffraction Radiation
    Monochromator Ni Filter
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU MICROMAX-007 HF
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.6
    Resolution(Low) 35
    Number Reflections(All) 108385
    Number Reflections(Observed) 108385
    Percent Possible(Observed) 93.7
    R Merge I(Observed) 0.057
    Redundancy 10.9
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.66
    Percent Possible(All) 63.9
    R Merge I(Observed) 0.374
    Mean I Over Sigma(Observed) 3.3
    Redundancy 7.9
    Number Unique Reflections(All) 7306
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.6
    Resolution(Low) 34.649
    Cut-off Sigma(F) 1.34
    Number of Reflections(Observed) 108385
    Number of Reflections(R-Free) 4998
    Percent Reflections(Observed) 90.6
    R-Factor(Observed) 0.1655
    R-Work 0.164
    R-Free 0.1942
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 0.2318
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] 0.4345
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.6663
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6
    Shell Resolution(Low) 1.618
    Number of Reflections(R-Free) 87
    Number of Reflections(R-Work) 1658
    R-Factor(R-Work) 0.2555
    R-Factor(R-Free) 0.2857
    Percent Reflections(Observed) 23.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.618
    Shell Resolution(Low) 1.637
    Number of Reflections(R-Free) 103
    Number of Reflections(R-Work) 1932
    R-Factor(R-Work) 0.241
    R-Factor(R-Free) 0.2704
    Percent Reflections(Observed) 28.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.637
    Shell Resolution(Low) 1.657
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2239
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2496
    Percent Reflections(Observed) 32.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.657
    Shell Resolution(Low) 1.6779
    Number of Reflections(R-Free) 126
    Number of Reflections(R-Work) 2592
    R-Factor(R-Work) 0.204
    R-Factor(R-Free) 0.2582
    Percent Reflections(Observed) 37.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6779
    Shell Resolution(Low) 1.7
    Number of Reflections(R-Free) 160
    Number of Reflections(R-Work) 3031
    R-Factor(R-Work) 0.1965
    R-Factor(R-Free) 0.2542
    Percent Reflections(Observed) 43.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7
    Shell Resolution(Low) 1.7233
    Number of Reflections(R-Free) 161
    Number of Reflections(R-Work) 3396
    R-Factor(R-Work) 0.1802
    R-Factor(R-Free) 0.2358
    Percent Reflections(Observed) 48.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7233
    Shell Resolution(Low) 1.7479
    Number of Reflections(R-Free) 189
    Number of Reflections(R-Work) 3437
    R-Factor(R-Work) 0.1819
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 49.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7479
    Shell Resolution(Low) 1.774
    Number of Reflections(R-Free) 192
    Number of Reflections(R-Work) 3495
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2189
    Percent Reflections(Observed) 49.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.774
    Shell Resolution(Low) 1.8017
    Number of Reflections(R-Free) 193
    Number of Reflections(R-Work) 3489
    R-Factor(R-Work) 0.1775
    R-Factor(R-Free) 0.2096
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8017
    Shell Resolution(Low) 1.8313
    Number of Reflections(R-Free) 166
    Number of Reflections(R-Work) 3537
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.199
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8313
    Shell Resolution(Low) 1.8628
    Number of Reflections(R-Free) 179
    Number of Reflections(R-Work) 3507
    R-Factor(R-Work) 0.169
    R-Factor(R-Free) 0.2174
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8628
    Shell Resolution(Low) 1.8967
    Number of Reflections(R-Free) 167
    Number of Reflections(R-Work) 3540
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2256
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8967
    Shell Resolution(Low) 1.9332
    Number of Reflections(R-Free) 169
    Number of Reflections(R-Work) 3522
    R-Factor(R-Work) 0.2248
    R-Factor(R-Free) 0.2963
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9332
    Shell Resolution(Low) 1.9726
    Number of Reflections(R-Free) 178
