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X-RAY DIFFRACTION
Materials and Methods page
4IQD
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 291.0
    Details 0.2 M ammonium citrate tribasic pH 7.0, 20 PEG 3350, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 105.54 α = 90
    b = 105.54 β = 90
    c = 114.68 γ = 120
     
    Space Group
    Space Group Name:    P 32 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Details mirrors
    Collection Date 2009-04-13
     
    Diffraction Radiation
    Monochromator double crystal monochromator
    Diffraction Protocol SAD
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.9793
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2
    Resolution(Low) 48.6
    Number Reflections(All) 50248
    Number Reflections(Observed) 50248
    Percent Possible(Observed) 99.8
    B(Isotropic) From Wilson Plot 25.2
    Redundancy 11.7
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.03
    Percent Possible(All) 97.2
    Mean I Over Sigma(Observed) 3.15
    R-Sym I(Observed) 0.822
    Redundancy 7.4
    Number Unique Reflections(All) 2398
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.0
    Resolution(Low) 48.574
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 50212
    Number of Reflections(Observed) 50212
    Number of Reflections(R-Free) 2006
    Percent Reflections(Observed) 99.62
    R-Factor(All) 0.148
    R-Factor(Observed) 0.148
    R-Work 0.142
    R-Free 0.188
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Isotropic Thermal Model mixed
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9995
    Shell Resolution(Low) 2.0495
    Number of Reflections(Observed) 3389
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 3254
    R-Factor(R-Work) 0.2383
    R-Factor(R-Free) 0.3324
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0495
    Shell Resolution(Low) 2.1049
    Number of Reflections(Observed) 3566
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 3425
    R-Factor(R-Work) 0.2171
    R-Factor(R-Free) 0.2774
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1049
    Shell Resolution(Low) 2.1669
    Number of Reflections(Observed) 3551
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3409
    R-Factor(R-Work) 0.1917
    R-Factor(R-Free) 0.2434
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1669
    Shell Resolution(Low) 2.2368
    Number of Reflections(Observed) 3549
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3410
    R-Factor(R-Work) 0.1836
    R-Factor(R-Free) 0.2295
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2368
    Shell Resolution(Low) 2.3167
    Number of Reflections(Observed) 3545
    Number of Reflections(R-Free) 138
    Number of Reflections(R-Work) 3407
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2275
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3167
    Shell Resolution(Low) 2.4095
    Number of Reflections(Observed) 3593
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3447
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.2123
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4095
    Shell Resolution(Low) 2.5191
    Number of Reflections(Observed) 3561
    Number of Reflections(R-Free) 139
    Number of Reflections(R-Work) 3422
    R-Factor(R-Work) 0.1699
    R-Factor(R-Free) 0.2424
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5191
    Shell Resolution(Low) 2.6519
    Number of Reflections(Observed) 3572
    Number of Reflections(R-Free) 145
    Number of Reflections(R-Work) 3427
    R-Factor(R-Work) 0.1701
    R-Factor(R-Free) 0.2038
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6519
    Shell Resolution(Low) 2.8181
    Number of Reflections(Observed) 3584
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 3442
    R-Factor(R-Work) 0.1582
    R-Factor(R-Free) 0.1938
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8181
    Shell Resolution(Low) 3.0356
    Number of Reflections(Observed) 3605
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3459
    R-Factor(R-Work) 0.1531
    R-Factor(R-Free) 0.1945
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0356
    Shell Resolution(Low) 3.341
    Number of Reflections(Observed) 3601
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 3455
    R-Factor(R-Work) 0.1433
    R-Factor(R-Free) 0.2241
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.341
    Shell Resolution(Low) 3.8241
    Number of Reflections(Observed) 3636
    Number of Reflections(R-Free) 143
    Number of Reflections(R-Work) 3493
    R-Factor(R-Work) 0.1207
    R-Factor(R-Free) 0.1529
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.8241
    Shell Resolution(Low) 4.8169
    Number of Reflections(Observed) 3652
    Number of Reflections(R-Free) 147
    Number of Reflections(R-Work) 3505
    R-Factor(R-Work) 0.1035
    R-Factor(R-Free) 0.1567
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.8169
    Shell Resolution(Low) 42.4642
    Number of Reflections(Observed) 3793
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 3641
    R-Factor(R-Work) 0.1208
    R-Factor(R-Free) 0.152
    Percent Reflections(Observed) 96.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.003
    f_chiral_restr 0.054
    f_dihedral_angle_d 15.461
    f_angle_d 0.803
    f_bond_d 0.004
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 4442
    Nucleic Acid Atoms 0
    Heterogen Atoms 30
    Solvent Atoms 341
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBCCOLLECT, HKL3000
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-2000
    Structure Solution HKL3000, SHELXD,MLPHARE,DM,RESOLVE,COOT
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1161)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1161)
    model building COOT
    model building RESOLVE
    model building DM
    model building MLPHARE
    model building SHELXD
    model building HKL3000
    data collection HKL3000
    data collection SBCCOLLECT