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X-RAY DIFFRACTION
Materials and Methods page
4IMA
  •   Crystallization Hide
    Crystallization Experiments
    Method EVAPORATION
    pH 4.9
    Temperature 277.0
    Details 5% PEG6000, 0.05 M potassium citrate, 2.64 uM manganese chloride, pH 4.9, EVAPORATION, temperature 277K
     
  •   Crystal Data Hide
    Unit Cell
    Length    (Å) Angle    (°)
    a = 82.75 α = 90
    b = 204.73 β = 96.75
    c = 86.53 γ = 90
     
    Space Group
    Space Group Name:    P 1 21 1
     
     
  •   Diffraction Hide
    Diffraction Experiment
    Diffrn ID 1
    Data Collection Temperature 100
     
    Diffraction Detector
    Detector CCD
    Type ADSC QUANTUM 315
    Collection Date 2012-03-21
     
    Diffraction Radiation
    Monochromator Rosenbaum-Rock high-resolution double-crystal Si(111)
    Diffraction Protocol SINGLE WAVELENGTH
     
    Diffraction Source
    Source SYNCHROTRON
    Type APS BEAMLINE 19-ID
    Wavelength List 0.97921
    Site APS
    Beamline 19-ID
     
     
  •   Refinement Data Hide
    Reflection Details
    Resolution(High) 1.95
    Resolution(Low) 50
    Number Reflections(Observed) 200629
    Percent Possible(Observed) 97.7
    Redundancy 3.7
     
    High Resolution Shell Details
    Resolution(High) 1.95
    Resolution(Low) 2.02
    Percent Possible(All) 86.1
    Mean I Over Sigma(Observed) 1.4
    R-Sym I(Observed) 0.518
    Redundancy 2.9
     
     
  •   Refinement Hide
    Refinement Statistics
    Structure Solution Method MOLECULAR REPLACEMENT
    reflnsShellList 1.954
    Resolution(Low) 38.891
    Cut-off Sigma(F) 0.09
    Number of Reflections(Observed) 179645
    Number of Reflections(R-Free) 9011
    Percent Reflections(Observed) 87.27
    R-Factor(Observed) 0.2
    R-Work 0.1983
    R-Free 0.2332
     
    Temperature Factor Modeling
    Anisotropic B[1][1] 3.4947
    Anisotropic B[1][2] 0.0
    Anisotropic B[1][3] -20.7131
    Anisotropic B[2][2] -8.4252
    Anisotropic B[2][3] 0.0
    Anisotropic B[3][3] 4.9305
     
    Resolution Shells
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 1.954
    Shell Resolution(Low) 2.0237
    Number of Reflections(R-Free) 665
    Number of Reflections(R-Work) 12313
    R-Factor(R-Work) 0.2638
    R-Factor(R-Free) 0.2984
    Percent Reflections(Observed) 63.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.0237
    Shell Resolution(Low) 2.1047
    Number of Reflections(R-Free) 776
    Number of Reflections(R-Work) 14191
    R-Factor(R-Work) 0.2453
    R-Factor(R-Free) 0.2896
    Percent Reflections(Observed) 73.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.1047
    Shell Resolution(Low) 2.2005
    Number of Reflections(R-Free) 797
    Number of Reflections(R-Work) 15769
    R-Factor(R-Work) 0.2235
    R-Factor(R-Free) 0.2706
    Percent Reflections(Observed) 81.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.2005
    Shell Resolution(Low) 2.3165
    Number of Reflections(R-Free) 907
    Number of Reflections(R-Work) 16565
    R-Factor(R-Work) 0.2083
    R-Factor(R-Free) 0.2664
    Percent Reflections(Observed) 85.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.3165
    Shell Resolution(Low) 2.4616
    Number of Reflections(R-Free) 963
    Number of Reflections(R-Work) 17353
    R-Factor(R-Work) 0.2014
    R-Factor(R-Free) 0.247
    Percent Reflections(Observed) 89.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.4616
    Shell Resolution(Low) 2.6516
    Number of Reflections(R-Free) 933
    Number of Reflections(R-Work) 17980
    R-Factor(R-Work) 0.1964
    R-Factor(R-Free) 0.2495
    Percent Reflections(Observed) 92.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.6516
    Shell Resolution(Low) 2.9184
    Number of Reflections(R-Free) 960
    Number of Reflections(R-Work) 18513
    R-Factor(R-Work) 0.2025
    R-Factor(R-Free) 0.2462
    Percent Reflections(Observed) 95.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 2.9184
    Shell Resolution(Low) 3.3404
    Number of Reflections(R-Free) 957
    Number of Reflections(R-Work) 19073
    R-Factor(R-Work) 0.2035
    R-Factor(R-Free) 0.2411
    Percent Reflections(Observed) 97.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 3.3404
    Shell Resolution(Low) 4.2078
    Number of Reflections(R-Free) 1032
    Number of Reflections(R-Work) 19280
    R-Factor(R-Work) 0.1771
    R-Factor(R-Free) 0.2082
    Percent Reflections(Observed) 99.0
    Refinement method X-RAY DIFFRACTION
    Shell Resolution(High) 4.2078
    Shell Resolution(Low) 38.899
    Number of Reflections(R-Free) 1021
    Number of Reflections(R-Work) 19597
    R-Factor(R-Work) 0.1871
    R-Factor(R-Free) 0.2049
    Percent Reflections(Observed) 99.0
     
    RMS Deviations
    Parameter Type Deviation from Ideal
    f_plane_restr 0.004
    f_chiral_restr 0.069
    f_dihedral_angle_d 15.382
    f_angle_d 1.047
    f_bond_d 0.007
     
    Number of Non-Hydrogen Atoms Used in Refinement
    Protein Atoms 15095
    Nucleic Acid Atoms 0
    Heterogen Atoms 159
    Solvent Atoms 859
     
     
  •   Software and Computing Hide
    Computing
    Data Reduction (intensity integration) HKL-3000
    Data Reduction (data scaling) HKL-3000
    Structure Solution Phaser
    Structure Refinement PHENIX (phenix.refine: 1.6_289)
     
    Software
    refinement PHENIX version: (phenix.refine: 1.6_289)