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X-RAY DIFFRACTION
Materials and Methods page
4IQF
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7.5
    Temperature 289.0
    Details 0.2 M Ammonium sulfate, 0.1 M HEPES pH 7.5, 25 % w/v Polyehtlyene glycol 3350, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 62.86 α = 90
    b = 191.5 β = 89.95
    c = 89.95 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 210r
    Details mirrors
    Collection Date 2010-02-25
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-BM
    Wavelength List 0.97918
    Site APS
    Beamline 19-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.38
    Resolution(Low) 50
    Number Reflections(Observed) 4160
    Percent Possible(Observed) 98.8
    B(Isotropic) From Wilson Plot 44.35
    Redundancy 5.3
     
    High Resolution Shell Details
    Resolution(High) 2.4
    Resolution(Low) 2.44
    Percent Possible(All) 98.4
    Mean I Over Sigma(Observed) 3.0
    R-Sym I(Observed) 0.72
    Redundancy 5.2
    Number Unique Reflections(All) 4160
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.378
    Resolution(Low) 36.589
    Cut-off Sigma(F) 0.0
    Number of Reflections(R-Free) 4171
    Percent Reflections(Observed) 97.47
    R-Factor(All) 0.183
    R-Factor(Observed) 0.183
    R-Work 0.181
    R-Free 0.21
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
    Mean Isotropic B Value 56.0
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.378
    Shell Resolution(Low) 2.4191
    Number of Reflections(Observed) 3309
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 3155
    R-Factor(R-Work) 0.2831
    R-Factor(R-Free) 0.315
    Percent Reflections(Observed) 75.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4191
    Shell Resolution(Low) 2.463
    Number of Reflections(Observed) 4234
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 3933
    R-Factor(R-Work) 0.2748
    R-Factor(R-Free) 0.3061
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.463
    Shell Resolution(Low) 2.5103
    Number of Reflections(Observed) 4234
    Number of Reflections(R-Free) 213
    Number of Reflections(R-Work) 4021
    R-Factor(R-Work) 0.2557
    R-Factor(R-Free) 0.2896
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5103
    Shell Resolution(Low) 2.5614
    Number of Reflections(Observed) 4121
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3914
    R-Factor(R-Work) 0.2572
    R-Factor(R-Free) 0.303
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5614
    Shell Resolution(Low) 2.617
    Number of Reflections(Observed) 4226
    Number of Reflections(R-Free) 223
    Number of Reflections(R-Work) 4003
    R-Factor(R-Work) 0.2506
    R-Factor(R-Free) 0.2649
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.617
    Shell Resolution(Low) 2.6777
    Number of Reflections(Observed) 4174
    Number of Reflections(R-Free) 220
    Number of Reflections(R-Work) 3954
    R-Factor(R-Work) 0.2419
    R-Factor(R-Free) 0.2603
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6777
    Shell Resolution(Low) 2.7445
    Number of Reflections(Observed) 4223
    Number of Reflections(R-Free) 201
    Number of Reflections(R-Work) 4022
    R-Factor(R-Work) 0.2308
    R-Factor(R-Free) 0.2619
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7445
    Shell Resolution(Low) 2.8185
    Number of Reflections(Observed) 4174
    Number of Reflections(R-Free) 181
    Number of Reflections(R-Work) 3993
    R-Factor(R-Work) 0.2332
    R-Factor(R-Free) 0.2615
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8185
    Shell Resolution(Low) 2.9012
    Number of Reflections(Observed) 4245
    Number of Reflections(R-Free) 202
    Number of Reflections(R-Work) 4043
    R-Factor(R-Work) 0.2232
    R-Factor(R-Free) 0.233
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9012
    Shell Resolution(Low) 2.9946
    Number of Reflections(Observed) 4221
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 4010
    R-Factor(R-Work) 0.2187
    R-Factor(R-Free) 0.2588
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9946
    Shell Resolution(Low) 3.1012
    Number of Reflections(Observed) 4214
    Number of Reflections(R-Free) 194
    Number of Reflections(R-Work) 4020
    R-Factor(R-Work) 0.2232
    R-Factor(R-Free) 0.2566
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1012
    Shell Resolution(Low) 3.2249
    Number of Reflections(Observed) 4222
    Number of Reflections(R-Free) 218
    Number of Reflections(R-Work) 4004
    R-Factor(R-Work) 0.2066
    R-Factor(R-Free) 0.2473
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2249
    Shell Resolution(Low) 3.3709
    Number of Reflections(Observed) 4221
    Number of Reflections(R-Free) 195
    Number of Reflections(R-Work) 4026
    R-Factor(R-Work) 0.1973
    R-Factor(R-Free) 0.219
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3709
    Shell Resolution(Low) 3.5477
    Number of Reflections(Observed) 4229
    Number of Reflections(R-Free) 211
    Number of Reflections(R-Work) 4018
    R-Factor(R-Work) 0.187
    R-Factor(R-Free) 0.201
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.5477
    Shell Resolution(Low) 3.7685
    Number of Reflections(Observed) 4240
    Number of Reflections(R-Free) 237
    Number of Reflections(R-Work) 4003
    R-Factor(R-Work) 0.1668
    R-Factor(R-Free) 0.21
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.7685
    Shell Resolution(Low) 4.0572
    Number of Reflections(Observed) 4200
    Number of Reflections(R-Free) 200
    Number of Reflections(R-Work) 4000
    R-Factor(R-Work) 0.1547
    R-Factor(R-Free) 0.1679
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.0572
    Shell Resolution(Low) 4.4612
    Number of Reflections(Observed) 4111
    Number of Reflections(R-Free) 208
    Number of Reflections(R-Work) 3933
    R-Factor(R-Work) 0.1341
    R-Factor(R-Free) 0.1866
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.4612
    Shell Resolution(Low) 5.0971
    Number of Reflections(Observed) 4103
    Number of Reflections(R-Free) 212
    Number of Reflections(R-Work) 3891
    R-Factor(R-Work) 0.1273
    R-Factor(R-Free) 0.1393
    Percent Reflections(Observed) 91.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.0971
    Shell Resolution(Low) 6.3856
    Number of Reflections(Observed) 4249
    Number of Reflections(R-Free) 231
    Number of Reflections(R-Work) 4018
    R-Factor(R-Work) 0.1503
    R-Factor(R-Free) 0.1702
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 6.3856
    Shell Resolution(Low) 19.767
    Number of Reflections(Observed) 3962
    Number of Reflections(R-Free) 207
    Number of Reflections(R-Work) 3755
    R-Factor(R-Work) 0.1575
    R-Factor(R-Free) 0.2042
    Percent Reflections(Observed) 87.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.056
    f_dihedral_angle_d 14.028
    f_angle_d 0.9
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9785
    Nucleic Acid Atoms 0
    Heterogen Atoms 54
    Solvent Atoms 504
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-2000
    Structure Solution HKL3000, phenix
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1161)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1161)
    model building phenix
    model building HKL3000
    data collection HKL3000
    data collection SBCCOLLECT