    Number of Reflections(R-Work) 3555
    R-Factor(R-Work) 0.1762
    R-Factor(R-Free) 0.2004
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9726
    Shell Resolution(Low) 2.0155
    Number of Reflections(R-Free) 188
    Number of Reflections(R-Work) 3516
    R-Factor(R-Work) 0.1726
    R-Factor(R-Free) 0.2022
    Percent Reflections(Observed) 50.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0155
    Shell Resolution(Low) 2.0624
    Number of Reflections(R-Free) 199
    Number of Reflections(R-Work) 3773
    R-Factor(R-Work) 0.1739
    R-Factor(R-Free) 0.2014
    Percent Reflections(Observed) 54.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0624
    Shell Resolution(Low) 2.114
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 3900
    R-Factor(R-Work) 0.1794
    R-Factor(R-Free) 0.1889
    Percent Reflections(Observed) 56.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.114
    Shell Resolution(Low) 2.1711
    Number of Reflections(R-Free) 254
    Number of Reflections(R-Work) 4551
    R-Factor(R-Work) 0.1569
    R-Factor(R-Free) 0.1717
    Percent Reflections(Observed) 64.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1711
    Shell Resolution(Low) 2.235
    Number of Reflections(R-Free) 255
    Number of Reflections(R-Work) 5045
    R-Factor(R-Work) 0.1435
    R-Factor(R-Free) 0.1744
    Percent Reflections(Observed) 72.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.235
    Shell Resolution(Low) 2.3071
    Number of Reflections(R-Free) 274
    Number of Reflections(R-Work) 5253
    R-Factor(R-Work) 0.1729
    R-Factor(R-Free) 0.192
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3071
    Shell Resolution(Low) 2.3896
    Number of Reflections(R-Free) 314
    Number of Reflections(R-Work) 6053
    R-Factor(R-Work) 0.139
    R-Factor(R-Free) 0.1713
    Percent Reflections(Observed) 86.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3896
    Shell Resolution(Low) 2.4852
    Number of Reflections(R-Free) 327
    Number of Reflections(R-Work) 6350
    R-Factor(R-Work) 0.1473
    R-Factor(R-Free) 0.2104
    Percent Reflections(Observed) 90.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4852
    Shell Resolution(Low) 2.5983
    Number of Reflections(R-Free) 331
    Number of Reflections(R-Work) 6555
    R-Factor(R-Work) 0.15
    R-Factor(R-Free) 0.1995
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5983
    Shell Resolution(Low) 2.7352
    Number of Reflections(R-Free) 374
    Number of Reflections(R-Work) 6661
    R-Factor(R-Work) 0.1553
    R-Factor(R-Free) 0.1855
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7352
    Shell Resolution(Low) 2.9065
    Number of Reflections(R-Free) 375
    Number of Reflections(R-Work) 6847
    R-Factor(R-Work) 0.1572
    R-Factor(R-Free) 0.1987
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9065
    Shell Resolution(Low) 3.1308
    Number of Reflections(R-Free) 362
    Number of Reflections(R-Work) 6934
    R-Factor(R-Work) 0.1557
    R-Factor(R-Free) 0.1851
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1308
    Shell Resolution(Low) 3.4456
    Number of Reflections(R-Free) 385
    Number of Reflections(R-Work) 7005
    R-Factor(R-Work) 0.1465
    R-Factor(R-Free) 0.1668
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4456
    Shell Resolution(Low) 3.9436
    Number of Reflections(R-Free) 392
    Number of Reflections(R-Work) 6921
    R-Factor(R-Work) 0.1561
    R-Factor(R-Free) 0.1824
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9436
    Shell Resolution(Low) 4.9662
    Number of Reflections(R-Free) 356
    Number of Reflections(R-Work) 7021
    R-Factor(R-Work) 0.1468
    R-Factor(R-Free) 0.1848
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9662
    Shell Resolution(Low) 34.649
    Number of Reflections(R-Free) 340
    Number of Reflections(R-Work) 7029
    R-Factor(R-Work) 0.2206
    R-Factor(R-Free) 0.2208
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.068
    f_dihedral_angle_d 12.506
    f_angle_d 1.111
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 6977
    Nucleic Acid Atoms 0
    Heterogen Atoms 220
    Solvent Atoms 895
     
     
  •   Software and Computing Hide
    Computing
    Data Collection HKL-3000
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building Phaser
    data collection HKL-3000