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X-RAY DIFFRACTION
Materials and Methods page
4IQE
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 291.0
    Details 5 % Tecsimate pH 7.0, 0.1 M Hepes pH 7.0, 10 % PEG 5000, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 106.17 α = 90
    b = 106.17 β = 90
    c = 113.45 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2009-04-06
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-BM
    Wavelength List 0.97951
    Site APS
    Beamline 19-BM
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.5
    Resolution(Low) 48.08
    Number Reflections(All) 26004
    Number Reflections(Observed) 26004
    Percent Possible(Observed) 100.0
    B(Isotropic) From Wilson Plot 50.4
    Redundancy 12.3
     
    High Resolution Shell Details
    Resolution(High) 2.5
    Resolution(Low) 2.54
    Percent Possible(All) 100.0
    Mean I Over Sigma(Observed) 3.44
    R-Sym I(Observed) 0.759
    Redundancy 8.6
    Number Unique Reflections(All) 1292
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.501
    Resolution(Low) 48.08
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 25870
    Number of Reflections(Observed) 25870
    Number of Reflections(R-Free) 1316
    Percent Reflections(Observed) 99.51
    R-Factor(Observed) 0.163
    R-Work 0.159
    R-Free 0.178
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5015
    Shell Resolution(Low) 2.6017
    Number of Reflections(Observed) 2795
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 2656
    R-Factor(R-Work) 0.2529
    R-Factor(R-Free) 0.3213
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6017
    Shell Resolution(Low) 2.72
    Number of Reflections(Observed) 2812
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2681
    R-Factor(R-Work) 0.2451
    R-Factor(R-Free) 0.2691
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.72
    Shell Resolution(Low) 2.8634
    Number of Reflections(Observed) 2837
    Number of Reflections(R-Free) 151
    Number of Reflections(R-Work) 2686
    R-Factor(R-Work) 0.2179
    R-Factor(R-Free) 0.2548
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8634
    Shell Resolution(Low) 3.0427
    Number of Reflections(Observed) 2851
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 2706
    R-Factor(R-Work) 0.2001
    R-Factor(R-Free) 0.2479
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0427
    Shell Resolution(Low) 3.2775
    Number of Reflections(Observed) 2842
    Number of Reflections(R-Free) 130
    Number of Reflections(R-Work) 2712
    R-Factor(R-Work) 0.178
    R-Factor(R-Free) 0.2062
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.2775
    Shell Resolution(Low) 3.607
    Number of Reflections(Observed) 2881
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 2738
    R-Factor(R-Work) 0.1508
    R-Factor(R-Free) 0.162
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.607
    Shell Resolution(Low) 4.1282
    Number of Reflections(Observed) 2874
    Number of Reflections(R-Free) 165
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1328
    R-Factor(R-Free) 0.1415
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.1282
    Shell Resolution(Low) 5.1984
    Number of Reflections(Observed) 2925
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2773
    R-Factor(R-Work) 0.1233
    R-Factor(R-Free) 0.1282
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 5.1984
    Shell Resolution(Low) 34.977
    Number of Reflections(Observed) 3044
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2892
    R-Factor(R-Work) 0.1566
    R-Factor(R-Free) 0.1618
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.002
    f_chiral_restr 0.041
    f_dihedral_angle_d 14.562
    f_angle_d 0.574
    f_bond_d 0.003
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4421
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 147
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution HKL3000, Molrep
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1161)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1161)
    model building Molrep
    model building HKL3000
    data collection HKL3000
    data collection SBCCOLLECT