X-RAY DIFFRACTION Experimental Data & Validation


X-ray Experimental Help

Crystallization

Crystalization Experiments
Method Vapor Diffusion Sitting Drop
pH 6.5
Temperature 289.0
Details 0.05M CACL2, 0.1M BIS-TRIS:HCL, 30% (V/V) PEG MME 550, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K

Crystal Data

Unit Cell
Length (Å) Angle (°)
a = 51.68 α = 90
b = 60.76 β = 90
c = 68.77 γ = 90
Symmetry
Space Group P 21 21 21

Diffraction

Diffraction Experiment
ID # Data Collection Temperature
1 100
Diffraction Detector
Detector Diffraction Type Details Collection Date
CCD ADSC QUANTUM 315r mirror 2010-11-29
Diffraction Radiation
Monochromator Protocol
SI 111 crystal SINGLE WAVELENGTH
Diffraction Detector Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97926 APS 19-ID

Data Collection

Overall
Resolution (High) Resolution (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.55 42 98.7 0.083 -- -- 6.7 31918 31918 0.0 -3.0 --
High Resolution Shell
Resolution (High) Resolution (Low) Percent Possible (All) R Merge I (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1.55 1.58 99.9 0.667 -- 2.7 6.5 --

Refinement

Statistics
Structure Solution Method Refinement High Resolution Refinement Low Resolution Cut-off Sigma (I) Cut-off Sigma (F) Number of Reflections (All) Number of Reflections (Observed) Number of Reflections (R-Free) Percent Reflections (Observed) R-Factor (All) R-Factor (Observed) R-Work R-Free R-Free Selection Details
SAD 1.546 41.315 -- 1.34 31850 31850 1618 98.47 -- 0.1882 0.1866 0.2197 --
High Resolution Shell
Refinement method Shell Resolution (High) Shell Resolution (Low) # of Reflections (Observed) # of Reflections (R-Free) # of Reflections (R-Work) R-Factor (R-Work) R-Factor (R-Free) R-Factor (R-Free Error) Percent Reflections (Observed)
X Ray Diffraction 1.5464 1.5919 -- 132 2460 0.2577 0.339 -- 97.0
X Ray Diffraction 1.5919 1.6433 -- 124 2511 0.2452 0.3087 -- 100.0
X Ray Diffraction 1.6433 1.702 -- 127 2530 0.2311 0.2654 -- 100.0
X Ray Diffraction 1.702 1.7702 -- 135 2532 0.2014 0.2681 -- 100.0
X Ray Diffraction 1.7702 1.8507 -- 149 2508 0.193 0.2339 -- 100.0
X Ray Diffraction 1.8507 1.9483 -- 150 2515 0.1846 0.2288 -- 100.0
X Ray Diffraction 1.9483 2.0704 -- 136 2548 0.1828 0.2069 -- 100.0
X Ray Diffraction 2.0704 2.2302 -- 141 2537 0.179 0.239 -- 100.0
X Ray Diffraction 2.2302 2.4546 -- 119 2576 0.1795 0.1931 -- 100.0
X Ray Diffraction 2.4546 2.8098 -- 140 2553 0.1817 0.226 -- 100.0
X Ray Diffraction 2.8098 3.5397 -- 143 2551 0.1848 0.2014 -- 98.0
X Ray Diffraction 3.5397 41.3294 -- 122 2411 0.183 0.2154 -- 88.0
RMS Deviations
Key Refinement Restraint Deviation
f_plane_restr 0.004
f_chiral_restr 0.069
f_dihedral_angle_d 16.198
f_angle_d 1.038
f_bond_d 0.006
Number of Non-Hydrogen Atoms Used in Refinement
Non-Hydrogen Atoms Numbers
Protein Atoms 1730
Nucleic Acid Atoms 0
Heterogen Atoms 34
Solvent Atoms 130

Software

Computing
Computing Package Purpose
SBC-Collect Data Collection
HKL-3000 Data Reduction (intensity integration)
HKL-3000 Data Reduction (data scaling)
SHELXD/MLPHARE/DM/ARP/wARP/HKL3000 Structure Solution
PHENIX (phenix.refine: 1.8.1_1168) Structure Refinement
Software
Software Name Purpose
PHENIX version: (phenix.refine: 1.8.1_1168) refinement
SHELXD/MLPHARE/DM/ARP/wARP/HKL3000 model building
SBC-Collect data collection