X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 277.15
Details 28% Low Molecular-Weight PEG Smears, 0.1M MES pH 6.5 (Ligand soaking performed in low-molecular-weight PEG smears stabilizing solution), VAPOR DIFFUSION, SITTING DROP, temperature 277.15K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 82.09 α = 90
b = 96.52 β = 90
c = 57.58 γ = 90
Symmetry
Space Group C 2 2 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
IMAGE PLATE RIGAKU RAXIS IV -- 2011-11-04
Diffraction Radiation
Monochromator Protocol
Flat graphite crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU FR-E SUPERBRIGHT 1.5418 -- --

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.7 27.48 99.2 0.075 -- -- 5.0 25305 25280 0.0 0.0 27.4
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.7 1.79 98.1 0.622 -- 2.2 5.0 3598

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
MOLECULAR REPLACEMENT 1.7 27.48 2.0 0.0 25280 23994 1286 98.94 -- 0.17223 0.17 0.21376 RANDOM
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.7 1.744 -- 92 1723 0.408 0.491 -- 97.74
Temperature Factor Modeling
Temperature Factor Value
Mean Isotropic B 30.58
Anisotropic B[1][1] 0.79
Anisotropic B[1][2] 0.0
Anisotropic B[1][3] 0.0
Anisotropic B[2][2] 0.23
Anisotropic B[2][3] 0.0
Anisotropic B[3][3] -1.02
RMS Deviations
Key Refinement Restraint Deviation
r_chiral_restr 0.096
r_dihedral_angle_3_deg 14.476
r_dihedral_angle_4_deg 24.19
r_bond_other_d 0.001
r_dihedral_angle_2_deg 34.662
r_bond_refined_d 0.016
r_angle_refined_deg 1.577
r_angle_other_deg 0.803
r_dihedral_angle_1_deg 5.539
r_gen_planes_refined 0.009
r_gen_planes_other 0.001
Coordinate Error
Parameter Value
Luzzati ESD (Observed) 0.209
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 947
Nucleic Acid Atoms 0
Heterogen Atoms 75
Solvent Atoms 245

Software

Software
Software Name Purpose
CrystalClear data collection
PHASER phasing
REFMAC refinement version: 5.7.0032
MOSFLM data reduction
SCALA data scaling