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X-RAY DIFFRACTION
Materials and Methods page
4IOG
  •   Crystallization Hide
    Crystallization Experiments
    Method VAPOR DIFFUSION, SITTING DROP
    pH 7
    Temperature 297.0
    Details 0.2M Sodium Chloride, 0.1M Tris:HCl, 30% (w/v) PEG3000, pH 7.0, VAPOR DIFFUSION, SITTING DROP, temperature 297K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 31.69 α = 90
    b = 132.85 β = 98.41
    c = 38.67 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Details mirror
    Collection Date 2011-10-05
     
    Diffraction Radiation
    Monochromator Si 111 crystal
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97929
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Observed Criterion Sigma (F) 0.0
    Observed Criterion Sigma(I) -3.0
    Resolution(High) 1.44
    Resolution(Low) 31.3
    Number Reflections(All) 55739
    Number Reflections(Observed) 55739
    Percent Possible(Observed) 98.2
    R Merge I(Observed) 0.068
    Redundancy 4.0
     
    High Resolution Shell Details
    Resolution(High) 1.44
    Resolution(Low) 1.46
    Percent Possible(All) 85.0
    R Merge I(Observed) 0.282
    Mean I Over Sigma(Observed) 5.9
    Redundancy 3.1
    Number Unique Reflections(All) 2344
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.438
    Resolution(Low) 31.3
    Cut-off Sigma(F) 1.38
    Number of Reflections(all) 55667
    Number of Reflections(Observed) 55667
    Number of Reflections(R-Free) 2818
    Percent Reflections(Observed) 97.4
    R-Factor(Observed) 0.1704
    R-Work 0.1688
    R-Free 0.1993
    R-Free Selection Details random
     
    Temperature Factor Modeling
    Data Not Available
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4378
    Shell Resolution(Low) 1.4626
    Number of Reflections(R-Free) 111
    Number of Reflections(R-Work) 1862
    R-Factor(R-Work) 0.2056
    R-Factor(R-Free) 0.2657
    Percent Reflections(Observed) 71.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4626
    Shell Resolution(Low) 1.4892
    Number of Reflections(R-Free) 116
    Number of Reflections(R-Work) 2604
    R-Factor(R-Work) 0.1898
    R-Factor(R-Free) 0.2026
    Percent Reflections(Observed) 94.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.4892
    Shell Resolution(Low) 1.5178
    Number of Reflections(R-Free) 152
    Number of Reflections(R-Work) 2644
    R-Factor(R-Work) 0.1847
    R-Factor(R-Free) 0.2375
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5178
    Shell Resolution(Low) 1.5488
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2699
    R-Factor(R-Work) 0.1779
    R-Factor(R-Free) 0.2013
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5488
    Shell Resolution(Low) 1.5825
    Number of Reflections(R-Free) 133
    Number of Reflections(R-Work) 2728
    R-Factor(R-Work) 0.1657
    R-Factor(R-Free) 0.2313
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.5825
    Shell Resolution(Low) 1.6193
    Number of Reflections(R-Free) 135
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1619
    R-Factor(R-Free) 0.1962
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6193
    Shell Resolution(Low) 1.6598
    Number of Reflections(R-Free) 121
    Number of Reflections(R-Work) 2733
    R-Factor(R-Work) 0.1656
    R-Factor(R-Free) 0.211
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.6598
    Shell Resolution(Low) 1.7047
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2679
    R-Factor(R-Work) 0.1717
    R-Factor(R-Free) 0.2329
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7047
    Shell Resolution(Low) 1.7548
    Number of Reflections(R-Free) 137
    Number of Reflections(R-Work) 2740
    R-Factor(R-Work) 0.1777
    R-Factor(R-Free) 0.2543
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.7548
    Shell Resolution(Low) 1.8114
    Number of Reflections(R-Free) 144
    Number of Reflections(R-Work) 2650
    R-Factor(R-Work) 0.1778
    R-Factor(R-Free) 0.1855
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8114
    Shell Resolution(Low) 1.8762
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2753
    R-Factor(R-Work) 0.1711
    R-Factor(R-Free) 0.2116
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.8762
    Shell Resolution(Low) 1.9513
    Number of Reflections(R-Free) 146
    Number of Reflections(R-Work) 2677
    R-Factor(R-Work) 0.173
    R-Factor(R-Free) 0.2
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.9513
    Shell Resolution(Low) 2.0401
    Number of Reflections(R-Free) 156
    Number of Reflections(R-Work) 2721
    R-Factor(R-Work) 0.1724
    R-Factor(R-Free) 0.1985
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0401
    Shell Resolution(Low) 2.1476
    Number of Reflections(R-Free) 131
    Number of Reflections(R-Work) 2732
    R-Factor(R-Work) 0.1569
    R-Factor(R-Free) 0.171
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1476
    Shell Resolution(Low) 2.2821
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2698
    R-Factor(R-Work) 0.1548
    R-Factor(R-Free) 0.1736
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2821
    Shell Resolution(Low) 2.4583
    Number of Reflections(R-Free) 163
    Number of Reflections(R-Work) 2703
    R-Factor(R-Work) 0.1579
    R-Factor(R-Free) 0.1957
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4583
    Shell Resolution(Low) 2.7055
    Number of Reflections(R-Free) 142
    Number of Reflections(R-Work) 2709
    R-Factor(R-Work) 0.1683
    R-Factor(R-Free) 0.1868
    Percent Reflections(Observed) 100.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.7055
    Shell Resolution(Low) 3.0967
    Number of Reflections(R-Free) 154
    Number of Reflections(R-Work) 2692
    R-Factor(R-Work) 0.1727
    R-Factor(R-Free) 0.2079
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.0967
    Shell Resolution(Low) 3.9004
    Number of Reflections(R-Free) 148
    Number of Reflections(R-Work) 2635
    R-Factor(R-Work) 0.1575
    R-Factor(R-Free) 0.184
    Percent Reflections(Observed) 96.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.9004
    Shell Resolution(Low) 31.3524
    Number of Reflections(R-Free) 141
    Number of Reflections(R-Work) 2511
    R-Factor(R-Work) 0.1834
    R-Factor(R-Free) 0.2084
    Percent Reflections(Observed) 92.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.005
    f_chiral_restr 0.066
    f_dihedral_angle_d 15.818
    f_angle_d 0.982
    f_bond_d 0.006
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 2802
    Nucleic Acid Atoms 0
    Heterogen Atoms 0
    Solvent Atoms 477
     
     
  •   Software and Computing Hide
    Computing
    Data Collection SBC-Collect
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution MolRep
    Structure Refinement PHENIX (phenix.refine: 1.8.1_1168)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.8.1_1168)
    model building MolRep
    data collection SBC-Collect