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X-RAY DIFFRACTION
Materials and Methods page
4IR4
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 6.25
    Temperature 277.15
    Details 32% Low Molecular-Weight PEG Smears, 0.1M MES pH 6.25 (Ligand soaking performed in low-molecular-weight PEG smears stabilizing solution), VAPOR DIFFUSION, SITTING DROP, temperature 277.15K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 82.7 α = 90
    b = 96.46 β = 90
    c = 57.74 γ = 90
     
    Space Group
    Space Group Name:    C 2 2 21
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector IMAGE PLATE
    Type RIGAKU RAXIS IV
    Collection Date 2011-10-03
     
    Diffraction Radiation
    Monochromator Flat graphite crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source ROTATING ANODE
    Type RIGAKU FR-E SUPERBRIGHT
    Wavelength List 1.5418
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.05
    Resolution(Low) 19.68
    Number Reflections(All) 14789
    Number Reflections(Observed) 14774
    Percent Possible(Observed) 99.8
    R Merge I(Observed) 0.12
    B(Isotropic) From Wilson Plot 30.8
    Redundancy 5.0
     
    High Resolution Shell Details
    Resolution(High) 2.05
    Resolution(Low) 2.16
    Percent Possible(All) 99.8
    R Merge I(Observed) 0.791
    Mean I Over Sigma(Observed) 2.0
    Redundancy 5.1
    Number Unique Reflections(All) 2097
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.05
    Resolution(Low) 19.6
    Cut-off Sigma(I) 2.0
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 14774
    Number of Reflections(Observed) 14026
    Number of Reflections(R-Free) 747
    Percent Reflections(Observed) 99.56
    R-Factor(Observed) 0.18582
    R-Work 0.18376
    R-Free 0.2276
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 44.822
    Anisotropic B[1][1] 4.37
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -1.68
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -2.69
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.05
    Shell Resolution(Low) 2.103
    Number of Reflections(R-Free) 61
    Number of Reflections(R-Work) 981
    R-Factor(R-Work) 0.314
    R-Factor(R-Free) 0.306
    Percent Reflections(Observed) 99.33
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_gen_planes_other 0.002
    r_gen_planes_refined 0.008
    r_chiral_restr 0.091
    r_dihedral_angle_4_deg 14.07
    r_dihedral_angle_3_deg 12.742
    r_dihedral_angle_2_deg 31.876
    r_dihedral_angle_1_deg 5.764
    r_angle_other_deg 0.882
    r_angle_refined_deg 1.577
    r_bond_other_d 0.002
    r_bond_refined_d 0.015
     
    Coordinate Error
    Luzzati ESD(Observed) 0.273
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 937
    Nucleic Acid Atoms 0
    Heterogen Atoms 56
    Solvent Atoms 169
     
     
  •   Software and Computing Hide
    Computing
    Data Collection CrystalClear
    Data Reduction (intensity integration) XDS
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement REFMAC 5.7.0032
     
    Software
    refinement REFMAC version: 5.7.0032
    model building PHASER
    data collection CrystalClear