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X-RAY DIFFRACTION
Materials and Methods page
4IQI
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 289.0
    Details 0.2 M Magnesium chloride, 0.1 M TRIS pH 8.5, 16 % (w/v) PEG4000, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 96.12 α = 90
    b = 90.94 β = 90.1
    c = 73.17 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210r
    Details mirrors
    Collection Date 2008-10-03
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-BM
    Wavelength List 0.97915
    Site APS
    Beamline 19-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 1.5
    Resolution(Low) 50
    Number Reflections(All) 97144
    Number Reflections(Observed) 97144
    Percent Possible(Observed) 97.1
    B(Isotropic) From Wilson Plot 14.0
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.5
    Resolution(Low) 1.53
    Percent Possible(All) 78.4
    Mean I Over Sigma(Observed) 2.3
    R-Sym I(Observed) 0.317
    Redundancy 3.7
    Number Unique Reflections(All) 3894
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.5
    Resolution(Low) 26.891
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 97007
    Number of Reflections(Observed) 97007
    Number of Reflections(R-Free) 4987
    Percent Reflections(Observed) 96.62
    R-Factor(All) 0.154
    R-Factor(Observed) 0.154
    R-Work 0.151
    R-Free 0.172
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
    Mean Isotropic B Value 20.1
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5007
    Shell Resolution(Low) 1.5266
    Number of Reflections(Observed) 3666
    Number of Reflections(R-Free) 183
    Number of Reflections(R-Work) 3483
    R-Factor(R-Work) 0.258
    R-Factor(R-Free) 0.2899
    Percent Reflections(Observed) 70.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5266
    Shell Resolution(Low) 1.5543
    Number of Reflections(Observed) 4188
    Number of Reflections(R-Free) 204
    Number of Reflections(R-Work) 3984
    R-Factor(R-Work) 0.2419
    R-Factor(R-Free) 0.261
    Percent Reflections(Observed) 80.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5543
    Shell Resolution(Low) 1.5842
    Number of Reflections(Observed) 4496
    Number of Reflections(R-Free) 214
    Number of Reflections(R-Work) 4282
    R-Factor(R-Work) 0.222
    R-Factor(R-Free) 0.2453
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5842
    Shell Resolution(Low) 1.6165
    Number of Reflections(Observed) 4878
    Number of Reflections(R-Free) 246
    Number of Reflections(R-Work) 4631
    R-Factor(R-Work) 0.2119
    R-Factor(R-Free) 0.2487
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6165
    Shell Resolution(Low) 1.6516
    Number of Reflections(Observed) 4980
    Number of Reflections(R-Free) 269
    Number of Reflections(R-Work) 4711
    R-Factor(R-Work) 0.201
    R-Factor(R-Free) 0.2142
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6516
    Shell Resolution(Low) 1.69
    Number of Reflections(Observed) 4992
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4774
    R-Factor(R-Work) 0.2029
    R-Factor(R-Free) 0.225
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.69
    Shell Resolution(Low) 1.7322
    Number of Reflections(Observed) 4980
    Number of Reflections(R-Free) 232
    Number of Reflections(R-Work) 4748
    R-Factor(R-Work) 0.1992
    R-Factor(R-Free) 0.1962
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7322
    Shell Resolution(Low) 1.779
    Number of Reflections(Observed) 5007
    Number of Reflections(R-Free) 270
    Number of Reflections(R-Work) 4737
    R-Factor(R-Work) 0.1904
    R-Factor(R-Free) 0.1966
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.779
    Shell Resolution(Low) 1.8313
    Number of Reflections(Observed) 4971
    Number of Reflections(R-Free) 217
    Number of Reflections(R-Work) 4754
    R-Factor(R-Work) 0.1932
    R-Factor(R-Free) 0.2061
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8313
    Shell Resolution(Low) 1.8903
    Number of Reflections(Observed) 5002
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 4779
    R-Factor(R-Work) 0.1895
    R-Factor(R-Free) 0.1978
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8903
    Shell Resolution(Low) 1.9577
    Number of Reflections(Observed) 4942
    Number of Reflections(R-Free) 256
    Number of Reflections(R-Work) 4686
    R-Factor(R-Work) 0.1758
    R-Factor(R-Free) 0.1939
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9577
    Shell Resolution(Low) 2.036
    Number of Reflections(Observed) 4978
    Number of Reflections(R-Free) 248
    Number of Reflections(R-Work) 4730
    R-Factor(R-Work) 0.1621
    R-Factor(R-Free) 0.1782
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.036
    Shell Resolution(Low) 2.1284
    Number of Reflections(Observed) 5013
    Number of Reflections(R-Free) 273
    Number of Reflections(R-Work) 4740
    R-Factor(R-Work) 0.159
    R-Factor(R-Free) 0.1802
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1284
    Shell Resolution(Low) 2.2404
    Number of Reflections(Observed) 4980
    Number of Reflections(R-Free) 262
    Number of Reflections(R-Work) 4718
    R-Factor(R-Work) 0.1542
    R-Factor(R-Free) 0.1639
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2404
    Shell Resolution(Low) 2.3803
    Number of Reflections(Observed) 4978
    Number of Reflections(R-Free) 248
    Number of Reflections(R-Work) 4723
    R-Factor(R-Work) 0.156
    R-Factor(R-Free) 0.1627
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3803
    Shell Resolution(Low) 2.5634
    Number of Reflections(Observed) 5019
    Number of Reflections(R-Free) 289
    Number of Reflections(R-Work) 4730
    R-Factor(R-Work) 0.1564
    R-Factor(R-Free) 0.1791
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5634
    Shell Resolution(Low) 2.8201
    Number of Reflections(Observed) 4995
    Number of Reflections(R-Free) 239
    Number of Reflections(R-Work) 4756
    R-Factor(R-Work) 0.1466
    R-Factor(R-Free) 0.1816
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8201
    Shell Resolution(Low) 3.2252
    Number of Reflections(Observed) 4990
    Number of Reflections(R-Free) 243
    Number of Reflections(R-Work) 4747
    R-Factor(R-Work) 0.134
    R-Factor(R-Free) 0.1726
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2252
    Shell Resolution(Low) 4.0525
    Number of Reflections(Observed) 4937
    Number of Reflections(R-Free) 227
    Number of Reflections(R-Work) 4710
    R-Factor(R-Work) 0.1045
    R-Factor(R-Free) 0.1368
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0525
    Shell Resolution(Low) 15.9946
    Number of Reflections(Observed) 4971
    Number of Reflections(R-Free) 276
    Number of Reflections(R-Work) 4695
    R-Factor(R-Work) 0.1214
    R-Factor(R-Free) 0.145
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.104
    f_dihedral_angle_d 17.337
    f_angle_d 1.548
    f_bond_d 0.014
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4160
    Nucleic Acid Atoms 0
    Heterogen Atoms 23
    Solvent Atoms 549
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution HKL3000, Molrep
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1161)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1161)
    model building Molrep
    model building HKL3000
    data collection HKL3000
    data collection SBCCOLLECT