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X-RAY DIFFRACTION
Materials and Methods page
4IR0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.6
    Temperature 289.0
    Details 10.7% PEG 3000, 50mM Tris pH7.6, 8.6% PEG2000 MME, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 48.24 α = 90
    b = 48.24 β = 90
    c = 147.63 γ = 90
     
    Space Group
    Space Group Name:    P 43
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2011-10-10
     
    Diffraction Radiation
    Monochromator Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97924
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.6
    Resolution(Low) 50
    Number Reflections(All) 43924
    Number Reflections(Observed) 43924
    Percent Possible(Observed) 99.1
    B(Isotropic) From Wilson Plot 23.1
    Redundancy 7.5
     
    High Resolution Shell Details
    Resolution(High) 1.6
    Resolution(Low) 1.63
    Percent Possible(All) 93.4
    Mean I Over Sigma(Observed) 2.6
    R-Sym I(Observed) 0.543
    Redundancy 5.5
    Number Unique Reflections(All) 2059
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 1.6
    Resolution(Low) 34.449
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 43857
    Number of Reflections(Observed) 43857
    Number of Reflections(R-Free) 2229
    Percent Reflections(Observed) 99.1
    R-Factor(All) 0.187
    R-Factor(Observed) 0.187
    R-Work 0.184
    R-Free 0.201
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
    Mean Isotropic B Value 33.5
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6007
    Shell Resolution(Low) 1.6355
    Number of Reflections(Observed) 2599
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2445
    R-Factor(R-Work) 0.2916
    R-Factor(R-Free) 0.2881
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6355
    Shell Resolution(Low) 1.6735
    Number of Reflections(Observed) 2727
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2586
    R-Factor(R-Work) 0.2911
    R-Factor(R-Free) 0.3107
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6735
    Shell Resolution(Low) 1.7153
    Number of Reflections(Observed) 2762
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2627
    R-Factor(R-Work) 0.2755
    R-Factor(R-Free) 0.3122
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7153
    Shell Resolution(Low) 1.7617
    Number of Reflections(Observed) 2693
    Number of Reflections(R-Free) 149
    Number of Reflections(R-Work) 2544
    R-Factor(R-Work) 0.278
    R-Factor(R-Free) 0.2793
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7617
    Shell Resolution(Low) 1.8135
    Number of Reflections(Observed) 2777
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 2639
    R-Factor(R-Work) 0.2665
    R-Factor(R-Free) 0.2743
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8135
    Shell Resolution(Low) 1.872
    Number of Reflections(Observed) 2734
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2582
    R-Factor(R-Work) 0.2551
    R-Factor(R-Free) 0.2567
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.872
    Shell Resolution(Low) 1.9388
    Number of Reflections(Observed) 2761
    Number of Reflections(R-Free) 164
    Number of Reflections(R-Work) 2597
    R-Factor(R-Work) 0.2372
    R-Factor(R-Free) 0.263
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9388
    Shell Resolution(Low) 2.0164
    Number of Reflections(Observed) 2763
    Number of Reflections(R-Free) 115
    Number of Reflections(R-Work) 2648
    R-Factor(R-Work) 0.2279
    R-Factor(R-Free) 0.2345
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0164
    Shell Resolution(Low) 2.1081
    Number of Reflections(Observed) 2763
    Number of Reflections(R-Free) 132
    Number of Reflections(R-Work) 2631
    R-Factor(R-Work) 0.2153
    R-Factor(R-Free) 0.2069
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1081
    Shell Resolution(Low) 2.2191
    Number of Reflections(Observed) 2733
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2590
    R-Factor(R-Work) 0.2055
    R-Factor(R-Free) 0.212
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2191
    Shell Resolution(Low) 2.3579
    Number of Reflections(Observed) 2787
    Number of Reflections(R-Free) 136
    Number of Reflections(R-Work) 2651
    R-Factor(R-Work) 0.2137
    R-Factor(R-Free) 0.223
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3579
    Shell Resolution(Low) 2.5396
    Number of Reflections(Observed) 2786
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2649
    R-Factor(R-Work) 0.2188
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5396
    Shell Resolution(Low) 2.7946
    Number of Reflections(Observed) 2734
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2591
    R-Factor(R-Work) 0.1951
    R-Factor(R-Free) 0.1885
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7946
    Shell Resolution(Low) 3.1975
    Number of Reflections(Observed) 2772
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1732
    R-Factor(R-Free) 0.2225
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1975
    Shell Resolution(Low) 4.0231
    Number of Reflections(Observed) 2780
    Number of Reflections(R-Free) 128
    Number of Reflections(R-Work) 2652
    R-Factor(R-Work) 0.1449
    R-Factor(R-Free) 0.1615
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0231
    Shell Resolution(Low) 19.9569
    Number of Reflections(Observed) 2660
    Number of Reflections(R-Free) 120
    Number of Reflections(R-Work) 2540
    R-Factor(R-Work) 0.1395
    R-Factor(R-Free) 0.1606
    Percent Reflections(Observed) 91.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.067
    f_dihedral_angle_d 15.739
    f_angle_d 0.949
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2351
    Nucleic Acid Atoms 0
    Heterogen Atoms 34
    Solvent Atoms 197
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCcollect, HKL-3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution HKL-3000, SHELX, RESOLVE, BUCCUNEER
    Structure Refinement PHENIX (phenix.refine: dev_1227)
     
    Software
    refinement PHENIX version: (phenix.refine: dev_1227)
    model building BUCCUNEER
    model building RESOLVE
    model building SHELX
    model building HKL-3000
    data collection HKL-3000
    data collection SBCcollect