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X-RAY DIFFRACTION
Materials and Methods page
4IT2
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 293.0
    Details 1 uL protein solution + 1 uL reservoir against 500 uL reservoir (40-42.5% w/v polypropylene glycol P400, 0.1 M Bis-TriS, pH 6.5), VAPOR DIFFUSION, SITTING DROP, temperature 293K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 120.25 α = 90
    b = 45.42 β = 122.82
    c = 95.74 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2011-10-08
     
    Diffraction Radiation
    Monochromator double flat crystal, Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ALS BEAMLINE 8.3.1
    Wavelength List 0.97
    Site ALS
    Beamline 8.3.1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 1.0
    Observed Criterion Sigma(I) 1.0
    Resolution(High) 2.1
    Resolution(Low) 80.46
    Number Reflections(All) 25833
    Number Reflections(Observed) 25232
    Percent Possible(Observed) 99.8
     
    High Resolution Shell Details
    Resolution(High) 2.097
    Resolution(Low) 2.14
    Percent Possible(All) 87.5
    Mean I Over Sigma(Observed) 10.8
    R-Sym I(Observed) 0.13
    Redundancy 3.2
    Number Unique Reflections(All) 1116
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.097
    Resolution(Low) 33.892
    Cut-off Sigma(F) 1.34
    Number of Reflections(all) 25228
    Number of Reflections(Observed) 25228
    Number of Reflections(R-Free) 1281
    Percent Reflections(Observed) 97.62
    R-Factor(Observed) 0.2106
    R-Work 0.2087
    R-Free 0.2447
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -7.1616
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -2.8887
    Anisotropic B[2][2] -2.0326
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 9.1942
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.097
    Shell Resolution(Low) 2.1804
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2402
    R-Factor(R-Work) 0.2355
    R-Factor(R-Free) 0.3346
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1804
    Shell Resolution(Low) 2.2797
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2693
    R-Factor(R-Work) 0.2296
    R-Factor(R-Free) 0.3029
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2797
    Shell Resolution(Low) 2.3998
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2716
    R-Factor(R-Work) 0.2233
    R-Factor(R-Free) 0.3142
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3998
    Shell Resolution(Low) 2.5501
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2669
    R-Factor(R-Work) 0.2233
    R-Factor(R-Free) 0.3064
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5501
    Shell Resolution(Low) 2.7469
    Number of Reflections(R-Free) 159
    Number of Reflections(R-Work) 2695
    R-Factor(R-Work) 0.2218
    R-Factor(R-Free) 0.2576
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7469
    Shell Resolution(Low) 3.0232
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2755
    R-Factor(R-Work) 0.2209
    R-Factor(R-Free) 0.2922
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0232
    Shell Resolution(Low) 3.4603
    Number of Reflections(R-Free) 129
    Number of Reflections(R-Work) 2704
    R-Factor(R-Work) 0.2091
    R-Factor(R-Free) 0.2474
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4603
    Shell Resolution(Low) 4.3582
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2640
    R-Factor(R-Work) 0.1929
    R-Factor(R-Free) 0.2069
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3582
    Shell Resolution(Low) 33.896
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 2673
    R-Factor(R-Work) 0.2015
    R-Factor(R-Free) 0.2155
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.072
    f_dihedral_angle_d 15.947
    f_angle_d 1.333
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 3036
    Nucleic Acid Atoms 0
    Heterogen Atoms 129
    Solvent Atoms 181
     
     
  •   Software and Computing Hide
    Computing
    Data Collection BLU-ICE
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) HKL-2000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.7.3_928)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.3_928)
    model building Phaser
    data collection BLU-ICE