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X-RAY DIFFRACTION
Materials and Methods page
4IPL
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 5.6
    Temperature 289.0
    Details 15% polyethylene glycol 5000MME, 0.1 M sodium citrate tribasic dehydrate, pH 5.6, VAPOR DIFFUSION, SITTING DROP, temperature 289K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 183.28 α = 90
    b = 65.35 β = 133.38
    c = 126.69 γ = 90
     
    Space Group
    Space Group Name:    C 1 2 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type MARMOSAIC 225 mm CCD
    Collection Date 2011-12-02
     
    Diffraction Radiation
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type SSRF BEAMLINE BL17U
    Wavelength List 0.97915
    Site SSRF
    Beamline BL17U
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 2
    Resolution(Low) 50
    Number Reflections(All) 73344
    Number Reflections(Observed) 72464
    Percent Possible(Observed) 98.8
     
    High Resolution Shell Details
    Resolution(High) 2.0
    Resolution(Low) 2.11
    Percent Possible(All) 95.7
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.004
    Resolution(Low) 31.672
    Cut-off Sigma(F) 1.35
    Number of Reflections(all) 73384
    Number of Reflections(Observed) 72225
    Number of Reflections(R-Free) 3640
    Percent Reflections(Observed) 98.42
    R-Factor(Observed) 0.1794
    R-Work 0.1771
    R-Free 0.2216
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -14.8486
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.3994
    Anisotropic B[2][2] 21.1642
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] -6.3155
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.004
    Shell Resolution(Low) 2.0756
    Number of Reflections(R-Free) 335
    Number of Reflections(R-Work) 6445
    R-Factor(R-Work) 0.2006
    R-Factor(R-Free) 0.2601
    Percent Reflections(Observed) 93.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0756
    Shell Resolution(Low) 2.1587
    Number of Reflections(R-Free) 357
    Number of Reflections(R-Work) 6888
    R-Factor(R-Work) 0.1968
    R-Factor(R-Free) 0.2857
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1587
    Shell Resolution(Low) 2.2569
    Number of Reflections(R-Free) 333
    Number of Reflections(R-Work) 6957
    R-Factor(R-Work) 0.1981
    R-Factor(R-Free) 0.2971
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2569
    Shell Resolution(Low) 2.3759
    Number of Reflections(R-Free) 387
    Number of Reflections(R-Work) 6853
    R-Factor(R-Work) 0.1871
    R-Factor(R-Free) 0.2536
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3759
    Shell Resolution(Low) 2.5247
    Number of Reflections(R-Free) 383
    Number of Reflections(R-Work) 6854
    R-Factor(R-Work) 0.1941
    R-Factor(R-Free) 0.2526
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5247
    Shell Resolution(Low) 2.7195
    Number of Reflections(R-Free) 380
    Number of Reflections(R-Work) 6947
    R-Factor(R-Work) 0.2013
    R-Factor(R-Free) 0.2727
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7195
    Shell Resolution(Low) 2.993
    Number of Reflections(R-Free) 420
    Number of Reflections(R-Work) 6855
    R-Factor(R-Work) 0.1956
    R-Factor(R-Free) 0.2467
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.993
    Shell Resolution(Low) 3.4256
    Number of Reflections(R-Free) 332
    Number of Reflections(R-Work) 6996
    R-Factor(R-Work) 0.1862
    R-Factor(R-Free) 0.2073
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4256
    Shell Resolution(Low) 4.3142
    Number of Reflections(R-Free) 356
    Number of Reflections(R-Work) 6958
    R-Factor(R-Work) 0.1577
    R-Factor(R-Free) 0.1936
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.3142
    Shell Resolution(Low) 31.672
    Number of Reflections(R-Free) 357
    Number of Reflections(R-Work) 6832
    R-Factor(R-Work) 0.1473
    R-Factor(R-Free) 0.1608
    Percent Reflections(Observed) 95.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.006
    f_chiral_restr 0.094
    f_dihedral_angle_d 13.95
    f_angle_d 1.159
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 7504
    Nucleic Acid Atoms 0
    Heterogen Atoms 6
    Solvent Atoms 579
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) HKL-2000
    Data Reduction (data scaling) SCALA
    Structure Solution AMoRE
    Structure Refinement PHENIX (phenix.refine: 1.7.1_743)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.7.1_743)
    model building AMoRE
    data collection ADSC version: Quantum