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X-RAY DIFFRACTION
Materials and Methods page
4ITQ
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 7.6
    Temperature 277.0
    Details 19% PEG 3350, 210 mM KSCN, 5% ethylene glycol, 100 mM HEPES pH 7.6, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 43.42 α = 90
    b = 71.78 β = 90
    c = 102.93 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type PSI PILATUS 6M
    Details mirrors
    Collection Date 2012-07-31
     
    Diffraction Radiation
    Monochromator Double silicon(111) crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type NSLS BEAMLINE X25
    Wavelength List 0.9793
    Site NSLS
    Beamline X25
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 2.0
    Resolution(High) 2.6
    Resolution(Low) 50
    Number Reflections(Observed) 5202
    Percent Possible(Observed) 99.6
    R Merge I(Observed) 0.055
    B(Isotropic) From Wilson Plot 61.0
    Redundancy 6.1
     
    High Resolution Shell Details
    Resolution(High) 2.6
    Resolution(Low) 2.64
    Percent Possible(All) 94.7
    R Merge I(Observed) 0.539
    Mean I Over Sigma(Observed) 1.4
    Redundancy 4.6
    Number Unique Reflections(All) 462
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.7
    Resolution(Low) 29.439
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 4664
    Number of Reflections(Observed) 4613
    Number of Reflections(R-Free) 447
    Percent Reflections(Observed) 98.91
    R-Factor(Observed) 0.2672
    R-Work 0.2617
    R-Free 0.315
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Mean Isotropic B Value 67.32
    Anisotropic B[1][1] 29.9819
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -13.1865
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -18.3995
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7001
    Shell Resolution(Low) 3.0904
    Number of Reflections(Observed) 1349
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1349
    R-Factor(R-Work) 0.3679
    R-Factor(R-Free) 0.4179
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0904
    Shell Resolution(Low) 3.8922
    Number of Reflections(Observed) 1362
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 1362
    R-Factor(R-Work) 0.2428
    R-Factor(R-Free) 0.3276
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8922
    Shell Resolution(Low) 29.4404
    Number of Reflections(Observed) 1455
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 1455
    R-Factor(R-Work) 0.2501
    R-Factor(R-Free) 0.2903
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.001
    f_chiral_restr 0.038
    f_dihedral_angle_d 22.447
    f_angle_d 0.789
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 658
    Nucleic Acid Atoms 328
    Heterogen Atoms 0
    Solvent Atoms 6
     
     
  •   Software and Computing Hide
    Computing
    Data Collection cbass
    Data Reduction (intensity integration) HKL2000
    Data Reduction (data scaling) HKL2000
    Structure Solution phenix.autosol
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building phenix.autosol
    data collection cbass