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X-RAY DIFFRACTION
Materials and Methods page
4IPA
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    Temperature 291.0
    Details 0.2M Lithiumacetate, 2.2M Amminiumsulfate, VAPOR DIFFUSION, SITTING DROP, temperature 291K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 192 α = 90
    b = 193.32 β = 90
    c = 70.91 γ = 90
     
    Space Group
    Space Group Name:    P 21 21 2
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 298
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315r
    Collection Date 2008-07-23
     
    Diffraction Radiation
    Monochromator Si 111 CHANNEL
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type ESRF BEAMLINE ID23-1
    Wavelength List 0.97905
    Site ESRF
    Beamline ID23-1
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) 0.0
    Resolution(High) 2.3
    Resolution(Low) 86.4
    Number Reflections(All) 118103
    Number Reflections(Observed) 118103
    Percent Possible(Observed) 100.0
    R Merge I(Observed) 0.127
    Redundancy 5.9
     
    High Resolution Shell Details
    Resolution(High) 2.3
    Resolution(Low) 2.42
    Percent Possible(All) 100.0
    R Merge I(Observed) 0.53
    Mean I Over Sigma(Observed) 4.0
    Redundancy 5.9
    Number Unique Reflections(All) 17031
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 2.3
    Resolution(Low) 57.176
    Cut-off Sigma(F) 1.41
    Number of Reflections(all) 0
    Number of Reflections(Observed) 117991
    Number of Reflections(R-Free) 5918
    Percent Reflections(Observed) 99.98
    R-Factor(Observed) 0.2013
    R-Work 0.1994
    R-Free 0.2364
    R-Free Selection Details RANDOM
     
    Temperature Factor Modeling
    Anisotropic B[1][1] -0.4208
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] 0.0
    Anisotropic B[2][2] -0.0825
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 0.5033
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3
    Shell Resolution(Low) 2.3822
    Number of Reflections(R-Free) 579
    Number of Reflections(R-Work) 11079
    R-Factor(R-Work) 0.2186
    R-Factor(R-Free) 0.2828
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3822
    Shell Resolution(Low) 2.4776
    Number of Reflections(R-Free) 553
    Number of Reflections(R-Work) 11098
    R-Factor(R-Work) 0.206
    R-Factor(R-Free) 0.2654
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4776
    Shell Resolution(Low) 2.5903
    Number of Reflections(R-Free) 568
    Number of Reflections(R-Work) 11105
    R-Factor(R-Work) 0.2123
    R-Factor(R-Free) 0.2637
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.5903
    Shell Resolution(Low) 2.7269
    Number of Reflections(R-Free) 567
    Number of Reflections(R-Work) 11172
    R-Factor(R-Work) 0.2115
    R-Factor(R-Free) 0.2678
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7269
    Shell Resolution(Low) 2.8977
    Number of Reflections(R-Free) 627
    Number of Reflections(R-Work) 11048
    R-Factor(R-Work) 0.1992
    R-Factor(R-Free) 0.2546
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.8977
    Shell Resolution(Low) 3.1215
    Number of Reflections(R-Free) 585
    Number of Reflections(R-Work) 11174
    R-Factor(R-Work) 0.2064
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.1215
    Shell Resolution(Low) 3.4356
    Number of Reflections(R-Free) 592
    Number of Reflections(R-Work) 11175
    R-Factor(R-Work) 0.2052
    R-Factor(R-Free) 0.2441
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.4356
    Shell Resolution(Low) 3.9326
    Number of Reflections(R-Free) 595
    Number of Reflections(R-Work) 11251
    R-Factor(R-Work) 0.1867
    R-Factor(R-Free) 0.218
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9326
    Shell Resolution(Low) 4.9542
    Number of Reflections(R-Free) 619
    Number of Reflections(R-Work) 11289
    R-Factor(R-Work) 0.1781
    R-Factor(R-Free) 0.2179
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.9542
    Shell Resolution(Low) 57.1936
    Number of Reflections(R-Free) 633
    Number of Reflections(R-Work) 11682
    R-Factor(R-Work) 0.2092
    R-Factor(R-Free) 0.2172
    Percent Reflections(Observed) 100.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.069
    f_dihedral_angle_d 15.07
    f_angle_d 1.072
    f_bond_d 0.008
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 11511
    Nucleic Acid Atoms 0
    Heterogen Atoms 35
    Solvent Atoms 902
     
     
  •   Software and Computing Hide
    Computing
    Data Collection ADSC Quantum
    Data Reduction (intensity integration) MOSFLM
    Data Reduction (data scaling) SCALA
    Structure Solution PHASER
    Structure Refinement PHENIX (phenix.refine: 1.6.4_486)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6.4_486)
    model building PHASER
    data collection ADSC version: Quantum