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X-RAY DIFFRACTION
Materials and Methods page
4ISX
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.5
    Temperature 289.0
    Details 0.2M MGCL2, 0.1M MES:NAOH, 10% (W/V)PEG4000, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 167.9 α = 90
    b = 167.9 β = 90
    c = 167.9 γ = 90
     
    Space Group
    Space Group Name:    F 2 3
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details Mirror
    Collection Date 2012-03-19
     
    Diffraction Radiation
    Monochromator Si 111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97921
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2.7
    Resolution(Low) 39
    Number Reflections(All) 10868
    Number Reflections(Observed) 10868
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.083
    Redundancy 7.4
     
    High Resolution Shell Details
    Resolution(High) 2.7
    Resolution(Low) 2.76
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.671
    Mean I Over Sigma(Observed) 3.3
    Redundancy 7.5
    Number Unique Reflections(All) 722
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.702
    Resolution(Low) 38.518
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 10861
    Number of Reflections(Observed) 10861
    Number of Reflections(R-Free) 522
    Percent Reflections(Observed) 99.84
    R-Factor(Observed) 0.1972
    R-Work 0.1945
    R-Free 0.252
    R-Free Selection Details Random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7024
    Shell Resolution(Low) 2.9742
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2576
    R-Factor(R-Work) 0.2706
    R-Factor(R-Free) 0.3601
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9742
    Shell Resolution(Low) 3.4044
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2556
    R-Factor(R-Work) 0.2379
    R-Factor(R-Free) 0.3052
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4044
    Shell Resolution(Low) 4.2883
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2566
    R-Factor(R-Work) 0.1885
    R-Factor(R-Free) 0.2271
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2883
    Shell Resolution(Low) 38.5219
    Number of Reflections(R-Free) 127
    Number of Reflections(R-Work) 2641
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.2314
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.049
    f_dihedral_angle_d 15.247
    f_angle_d 0.715
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2913
    Nucleic Acid Atoms 0
    Heterogen Atoms 114
    Solvent Atoms 28
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC-Collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution MolRep
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building MolRep
    data collection SBC-Collect