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X-RAY DIFFRACTION
Materials and Methods page
4IQ0
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 8.5
    Temperature 289.0
    Details 0.2 M Lithium sulfate, 0.1 M TRIS, 1.26 M Ammonium sulfate, pH 8.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 45.92 α = 90
    b = 152.39 β = 103.12
    c = 100.24 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2012-12-16
     
    Diffraction Radiation
    Monochromator Si(111) double crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97940
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(All) 91010
    Number Reflections(Observed) 90011
    Percent Possible(Observed) 99.7
    R Merge I(Observed) 0.074
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.07
    Percent Possible(All) 98.6
    R Merge I(Observed) 0.17
    Mean I Over Sigma(Observed) 7.0
    Redundancy 3.3
    Number Unique Reflections(All) 8840
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method SAD
    reflnsShellList 2.0
    Resolution(Low) 38.6
    Cut-off Sigma(F) 0.0
    Number of Reflections(all) 89975
    Number of Reflections(Observed) 89975
    Number of Reflections(R-Free) 4514
    Percent Reflections(Observed) 99.56
    R-Factor(All) 0.1481
    R-Factor(Observed) 0.1481
    R-Work 0.1455
    R-Free 0.1952
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Mean Isotropic B Value 17.5895
    Anisotropic B[1][1] 0.41
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.15
    Anisotropic B[2][2] -0.37
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -0.07
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.999
    Shell Resolution(Low) 2.051
    Number of Reflections(Observed) 6392
    Number of Reflections(R-Free) 292
    Number of Reflections(R-Work) 6100
    R-Factor(R-Work) 0.138
    R-Factor(R-Free) 0.208
    Percent Reflections(Observed) 96.92
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    r_sphericity_bonded 6.474
    r_sphericity_free 29.672
    r_bond_refined_d 0.007
    r_bond_other_d 0.001
    r_angle_refined_deg 1.111
    r_angle_other_deg 0.718
    r_dihedral_angle_1_deg 5.903
    r_dihedral_angle_2_deg 39.141
    r_dihedral_angle_3_deg 12.528
    r_dihedral_angle_4_deg 15.46
    r_chiral_restr 0.07
    r_gen_planes_refined 0.004
    r_gen_planes_other 0.001
    r_rigid_bond_restr 2.677
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 9753
    Nucleic Acid Atoms 0
    Heterogen Atoms 5
    Solvent Atoms 904
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC COLLECT
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution HKL-3000, MLPHARE, DM, SHELXDE, ARP/WARP, RESOLVE, COOT
    Structure Refinement REFMAC 5.7.0029
     
    Software
    data extraction pdb_extract version: 3.11
    refinement REFMAC5 version: 5.7.0029