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X-RAY DIFFRACTION
Materials and Methods page
4IS0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.75
    Temperature 277.0
    Details 2.2 M ammonium sulfate, 100 mM sodium acetate pH 4.75, VAPOR DIFFUSION, HANGING DROP, temperature 277K
    Method VAPOR DIFFUSION, HANGING DROP
    pH 4.25
    Temperature 277.0
    Details 2.2 M ammonium sulfate, 100 mM sodium acetate pH 4.25, VAPOR DIFFUSION, HANGING DROP, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 57.6 α = 90
    b = 57.6 β = 90
    c = 140.18 γ = 120
     
    Space Group
    Space Group Name:    P 31 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector AREA DETECTOR
    Type ADSC QUANTUM 315r
    Collection Date 2008-01-01
     
    Diffraction Radiation
    Monochromator Beamline Optics
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRL BEAMLINE BL4-2
    Wavelength List 1.034375
    Site SSRL
    Beamline BL4-2
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) -1.0
    Observed Criterion Sigma(I) -1.0
    Resolution(High) 1.72
    Resolution(Low) 40.64
    Number Reflections(All) 29422
    Number Reflections(Observed) 29422
    Percent Possible(Observed) 99.9
    R Merge I(Observed) 0.081
    Redundancy 16.2
     
    High Resolution Shell Details
    Resolution(High) 1.72
    Resolution(Low) 1.81
    Percent Possible(All) 99.1
    R Merge I(Observed) 0.609
    Mean I Over Sigma(Observed) 2.3
    Redundancy 7.2
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.721
    Resolution(Low) 40.641
    Cut-off Sigma(F) 1.75
    Number of Reflections(all) 29370
    Number of Reflections(Observed) 29370
    Number of Reflections(R-Free) 1997
    Percent Reflections(Observed) 99.85
    R-Factor(Observed) 0.1552
    R-Work 0.1519
    R-Free 0.2007
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7213
    Shell Resolution(Low) 1.7643
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 1879
    R-Factor(R-Work) 0.1668
    R-Factor(R-Free) 0.2411
    Percent Reflections(Observed) 98.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7643
    Shell Resolution(Low) 1.812
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1933
    R-Factor(R-Work) 0.1745
    R-Factor(R-Free) 0.2968
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.812
    Shell Resolution(Low) 1.8653
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 1932
    R-Factor(R-Work) 0.1614
    R-Factor(R-Free) 0.2575
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8653
    Shell Resolution(Low) 1.9255
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1917
    R-Factor(R-Work) 0.148
    R-Factor(R-Free) 0.2281
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9255
    Shell Resolution(Low) 1.9944
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1939
    R-Factor(R-Work) 0.1417
    R-Factor(R-Free) 0.2146
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9944
    Shell Resolution(Low) 2.0742
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 1915
    R-Factor(R-Work) 0.1315
    R-Factor(R-Free) 0.2308
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0742
    Shell Resolution(Low) 2.1686
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 1935
    R-Factor(R-Work) 0.1276
    R-Factor(R-Free) 0.2158
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1686
    Shell Resolution(Low) 2.2829
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1944
    R-Factor(R-Work) 0.1236
    R-Factor(R-Free) 0.2193
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2829
    Shell Resolution(Low) 2.4259
    Number of Reflections(R-Free) 140
    Number of Reflections(R-Work) 1947
    R-Factor(R-Work) 0.128
    R-Factor(R-Free) 0.1835
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4259
    Shell Resolution(Low) 2.6132
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 1976
    R-Factor(R-Work) 0.1406
    R-Factor(R-Free) 0.2001
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6132
    Shell Resolution(Low) 2.8761
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 1960
    R-Factor(R-Work) 0.1508
    R-Factor(R-Free) 0.2083
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8761
    Shell Resolution(Low) 3.2922
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 1969
    R-Factor(R-Work) 0.1671
    R-Factor(R-Free) 0.2069
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2922
    Shell Resolution(Low) 4.1471
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2016
    R-Factor(R-Work) 0.1452
    R-Factor(R-Free) 0.1719
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1471
    Shell Resolution(Low) 40.6522
    Number of Reflections(R-Free) 157
    Number of Reflections(R-Work) 2111
    R-Factor(R-Work) 0.1706
    R-Factor(R-Free) 0.1924
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.007
    f_chiral_restr 0.067
    f_dihedral_angle_d 13.857
    f_angle_d 1.424
    f_bond_d 0.011
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 1921
    Nucleic Acid Atoms 0
    Heterogen Atoms 90
    Solvent Atoms 140
     
     
  •   Software and Computing Hide
    Computing
    Data Collection Blu-Ice
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution NONE
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building NONE
    data collection Blu-Ice